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1. 发明申请

WO2010146498A1 TILTED GRATINGS AND METHOD FOR PRODUCTION OF TILTED GRATINGS 审中-公开
标题翻译：倾斜砂浆和生产倾斜砂浆的方法
公开(公告)号：WO2010146498A1
公开(公告)日：2010-12-23
申请号：PCT/IB2010/052555
申请日：2010-06-09
申请人： KONINKLIJKE PHILIPS ELECTRONICS N. V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , VOGTMEIER, Gereon , ENGEL, Klaus, J. , KOEHLER, Thomas , ROESSL, Ewald , SCHLOMKA, Jens-Peter
发明人： VOGTMEIER, Gereon , ENGEL, Klaus, J. , KOEHLER, Thomas , ROESSL, Ewald , SCHLOMKA, Jens-Peter
IPC分类号： G02B5/18 , G21K1/06
CPC分类号： G02B5/1857 , A61B6/484 , G21K2201/06 , G21K2207/005
摘要： The present invention relates to phase-contrast imaging which visualizes the phase information of coherent radiation passing a scanned object. Focused gratings are used which reduce the creation of trapezoid profile in a projection with a particular angle to the optical axis. A laser supported method is used in combination with a dedicating etching process for creating such focused grating structures.
摘要翻译：本发明涉及相位成像，其可视化通过扫描对象的相干辐射的相位信息。使用聚焦光栅，其减小了与光轴具有特定角度的投影中的梯形轮廓的产生。激光支持的方法与用于产生这种聚焦光栅结构的专用蚀刻工艺结合使用。

2. 发明申请

WO2011070488A1 PHASE CONTRAST IMAGING 审中-公开
标题翻译：相位对比成像
公开(公告)号：WO2011070488A1
公开(公告)日：2011-06-16
申请号：PCT/IB2010/055561
申请日：2010-12-03
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , GELLER, Diester , ENGEL, Klaus, J. , VOGTMEIER, Gereon , KOEHLER, Thomas , ROESSL, Ewald
发明人： GELLER, Diester , ENGEL, Klaus, J. , VOGTMEIER, Gereon , KOEHLER, Thomas , ROESSL, Ewald
IPC分类号： A61B6/00 , G01N23/04
CPC分类号： A61B6/00 , A61B6/4291 , A61B6/4441 , A61B6/484
摘要： X-raydevices for Phase Contrast Imaging (PCI) are often built up with the help ofgratings. For large field-of-views (FOV), production cost and complexity of these gratings could increase significantly as they need to have a focused geometry. Instead of a pure PCI with a large FOV, this invention suggests to combine a traditional absorption X-rayimaging system with large-FOV with an insertable low-cost PCI systemwith small-FOV, The invention supports the user to direct the PCI systemwith reduced FOV to a region that he regards as most interesting for performing a PCI scan thus eliminating X-raydose exposure for scanning regions not interesting fora radiologist. The PCI scan may be generated on the basis of local tomography.
摘要翻译：用于相位对比成像（PCI）的X射线装置通常在格栅的帮助下建立。对于大视野（FOV）来说，这些光栅的生产成本和复杂性可能会因为需要聚焦几何而显着增加。本发明不是采用具有大FOV的纯PCI，而是将传统的吸收式X射线成像系统与大型FOV结合，并具有小FOV的可插入式低成本PCI系统。本发明支持用户将具有降低的FOV的PCI系统他认为最有意思的是进行PCI扫描，从而消除了对放射科医生不感兴趣的扫描区域的X射线摄影。可以基于局部断层摄影产生PCI扫描。

