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1. 发明授权

US08502966B2 Surface defect inspection method and apparatus 失效
标题翻译：表面缺陷检查方法及装置
公开(公告)号：US08502966B2
公开(公告)日：2013-08-06
申请号：US13646066
申请日：2012-10-05
申请人： Kenichi Shitara , Hiroshi Nakajima
发明人： Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/47
摘要： The present invention provides an apparatus and method which enable detecting a microscopic defect sensitively by efficiently collecting and detecting scattering light from a defect in a wider region without enlarging the apparatus. In the apparatus for inspecting a defect on a surface of a sample, including illumination means which irradiates a surface of a sample with laser, reflected light detection means which detects reflected light from the sample, and signal processing means which processes a detected signal and detecting a defect on the sample, the reflected light detection means is configured to include a scattering light detection unit which collects scattering light components of the reflected light from the sample by excluding specularly reflected light components by using an aspheric flannel lens and detecting the scattering light components.
摘要翻译：本发明提供了一种能够通过在不扩大设备的情况下有效地收集和检测来自较宽区域的缺陷的散射光而敏感地检测微观缺陷的装置和方法。在用于检查样品表面上的缺陷的装置中，包括用激光照射样品表面的照射装置，检测来自样品的反射光的反射光检测装置和处理检测信号的信号处理装置，反射光检测装置被配置为包括：散射光检测单元，其通过使用非球面法兰绒透镜排除镜面反射光分量并且检测散射光分量来收集来自样品的反射光的散射光分量。

2. 发明授权

US08294888B2 Surface defect inspection method and apparatus 失效
标题翻译：表面缺陷检查方法及装置
公开(公告)号：US08294888B2
公开(公告)日：2012-10-23
申请号：US12855873
申请日：2010-08-13
申请人： Kenichi Shitara , Hiroshi Nakajima
发明人： Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/47
摘要： The present invention provides an apparatus and method which enable detecting a microscopic defect sensitively by efficiently collecting and detecting scattering light from a defect in a wider region without enlarging the apparatus. In the apparatus for inspecting a defect on a surface of a sample, including illumination means which irradiates a surface of a sample with laser, reflected light detection means which detects reflected light from the sample, and signal processing means which processes a detected signal and detecting a defect on the sample, the reflected light detection means is configured to include a scattering light detection unit which collects scattering light components of the reflected light from the sample by excluding specularly reflected light components by using an aspheric flannel lens and detecting the scattering light components.
摘要翻译：本发明提供了一种能够通过在不扩大设备的情况下有效地收集和检测来自较宽区域的缺陷的散射光而敏感地检测微观缺陷的装置和方法。在用于检查样品表面上的缺陷的装置中，包括用激光照射样品表面的照射装置，检测来自样品的反射光的反射光检测装置和处理检测信号的信号处理装置，反射光检测装置被配置为包括：散射光检测单元，其通过使用非球面法兰绒透镜排除镜面反射光分量并且检测散射光分量来收集来自样品的反射光的散射光分量。

3. 发明授权

US08547547B2 Optical surface defect inspection apparatus and optical surface defect inspection method 有权
标题翻译：光学表面缺陷检查装置和光学表面缺陷检查方法
公开(公告)号：US08547547B2
公开(公告)日：2013-10-01
申请号：US13213116
申请日：2011-08-19
申请人： Shintaro Tamura , Masanori Fukawa , Ayumu Ishihara , Kenichi Shitara , Hiroshi Nakajima
发明人： Shintaro Tamura , Masanori Fukawa , Ayumu Ishihara , Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/00
CPC分类号： G01N21/00 , G01N21/8806 , G01N21/9501 , G01N21/9506 , G01N2201/0833
摘要： The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices. The optical fiber bundle is divided into a plurality of fan-shaped cells in the light receiving surface, and connected to the light emitting devices in units of the cells for performing the inspection based on the outputs of the plurality of cells.
摘要翻译：本发明提供一种光学表面缺陷检查装置或光学表面缺陷检查方法，其可以在不进行自动对焦操作的情况下，根据多分段单元法提高信噪比，并且可以实现高度敏感的检查。本发明是一种光学表面缺陷检查装置或光学表面缺陷检查方法，其中将检查光束施加到测试对象上，在光检测器上形成来自受检者表面的散射光的图像，并且基于光电检测器的输出来检查测试对象的表面上的缺陷。光检测器具有光纤束。其一端形成圆形光接收表面以接收散射光。其另一端连接到多个光接收装置。光纤束在光接收表面被分成多个扇形单元，并且以基于多个单元的输出执行检查的单元为单位连接到发光器件。

4. 发明授权

US08488116B2 Surface defect inspection method and apparatus 失效
公开(公告)号：US08488116B2
公开(公告)日：2013-07-16
申请号：US13646072
申请日：2012-10-05
申请人： Kenichi Shitara , Hiroshi Nakajima
发明人： Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/47
摘要： The present invention provides an apparatus and method which enable detecting a microscopic defect sensitively by efficiently collecting and detecting scattering light from a defect in a wider region without enlarging the apparatus. In the apparatus for inspecting a defect on a surface of a sample, including illumination means which irradiates a surface of a sample with laser, reflected light detection means which detects reflected light from the sample, and signal processing means which processes a detected signal and detecting a defect on the sample, the reflected light detection means is configured to include a scattering light detection unit which collects scattering light components of the reflected light from the sample by excluding specularly reflected light components by using an aspheric flannel lens and detecting the scattering light components.

