会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明申请
    • OPTICAL MODULATOR WITH BEAM-POINTING CORRECTION
    • 具有光束校正的光学调制器
    • US20100188723A1
    • 2010-07-29
    • US12602037
    • 2008-05-29
    • Joshua Monroe CobbPaul G. DewaJustin Kreuzer
    • Joshua Monroe CobbPaul G. DewaJustin Kreuzer
    • G02F1/01G02B26/08
    • G03F7/70041
    • An apparatus for providing a modulated pulsed radiation beam (20) has a radiation source (16) for providing a pulsed radiation beam (10) at a constant pulse repetition frequency and a number of beam intensity modulators (18a-18e). A beam-deflecting element (12) in the path of the pulsed radiation beam and rotatable about an axis redirects the pulsed radiation beam cyclically towards each of the plurality of beam intensity modulators in turn. A beam-recombining element rotatable about the axis in synchronization with the beam-deflecting element combines modulated light, from each of the beam intensity modulators in order to form the modulated pulsed radiation beam at the constant pulse repetition frequency. At least one beam-pointing correction apparatus optically conjugates the beam-deflecting element and the beam recombining element at least one rotational position about the axis.
    • 用于提供调制的脉冲辐射束(20)的装置具有用于以恒定的脉冲重复频率和多个束强度调制器(18a-18e)提供脉冲辐射束(10)的辐射源(16)。 脉冲辐射束的路径中的光束偏转元件(12)可以绕轴线转动,依次将脉冲辐射束周期性地引向多个光束强度调制器中的每一个。 可以与光束偏转元件同步地围绕轴旋转的光束重组元件组合来自每个光束强度调制器的调制光,以便以恒定脉冲重复频率形成调制的脉冲辐射束。 至少一个光束指向校正装置将光束偏转元件和光束复合元件以围绕轴线的至少一个旋转位置光学地共轭。
    • 5. 发明授权
    • Grazing incidence interferometry for measuring transparent
plane-parallel plates
    • 用于测量透明平面平行板的掠入射干涉测量
    • US5923425A
    • 1999-07-13
    • US975145
    • 1997-11-20
    • Paul G. DewaAndrew W. Kulawiec
    • Paul G. DewaAndrew W. Kulawiec
    • G01B9/02G01B11/06G01B11/24G01B11/30G01M11/00G02B13/08
    • G01B11/06G01B9/02021G01B9/02022G01B9/02028G01B9/02058
    • A grazing incidence interferometer includes an extended light source for limiting spatial coherence of reference and test beams. A test plate is oriented at a grazing incidence to the test beam so that a first portion of the test beam is reflected from the front surface of the test plate, a second portion of the test beam is reflected from the back surface of the test plate, and the two test beam portions are sheared with respect to each other. The spatial coherence of the test beam is related to the lateral shear between the first and second test beam portions to significantly reduce contrast of an interference fringe pattern between the front and back surfaces of the test plate. Also, the reference beam is realigned with just one of the two test beam portions to favor the formation of an interference pattern between the reference surface and one of the front and back surfaces of the test plate over the formation of an interference pattern between the reference surface and the other of the front and back surfaces of the test plate.
    • 掠入射干涉仪包括用于限制参考和测试光束的空间相干性的扩展光源。 测试板以测试光束的掠入射取向,使得测试光束的第一部分从测试板的前表面反射,测试光束的第二部分从测试板的后表面反射 并且两个测试光束部分相对于彼此剪切。 测试光束的空间相干性与第一和第二测试光束部分之间的横向剪切有关,以显着降低测试板的前表面和后表面之间的干涉条纹图案的对比度。 此外,参考光束仅与两个测试光束部分中的一个重新对准,以有利于在参考表面与测试板的前表面和后表面中的一个之间形成干涉图案,以形成干涉图案之间的干涉图案 表面和测试板的前表面和后表面中的另一个。
    • 7. 发明申请
    • SURFACE CONTAMINATION METROLOGY
    • 表面污染计量学
    • US20120114875A1
    • 2012-05-10
    • US13285090
    • 2011-10-31
    • Paul G. Dewa
    • Paul G. Dewa
    • C08J7/18B05D5/06G01N21/64
    • G01N21/94G01N21/6486G01N21/958
    • The present disclosure is directed to a method for determining the state of cleanliness of an optical component (an optic) before any coating is applied to the surface. In method is particularly applicable to optical elements and components that are intended for uses in the DUV (deep ultraviolet) and EUV (extreme ultraviolet) wavelength regions. The disclosure combines a cleaning procedure with contamination metrology utilizing a spectrometer to provide a method that will determine the state of cleanliness of the component surface by measurement of the fluorescence spectrum of the optic and comparing the measured value with a standard or reference optic of known, acceptable cleanliness. The disclosure is further directed to an optic having a selected coating thereon that is formed according to the method described herein.
    • 本公开涉及一种在将任何涂层施加到表面之前确定光学部件(光学部件)的清洁度的状态的方法。 该方法特别适用于用于DUV(深紫外)和EUV(极紫外))波长区域的光学元件和组件。 本公开结合了利用光谱仪的清洁程序与污染计量,以提供通过测量光学元件的荧光光谱来确定组件表面的清洁度的状态的方法,并将测量值与已知的, 可接受的清洁度。 本公开进一步涉及根据本文所述的方法形成的在其上具有选择的涂层的光学元件。