3. 发明申请

WO2010146503A1 CORRECTION METHOD FOR DIFFERENTIAL PHASE CONTRAST IMAGING 审中-公开
标题翻译：用于差分相位成像的校正方法
公开(公告)号：WO2010146503A1
公开(公告)日：2010-12-23
申请号：PCT/IB2010/052577
申请日：2010-06-10
申请人： KONINKLIJKE PHILIPS ELECTRONICS N. V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , ENGEL, Klaus, J. , GELLER, Dieter , VOGTMEIER, Gereon
发明人： ENGEL, Klaus, J. , GELLER, Dieter , VOGTMEIER, Gereon
IPC分类号： A61B6/00 , G01N23/04
CPC分类号： A61B6/00 , A61B6/4092 , A61B6/4291 , A61B6/484 , G01N23/04 , G21K1/06 , G21K2207/005
摘要： The present invention generally refers to a correction method for grating- based X-ray differential phase contrast imaging (DPCI) as well as to an apparatus which can advantageously be applied in X-ray radiography and tomography for hard X-ray DPCI of a sample object or an anatomical region of interest to be scanned. More precisely, the proposed invention provides a suitable approach that helps to enhance the image quality of an acquired X-ray image which is affected by phase wrapping, e.g. in the resulting Moiré interference pattern of an emitted X-ray beam in the detector plane of a Talbot-Lau type interferometer after diffracting said X-ray beam at a phase-shifting beam splitter grating. This problem, which is further aggravated by noise in the obtained DPCI images, occurs if the phase between two adjacent pixels in the detected X-ray image varies by more than π radians and is effected by a line integration over the object's local phase gradient,which induces a phase offset error of π radians that leads to prominent line artifacts parallel to the direction of said line integration.
摘要翻译：本发明总体上涉及一种用于基于光栅的X射线差分相位对比成像（DPCI）的校正方法，以及可以有利地应用于样品的X射线X射线和X射线DPCI的X射线摄影和断层摄影的装置对象或要扫描的感兴趣的解剖区域。更精确地，所提出的发明提供了一种合适的方法，其有助于增强受到相位包裹影响的获得的X射线图像的图像质量，例如，在衍射在相移分束器光栅上的所述X射线束之后，在Talbot-Lau型干涉仪的检测器平面中产生的发射的X射线束的莫尔干涉图。如果检测到的X射线图像中的两个相邻像素之间的相位变化多于p弧度并且通过对象的局部相位梯度上的线积分来实现，则获得的DPCI图像中的噪声进一步恶化的问题发生，其导致p弧度的相位偏移误差，其导致平行于所述线积分的方向的突出的线伪影。

4. 发明申请

WO2010150136A1 GRATING-BASED PHASE CONTRAST X-RAY IMAGING APPARATUS AND METHODS 审中-公开
标题翻译：基于GRATING的相位对比X射线成像装置及方法
公开(公告)号：WO2010150136A1
公开(公告)日：2010-12-29
申请号：PCT/IB2010/052656
申请日：2010-06-15
申请人： KONINKLIJKE PHILIPS ELECTRONICS N. V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , VOGTMEIER, Gereon , ENGEL, Klaus, J.
发明人： VOGTMEIER, Gereon , ENGEL, Klaus, J.
IPC分类号： A61B6/00 , G01N23/04 , G21K1/06
CPC分类号： G01N23/046 , A61B6/032 , A61B6/4021 , A61B6/4208 , A61B6/4291 , A61B6/484 , G01N2223/419 , G21K2201/06 , G21K2207/005
摘要： The invention relates to a grating-based phase-contrast X-ray imaging apparatus and corresponding method comprising an X-ray source array including a plurality of distributed X-ray sources which are switchable, a phase grating, an analyzer grating, and an image detector.
摘要翻译：本发明涉及一种基于光栅的相位对比度X射线成像装置及其相应的方法，该装置包括：X射线源阵列，包括可切换的多个分布式X射线源，相位光栅，分析器光栅和图像探测器。

