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    • 7. 发明授权
    • Image pick-up tube target
    • 图像拾取管目标
    • US4563611A
    • 1986-01-07
    • US548022
    • 1983-11-02
    • Yasuhiko NonakaEisuke InoueKeiichi ShidaraKenkichi Tanioka
    • Yasuhiko NonakaEisuke InoueKeiichi ShidaraKenkichi Tanioka
    • H01J29/45H01L31/08H01J31/26
    • H01J29/456
    • A photoconductive image pick-up tube target comprises a transparent substrate, an N-type conductive film formed on the transparent substrate, and a P-type photoconductive film in rectifying contact with the N-type conductive film and containing Se, As and Te as sensitizer. The P-type photoconductive film includes a first layer contiguous to the N-type conductive film and containing 94.+-.1% by weight of Se and 6.+-.0.5% by weight of As, a second layer formed on the first layer and containing 64.+-.4% by weight of Se, 3.+-.0.5% by weight of As, and 33.+-.2% by weight of Te, a third layer formed on the second layer and containing Se and As, and a fluoride doped region extending over the first layer and a front half layer of the second layer and having a fluoride concentration of 0.1 to 3.0% by weight. The third layer has an As concentration which has a peak of 28.+-.1% by weight at a site contiguous to a rear half layer of the second layer and reduces gradually.
    • 感光图像拾取管目标包括透明基板,形成在透明基板上的N型导电膜和与N型导电膜整流接触的P型光电导膜,并且包含Se,As和Te作为 敏化剂。 P型光电导膜包括与N型导电膜邻接的第一层,含有94 +/- 1重量%的Se和6 +/- 0.5重量%的As,形成在第一层上的第二层 并且含有64 +/- 4重量%的Se,3 +/- 0.5重量%的As和33 +/- 2重量%的Te,第三层形成在第二层上并含有Se和As, 以及在所述第一层上延伸的氟化物掺杂区域和所述第二层的前半层,并且氟化物浓度为0.1〜3.0重量%。 第三层的As浓度在与第二层的后半层相邻的位置具有28 +/- 1重量%的峰值,并且逐渐降低。
    • 8. 发明授权
    • Image pick-up tube target
    • 图像拾取管目标
    • US4717854A
    • 1988-01-05
    • US830714
    • 1986-02-19
    • Masanao YamamotoEisuke InoueKeiichi ShidaraEikyuu Hiruma
    • Masanao YamamotoEisuke InoueKeiichi ShidaraEikyuu Hiruma
    • H01J29/45H01J31/26H01J31/38
    • H01J29/456
    • An image pick-up tube target comprising an N-type conductive film formed on a transparent substrate, and P-type photoconductive film in rectifying contact with the N-type conductive film and comprising a first layer containing As, fluoride and Se, a second layer containing As, Te and Se, a portion of said second layer containing fluoride, a third layer containing As and Se, the composition of the third layer being different along the direction of thickness thereof, a fourth layer containing As and Se, wherein the concentration of As in the second layer varies continuously along the direction of thickness thereof, and in the second layer the minimum As concentration is located on the first layer side of the second layer and the maximum As concentration is located on the third layer side of the second layer.
    • 包括形成在透明基板上的N型导电膜的图像拾取管目标和与N型导电膜整流接触的P型光电导膜,并且包括含有As,氟化物和Se的第一层,第二层 含有As,Te和Se的层,含有氟化物的第二层的一部分,含有As和Se的第三层,第三层的组成沿其厚度方向不同,含有As和Se的第四层,其中 第二层中的As浓度沿其厚度方向连续变化,在第二层中,最小As浓度位于第二层的第一层侧,最大As浓度位于第二层的第三层侧 第二层。