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    • 3. 发明授权
    • Display device having defect inspection circuit
    • 具有缺陷检查电路的显示装置
    • US06204836B1
    • 2001-03-20
    • US08239730
    • 1994-05-09
    • Tsuneo YamazakiKunihiro TakahashiHiroaki TakasuAtsushi Sakurai
    • Tsuneo YamazakiKunihiro TakahashiHiroaki TakasuAtsushi Sakurai
    • G09G336
    • G09G3/006G09G3/3677G09G3/3688G09G2310/0281G09G2330/12
    • A dense display may be provided with an internal defect detection circuit to enhance production yield. A plurality of pixels, each including thin film transistors and liquid crystal cells driven by driving electrodes, are arranged in a matrix form and scanned by a plurality of control signal lines and a plurality of image signal lines. A control signal line driving circuit is formed of shift registers having one bit per signal line, and sample-and-hold circuits. An inspection circuit is provided with plural switching elements, each having a first terminal connected to a respective image signal line, a second terminal connected to an inspection output line and a third terminal receptive of an inspection control input signal for controlling an electrical connection between the first and second terminals. In accordance with this configuration, inspection of individual signal lines may be achieved and the inspection control input signal may be internally or externally generated. Moreover, similar detection circuitry may be used to detect defects in the control signal lines and, in this manner, defects may be located to the individual pixel level.
    • 密集显示器可以设置有内部缺陷检测电路,以提高产量。 多个像素,每个包括薄膜晶体管和由驱动电极驱动的液晶单元,以矩阵形式布置并被多个控制信号线和多个图像信号线扫描。 控制信号线驱动电路由每个信号线一位的移位寄存器和采样保持电路构成。 一个检查电路设置有多个开关元件,每个开关元件具有连接到相应图像信号线的第一端子,连接到检查输出线的第二端子和接受检查控制输入信号的第三端子,用于控制第 第一和第二终端。 根据该结构,可以实现各个信号线的检查,并且检查控制输入信号可以在内部或外部产生。 此外,类似的检测电路可以用于检测控制信号线中的缺陷,并且以这种方式,可以将缺陷定位到各个像素级。