5. 发明申请

WO2011070493A1 APPARATUS FOR PHASE-CONTRAST IMAGING COMPRISING A DISPLACEABLE X-RAY DETECTOR ELEMENT AND METHOD 审中-公开
标题翻译：包含可移位X射线探测器元件和方法的相位对比成像装置
公开(公告)号：WO2011070493A1
公开(公告)日：2011-06-16
申请号：PCT/IB2010/055571
申请日：2010-12-03
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , ROESSL, Ewald , ENGEL, Klaus J. , VOGTMEIER, Gereon , GELLER, Dieter
发明人： ROESSL, Ewald , ENGEL, Klaus J. , VOGTMEIER, Gereon , GELLER, Dieter
IPC分类号： A61B6/00 , G01N23/04
CPC分类号： A61B6/00 , A61B6/032 , A61B6/4021 , A61B6/4092 , A61B6/4291 , A61B6/484
摘要： The present invention relates to X-ray image acquisition technology in general. Employing phase-contrast imaging for X-ray image acquisition may significantly enhance the quality and information content of images acquired. However, phase- contrast information may only be obtainable in a small detector region, possibly being too small for a sufficient field of view for specialized X-ray imaging applications. Accordingly, an apparatus for phase-contrast imaging is provided that may allow the acquisition of an enlarged field of view. According to the present invention an apparatus (1) for phase-contrast imaging is provided, comprising an X-ray source (2), an X-ray detector (12) element having a detector size, a beam splitter grating (8) and an analyzer grating (10). An object (6) is arrangeable between the X-ray source (2) and the X-ray detector (12). The beam splitter grating (8) and the analyzer grating (10) are arrangeable between the X-ray source (2) and the X-ray detector (12). X-ray source (2), the beam splitter grating (8), the analyzer grating (10) and the X-ray detector (12) are operatively coupled such that a phase-contrast image of the object (6) is obtainable. The apparatus (1) is adapted for acquiring a phase-contrast image having a field of view larger than the detector size. The X-ray detector element (12) is displaceable and by the displacement of the X-ray detector (12) a phase-contrast image of the field of view is obtainable.
摘要翻译：本发明一般涉及X射线图像采集技术。采用X射线图像获取的相位对比成像可以显着提高所获取图像的质量和信息含量。然而，相位对比度信息可能只能在小的检测器区域中获得，对于专门的X射线成像应用而言，对于足够的视野可能太小。因此，提供了一种用于相位对比成像的装置，其可以允许获取放大的视场。根据本发明，提供了一种用于相位对比成像的装置（1），包括具有检测器尺寸的X射线源（2），X射线检测器（12）元件，分束器光栅（8）和分析器光栅（10）。物体（6）可布置在X射线源（2）和X射线检测器（12）之间。分束器光栅（8）和分析器光栅（10）可布置在X射线源（2）和X射线检测器（12）之间。 X射线源（2），分束器光栅（8），分析器光栅（10）和X射线检测器（12）可操作地耦合，使得可以获得物体（6）的相差图像。该装置（1）适于获取具有大于检测器尺寸的视场的相位对比度图像。 X射线检测器元件（12）可移动，并且通过X射线检测器（12）的移位，可以获得视场的相位对比图像。

6. 发明申请

WO2011070521A1 CALIBRATION OF DIFFERENTIAL PHASE-CONTRAST IMAGING SYSTEMS 审中-公开
标题翻译：差分相位成像系统的校准
公开(公告)号：WO2011070521A1
公开(公告)日：2011-06-16
申请号：PCT/IB2010/055664
申请日：2010-12-08
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , VOGTMEIER, Gereon , ENGEL, Klaus Jürgen , GELLER, Dieter , KOEHLER, Thomas , ROESSL, Ewald
发明人： VOGTMEIER, Gereon , ENGEL, Klaus Jürgen , GELLER, Dieter , KOEHLER, Thomas , ROESSL, Ewald
IPC分类号： A61B1/00
CPC分类号： A61B6/4291 , A61B6/4092 , A61B6/484 , A61B6/583 , G21K2207/005
摘要： The present invention relates to an X-ray imaging system and a method for differential phase - contrast imaging of an object. To improve calibration of differential phase - contrast imaging systems and the alignment of the gratings an X-ray imaging system is provided that comprises an X-ray emitting arrangement providing at least partially coherent X-ray radiation and an X-ray detection arrangement comprising a phase- shift diffraction grating, a phase analyzer grating, and an X-ray image detector, all arranged along an optical axis. For stepping, the gratings and/or the X-ray emitting arrangement are provided with at least two actuators arranged opposite to each other with reference to the optical axis. For calibration, calibration projections are acquired without an object, wherein, the emitted X-ray radiation or one of the gratings is stepwise displaced with a calibration displacement value. For examination, measurement projections are acquired with an object, wherein the emitted X-ray radiation or one of the gratings is stepwise displaced with a measurement, a calibration projection is associated to each of the measurement projections by registering the latter with the calibration projections.
摘要翻译：本发明涉及一种用于对象的差分相位对比成像的X射线成像系统和方法。为了改进差分相位对比成像系统的校准和光栅的对准，提供了一种X射线成像系统，其包括提供至少部分相干X射线辐射的X射线发射装置和包括相移衍射光栅，相位分析仪光栅和X射线图像检测器，均沿光轴排列。对于步进，光栅和/或X射线发射装置设置有相对于光轴彼此相对布置的至少两个致动器。对于校准，在没有物体的情况下获取校准投影，其中，所发射的X射线辐射或其中一个光栅以校准位移值逐步位移。为了进行检查，用物体获取测量投影，其中所发射的X射线辐射或其中一个光栅通过测量而逐步移位，通过将校准投影与校准投影相对应地将校准投影与每个测量投影相关联。