5. 发明申请

US20120075625A1 OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEFECT INSPECTION METHOD 有权
标题翻译：光学表面缺陷检查装置和光学表面缺陷检查方法
公开(公告)号：US20120075625A1
公开(公告)日：2012-03-29
申请号：US13213116
申请日：2011-08-19
申请人： Shintaro TAMURA , Masanori Fukawa , Ayumu Ishihara , Kenichi Shitara , Hiroshi Nakajima
发明人： Shintaro TAMURA , Masanori Fukawa , Ayumu Ishihara , Kenichi Shitara , Hiroshi Nakajima
IPC分类号： G01N21/88
CPC分类号： G01N21/00 , G01N21/8806 , G01N21/9501 , G01N21/9506 , G01N2201/0833
摘要： The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices. The optical fiber bundle is divided into a plurality of fan-shaped cells in the light receiving surface, and connected to the light emitting devices in units of the cells for performing the inspection based on the outputs of the plurality of cells.
摘要翻译：本发明提供一种光学表面缺陷检查装置或光学表面缺陷检查方法，其可以在不进行自动对焦操作的情况下，根据多分段单元法提高信噪比，并且可以实现高度敏感的检查。本发明是一种光学表面缺陷检查装置或光学表面缺陷检查方法，其中将检查光束施加到测试对象上，在光检测器上形成来自受检者表面的散射光的图像，并且基于光电检测器的输出来检查测试对象的表面上的缺陷。光检测器具有光纤束。其一端形成圆形光接收表面以接收散射光。其另一端连接到多个光接收装置。光纤束在光接收表面被分成多个扇形单元，并且以基于多个单元的输出执行检查的单元为单位连接到发光器件。

6. 发明申请

US20140186743A1 FUEL CELL CATALYST LAYER AND USES THEREOF 有权
标题翻译：燃料电池催化层及其用途
公开(公告)号：US20140186743A1
公开(公告)日：2014-07-03
申请号：US14240106
申请日：2011-09-09
申请人： Yasuaki Wakizaka , Ryuji Monden , Takuya Imai , Hiroshi Nakajima
发明人： Yasuaki Wakizaka , Ryuji Monden , Takuya Imai , Hiroshi Nakajima
IPC分类号： H01M4/86
CPC分类号： H01M4/8657 , H01M4/8605 , H01M4/925 , H01M2008/1095 , Y02E60/50
摘要： Provided is a fuel cell catalyst layer which has a catalytic performance equivalent to or higher than fuel cell catalyst layers containing platinum alone and which is inexpensive. The fuel cell catalyst layer of the present invention includes a metal oxycarbonitride-containing layer (I) and a platinum-containing layer (II). It is preferable that the mass ratio per unit area of the metal oxycarbonitride in the layer (I) to platinum in the layer (II) (metal oxycarbonitride/platinum) is 2 to 500. It is preferable that the mass per unit area of platinum in the layer (II) is 0.005 to 0.2 mg/cm2.
摘要翻译：本发明提供一种燃料电池用催化剂层，该催化剂层的催化性能等于或高于单独含有铂的燃料电池催化剂层，其价格便宜。本发明的燃料电池催化剂层包括含有含碳氮氧化物的层（I）和含铂层（II）。层（I）中的层（I）中的铂的金属碳氮氧化物的单位面积质量比（金属碳氮氧化物/铂）优选为2〜500。优选铂单位面积的质量在层（II）中为0.005〜0.2mg / cm 2。

7. 发明授权

US08590150B2 Impeller manufacturing method 有权
标题翻译：叶轮制造方法
公开(公告)号：US08590150B2
公开(公告)日：2013-11-26
申请号：US13805021
申请日：2011-10-25
申请人： Khanhson Pham , Hiroshi Nakajima
发明人： Khanhson Pham , Hiroshi Nakajima
IPC分类号： B21D51/16
CPC分类号： B23K31/02 , B23K2101/001 , F04D29/023 , F04D29/284 , F05D2230/232 , Y10T29/49316 , Y10T29/49968
摘要： The present invention relates to a method of joining a hub 11 and a shroud 12 of an impeller 10, either one of which has blades 13 integrally formed thereon, by welding. During the welding, in an upright state in which the hub 11 is placed to face a mount surface, the hub 11 and the shroud 12 are placed on top of each other to form an assembled body 10. Welding is performed on the assembled body 10 covered with a heat insulating jacket 30(a to g), the jacket 30 covering the assembled body 10 except an open region (OP) and an inflow port 14IN required for welding. When welding of one open region OP is completed, a new open region OP is formed by moving the heat insulating jacket 30 with respect to the assembled body, and then the next welding is performed.
摘要翻译：本发明涉及一种将叶轮10的轮毂11和护罩12连接起来的方法，叶轮10中的任一个具有通过焊接一体形成的叶片13。在焊接期间，在轮毂11被放置成面向安装表面的直立状态下，轮毂11和护罩12被放置在彼此的顶部以形成组装体10.在组装体10上进行焊接覆盖有隔热护套30（a至g），除了开放区域（OP）和焊接所需的流入端口14IN之外，护套30覆盖组装体10。当一个开放区域OP的焊接完成时，通过相对于组装体移动隔热套30而形成新的开放区域OP，然后进行下一次焊接。