7. 发明申请

WO2007034357A2 DATA PROCESSING DEVICE, TOMOGRAPHY APPARATUS FOR EXAMINATION OF AN OBJECT OF INTEREST, METHOD OF EXAMINING AN OBJECT OF INTEREST, COMPUTER-READABLE MEDIUM AND PROGRAM ELEMENT 审中-公开
标题翻译：数据处理装置，用于检查利益对象的测量装置，检查对象的方法，计算机可读介质和程序元素
公开(公告)号：WO2007034357A2
公开(公告)日：2007-03-29
申请号：PCT/IB2006/053225
申请日：2006-09-12
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N. V. , FRACH, Thomas , VOGTMEIER, Gereon
发明人： FRACH, Thomas , VOGTMEIER, Gereon
CPC分类号： G01N23/046 , A61B6/037 , A61B6/56 , G01N2223/419 , H04B7/04 , H04B7/0619 , H04B17/345
摘要： A data processing device, comprising a plurality of emitter antennas (140) arranged on a movable data acquisition device and adapted to emit electromagnetic radiation including data acquired by the movable data acquisition device, a plurality of receiver antennas (150) each adapted to receive the electromagnetic radiation emitted by each of the plurality of emitter antennas (140), and a data processing unit (118) coupled to the plurality of receiver antennas (150) and adapted to extract the data acquired by the movable data acquisition device from the electromagnetic radiation received by the plurality of receiver antennas (150).
摘要翻译：一种数据处理装置，包括布置在可移动数据采集装置上并适于发射包括由可移动数据采集装置获取的数据的电磁辐射的多个发射天线（140），多个接收机天线（150），每个接收天线适于接收由多个发射器天线（140）中的每一个发射的电磁辐射以及耦合到多个接收天线（150）的数据处理单元（118），并且适于将由可移动数据采集装置获取的数据从电磁辐射由所述多个接收天线（150）接收。

8. 发明申请

WO2006018804A1 MICROELECTRONIC SYSTEM WITH A PASSIVATION LAYER 审中-公开
标题翻译：具有钝化层的微电子系统
公开(公告)号：WO2006018804A1
公开(公告)日：2006-02-23
申请号：PCT/IB2005/052673
申请日：2005-08-11
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N. V. , VOGTMEIER, Gereon , STEADMAN, Roger , ZEITLER, Günter , ENGEL, Klaus Jürgen , WIECZOREK, Herfried
发明人： VOGTMEIER, Gereon , STEADMAN, Roger , ZEITLER, Günter , ENGEL, Klaus Jürgen , WIECZOREK, Herfried
IPC分类号： H01L27/146 , H01L31/0216 , H01L31/101 , H01L31/115 , G01T1/20 , H05G1/00 , G01V5/00
CPC分类号： H01L27/14663 , H01L27/14676 , H01L31/085 , H01L31/101 , H01L31/115
摘要： The invention relates to a microelectronic system, particularly for an X-ray detector, comprising a semiconductor layer (1) with an array of pixels (P) which are composed of photosensitive components (3) and associated electronic circuits (4). An insulating passivation layer (5) with recesses (5a) in its surface is disposed between the semiconductor layer (1) and a scintillator (8). A shielding metal (6) for the protection of the electronic circuits (4) from X-radiation may be disposed in the recesses (5a) of the passivation layer (5). Furthermore, the recesses may contain glue for the fixation of the scintillator (8), wherein the passivation layer (5) additionally serves as a spacer between scintillator (8) and semiconductor layer (1).
摘要翻译：本发明涉及一种微电子系统，特别是一种用于X射线检测器的微电子系统，其包括具有由光敏元件（3）和相关电子电路（4）组成的像素阵列（P）的半导体层（1）。在其表面上具有凹部（5a）的绝缘钝化层（5）设置在半导体层（1）和闪烁体（8）之间。用于保护电子电路（4）免受X射线的屏蔽金属（6）可设置在钝化层（5）的凹槽（5a）中。此外，凹部可以包含用于固定闪烁体（8）的胶，其中钝化层（5）另外用作闪烁体（8）和半导体层（1）之间的间隔物。

9. 发明申请

WO2010044008A1 GRID AND METHOD OF MANUFACTURING A GRID FOR SELECTIVE TRANSMISSION OF ELECTROMAGNETIC RADIATION, PARTICULARLY X-RAY RADIATION FOR MAMMOGRAPHY APPLICATIONS 审中-公开
标题翻译：用于选择性传输电磁辐射的网格和方法，用于MAMMOGRAPHY应用的特别X射线辐射
公开(公告)号：WO2010044008A1
公开(公告)日：2010-04-22
申请号：PCT/IB2009/054382
申请日：2009-10-07
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N. V. , VOGTMEIER, Gereon
发明人： VOGTMEIER, Gereon
IPC分类号： G21K1/02 , B22F3/105
CPC分类号： G21K1/025 , B22F3/1055 , B33Y10/00 , B33Y80/00 , Y02P10/295
摘要： A method of manufacturing a grid (1) for selective transmission of electromagnetic radiation, particularly X-rayradiation, is proposed. The method comprises: providing a support element (3) having self-supporting stability, wherein the support element (3) is made with a material which essentially absorbs no electromagnetic radiation to be selectively transmitted through the grid; applying a metal layer (5) at a surface of the support element (3); and building a selective transmission structure (7) at a surface of the metal layer (5) with a material which absorbs electromagnetic radiation to be selectively transmitted through the grid, wherein the transmission structure is build using selective laser sintering. As the support element (3) provides sufficient mechanical stability but does not absorb the respective radiation, the selective transmission structure (7) build thereon using selective sintering might not have to be subsequently separated from a manufacturing substrate thereby preventing separation/dicing losses and, furthermore, might be structurally held and protected against damage during handling of the grid.
摘要翻译：提出了制造用于选择性地传输电磁辐射的电网（1）的方法，特别是X射线辐射。该方法包括：提供具有自支撑稳定性的支撑元件（3），其中支撑元件（3）由基本上不吸收电磁辐射的材料制成，以选择性地透过网格; 在所述支撑元件（3）的表面上施加金属层（5）; 以及通过吸收电磁辐射的材料在所述金属层（5）的表面上建立选择性透射结构（7）以选择性地透过所述栅格，其中所述透射结构使用选择性激光烧结来构建。由于支撑元件（3）提供足够的机械稳定性但不吸收相应的辐射，所以使用选择性烧结的选择性透射结构（7）可能不必随后与制造基板分离，从而防止分离/切割损失，此外，可以在结构上保持和保护在处理电网期间的损坏。

10. 发明申请

WO2007023422A2 INSPECTION METHOD AND INSPECTION DEVICE FOR SUBSTRATES 审中-公开
标题翻译：检测方法和基底检测装置
公开(公告)号：WO2007023422A2
公开(公告)日：2007-03-01
申请号：PCT/IB2006/052825
申请日：2006-08-16
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N. V. , DORSCHEID, Ralf , VOGTMEIER, Gereon , STEADMAN, Roger
发明人： DORSCHEID, Ralf , VOGTMEIER, Gereon , STEADMAN, Roger
CPC分类号： G01R1/0735 , G01R31/2635 , G01R31/2889
摘要： An inspection method for through- wafer interconnects of a through- wafer interconnects substrate (105) the substrate having a front-side and a back-side on which back-side at least one contact (218) is formed, comprises the steps of placing a multi-contact foil (108) on the back-side and contacting the multi-contact foil (108) with a contacting substrate (109). An inspection device (107) for a through-wafer interconnects substrate (105) comprising a multi-contact foil (108) contactable to a through-wafer interconnects substrate (105) and contacted to a contacting substrate (105).
摘要翻译：用于贯穿晶片的贯穿晶片互连的检查方法将衬底（105）与具有正面和背面的衬底互连，在正面和背面上，背面至少一个触点（218）包括在背面放置多接触箔（108）并使多接触箔（108）与接触衬底（109）接触的步骤。一种用于贯穿晶片互连衬底（105）的检查装置（107），包括可与贯穿晶片互连衬底（105）接触并与接触衬底（105）接触的多触点箔片（108）。

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