8. 发明授权

US08477818B2 Gallium nitride-based semiconductor laser device, and method for fabricating gallium nitride-based semiconductor laser device 有权
标题翻译：氮化镓系半导体激光器件及其制造方法
公开(公告)号：US08477818B2
公开(公告)日：2013-07-02
申请号：US13431043
申请日：2012-03-27
申请人： Tetsuya Kumano , Masaki Ueno , Takashi Kyono , Yohei Enya , Katsunori Yanashima , Kunihiko Tasai , Hiroshi Nakajima
发明人： Tetsuya Kumano , Masaki Ueno , Takashi Kyono , Yohei Enya , Katsunori Yanashima , Kunihiko Tasai , Hiroshi Nakajima
IPC分类号： H01S5/00
CPC分类号： H01S5/34333 , B82Y20/00 , H01S5/3063 , H01S5/3202 , H01S2304/04
摘要： A gallium nitride-based semiconductor laser device with reduced threshold current. The gallium nitride-based semiconductor laser device is provided with an n-type cladding layer, an n-side light guide layer, an active layer, a p-side light guide layer, and a p-type cladding layer. The n-side light guide layer and the p-side light guide layer both contain indium. Each of indium compositions of the n-side light guide layer and the p-side light guide layer is not less than 2% and not more than 6%. A film thickness of the n-type cladding layer is in the range of not less than 65% and not more than 85% of a total of the film thickness of the n-type cladding layer and a film thickness of the p-type cladding layer.
摘要翻译：具有降低的阈值电流的氮化镓基半导体激光器件。氮化镓系半导体激光装置具备n型包覆层，n侧导光层，有源层，p侧导光层和p型覆层。 n侧导光层和p侧导光层均含有铟。 n侧导光层和p侧导光层的铟成分中的每一种不小于2％且不大于6％。 n型包覆层的膜厚在n层包层的膜厚的合计的65％以上且85％以下，p型包层的膜厚层。

9. 发明授权

US08286475B2 Transducer assemblies for downhole tools 有权
标题翻译：用于井下工具的传感器组件
公开(公告)号：US08286475B2
公开(公告)日：2012-10-16
申请号：US12494267
申请日：2009-06-30
申请人： Hiroshi Nakajima , Toshihiro Kinoshita , Takeo Fujihara , Yasuo Kanaya
发明人： Hiroshi Nakajima , Toshihiro Kinoshita , Takeo Fujihara , Yasuo Kanaya
IPC分类号： E21B47/06
CPC分类号： E21B47/011 , G01V1/186
摘要： Methods and related systems are described relating to a sealed acoustic transducer assembly for use in a wellbore is provided. One or more acoustic transducer elements, which can be receivers or transmitters, are housed in an elongated fluid filled sealed container. The sealed container is adapted to be removeably mounted to a portion of a drill collar. The container, which for example can be made of thin corrugated metal or rubber, includes flexible portions along the length of the container which allows for volume changes when exposed to changes in external pressure and/or temperature.
摘要翻译：描述了与在井眼中使用的密封声换能器组件相关的方法和相关系统。可以将接收器或发射器的一个或多个声学换能器元件容纳在细长的流体填充的密封容器中。密封容器适于可拆卸地安装到钻铤的一部分。容器例如可以由薄波纹金属或橡胶制成，包括沿容器长度的柔性部分，当暴露于外部压力和/或温度变化时允许体积变化。

10. 发明授权

US08072347B2 Method and apparatus for locating faults in wired drill pipe 有权
标题翻译：定位钻杆故障的方法和装置
公开(公告)号：US08072347B2
公开(公告)日：2011-12-06
申请号：US11648139
申请日：2006-12-29
申请人： David Santoso , Dudi Rendusara , Hiroshi Nakajima , Kanu Chadha , Raghu Madhavan , Lise Hvatum
发明人： David Santoso , Dudi Rendusara , Hiroshi Nakajima , Kanu Chadha , Raghu Madhavan , Lise Hvatum
IPC分类号： G01V3/00
CPC分类号： E21B17/028
摘要： A method for determining electrical condition of a wired drill pipe includes inducing an electromagnetic field in at least one joint of wired drill pipe. Voltages induced by electrical current flowing in at least one electrical conductor in the at least one wired drill pipe joint are detected. The electrical current is induced by the induced electromagnetic field. The electrical condition is determined from the detected voltages.
摘要翻译：一种用于确定有线钻杆的电气状况的方法包括在有线钻杆的至少一个接头中引入电磁场。检测由在至少一个有线钻管接头中的至少一个电导体中流动的电流而引起的电压。电流由感应电磁场引起。电气条件由检测到的电压确定。

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