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1. 发明申请

WO2011077302A2 RADIATION DETECTOR ASSEMBLY WITH TEST CIRCUITRY 审中-公开
标题翻译：辐射检测器总成与测试电路
公开(公告)号：WO2011077302A2
公开(公告)日：2011-06-30
申请号：PCT/IB2010055633
申请日：2010-12-07
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS INTELLECTUAL PROPERTY , HERRMANN CHRISTOPH , STEADMAN ROGER , MUELHENS OLIVER
发明人： HERRMANN CHRISTOPH , STEADMAN ROGER , MUELHENS OLIVER
IPC分类号： G01T1/17
CPC分类号： G01T1/243 , G01T1/247 , G01T7/005 , H01J49/0009 , H04N5/32 , H04N5/378 , H04N17/002
摘要： A radiation detector assembly (20) includes a detector array module (40) configured to convert radiation particles to electrical detection pulses, and an application specific integrated circuit (ASIC) (42) operatively connected with the detector array. The ASIC includes signal processing circuitry (60) configured to digitize an electrical detection pulse received from the detector array, and test circuitry (80) configured to inject a test electrical pulse into the signal processing circuitry. The test circuitry includes a current meter (84) configured to measure the test electrical pulse injected into the signal processing circuitry, and a charge pulse generator (82) configured to generate a test electrical pulse that is injected into the signal processing circuitry. The radiation detector assembly (20) is assembled by operatively connecting the ASIC (42) with the detector array module (40), and the signal processing circuitry (60) of the ASIC of the assembled radiation detector assembly is tested without the use of radiation.
摘要翻译：辐射检测器组件（20）包括被配置为将辐射粒子转换成电检测脉冲的检测器阵列模块（40）以及与检测器阵列可操作地连接的专用集成电路（ASIC）（42）。 ASIC包括被配置为数字化从检测器阵列接收的电检测脉冲的信号处理电路（60），以及配置成将测试电脉冲注入到信号处理电路中的测试电路（80）。测试电路包括配置成测量注入到信号处理电路中的测试电脉冲的电流计（84）和被配置为产生被注入到信号处理电路中的测试电脉冲的充电脉冲发生器（82）。通过将ASIC（42）与检测器阵列模块（40）可操作地连接来组装放射线检测器组件（20），并且组装的辐射探测器组件的ASIC的信号处理电路（60）被测试而不使用辐射。

2. 发明申请

WO2008050283A2 APPARATUS, IMAGING DEVICE AND METHOD FOR DETECTING X-RAY RADIATION 审中-公开
标题翻译：装置，成像装置和用于检测X射线辐射的方法
公开(公告)号：WO2008050283A2
公开(公告)日：2008-05-02
申请号：PCT/IB2007054283
申请日：2007-10-22
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS INTELLECTUAL PROPERTY , STEADMAN ROGER , ZEITLER GUENTER , HERRMANN CHRISTOPH , BAEUMER CHRISTIAN
发明人： STEADMAN ROGER , ZEITLER GUENTER , HERRMANN CHRISTOPH , BAEUMER CHRISTIAN
CPC分类号： G01T1/17
摘要： The invention is directed at an apparatus (10), an imaging device and a method for detecting X-ray photons, in particular photons (32,34) in a computer tomograph. Photons (32,34) are converted into an electrical pulse and compared against a threshold using a discriminator (20). The electrical network (12) performing these functions comprises a switching element (28), that can modify the electrical path (22) along which the process signals travel. The trigger signal (V T ) for actuating the switching element (28) is derived from an electrical state of the electrical path (22). If a pulse associated to a photon (32,34) is detected, the switching element (28) is actuated in order to avoid that the processing of the charge pulse stemming from a first photon (32) is affected by a subsequent second photon (34).
摘要翻译：本发明涉及一种用于检测计算机断层摄影机中的X射线光子，特别是光子（32,34）的成像装置和方法的装置（10）。光子（32,34）被转换成电脉冲，并使用鉴别器（20）与阈值进行比较。执行这些功能的电网（12）包括开关元件（28），其可以修改过程信号沿其移动的电路径（22）。用于致动开关元件（28）的触发信号（V SUB T）是从电路径（22）的电气状态导出的。如果检测到与光子（32,34）相关联的脉冲，则开关元件（28）被致动以避免由第一光子（32）产生的电荷脉冲的处理受随后的第二光子（ 34）。

3. 发明申请

WO2010119358A3 SPECTRAL IMAGING 审中-公开
标题翻译：光谱成像
公开(公告)号：WO2010119358A3
公开(公告)日：2011-08-25
申请号：PCT/IB2010051101
申请日：2010-03-15
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS INTELLECTUAL PROPERTY , BAEUMER CHRISTIAN , HERRMANN CHRISTOPH , STEADMAN ROGER , RUETTEN WALTER
发明人： BAEUMER CHRISTIAN , HERRMANN CHRISTOPH , STEADMAN ROGER , RUETTEN WALTER
IPC分类号： G01T1/164
CPC分类号： G01T1/1647 , G01T1/2985
摘要： An imaging system includes a scintillator array (202) and a digital photomultiplier array (204). A photon counting channel (212), an integrating channel (210), and a moment generating channel (214) process the output signal of the digital photomultiplier array (204). A reconstructor (122) spectrally resolves the first, the second and the third output signals. In one embodiment, a controller (232) activates the photon counting channel (212) to process the digital signal only if a radiation flux is below a predetermined threshold. An imaging system includes at least one direct conversion layer (302) and at least two scintillator layers (304) and corresponding photosensors (306). A photon counting channel (212) processes an output of the at least one direct conversion layer (302), and an integrating channel (210) and a moment generating channel (214) process respective outputs of the photosensors (306). A reconstructor (122) spectrally resolves the first, the second and the third output signals.
摘要翻译：成像系统包括闪烁体阵列（202）和数字光电倍增管阵列（204）。光子计数通道（212），积分通道（210）和力矩产生通道（214）处理数字光电倍增管阵列（204）的输出信号。重建器（122）对第一，第二和第三输出信号进行光谱解析。在一个实施例中，仅当辐射通量低于预定阈值时，控制器（232）激活光子计数通道（212）才能处理数字信号。成像系统包括至少一个直接转换层（302）和至少两个闪烁体层（304）和对应的光电传感器（306）。光子计数通道（212）处理至少一个直接转换层（302）的输出，并且积分通道（210）和力矩产生通道（214）处理光电传感器（306）的相应输出。重建器（122）对第一，第二和第三输出信号进行光谱解析。

4. 发明申请

WO2008020379A3 RADIATION DETECTOR WITH COUNTING ELECTRONICS 审中-公开
标题翻译：具有计数电子的辐射探测器
公开(公告)号：WO2008020379A3
公开(公告)日：2008-04-03
申请号：PCT/IB2007053182
申请日：2007-08-10
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS INTELLECTUAL PROPERTY , HERRMANN CHRISTOPH , STEADMAN ROGER , ZEITLER GUENTER , BAEUMER CHRISTIAN
发明人： HERRMANN CHRISTOPH , STEADMAN ROGER , ZEITLER GUENTER , BAEUMER CHRISTIAN
IPC分类号： G01T1/17
CPC分类号： G01T1/17
摘要： The invention relates to a radiation detector, particularly an X-ray detector (100), comprising a counting circuitry (10, 20, 30) for counting electrical pulses generated by the (sub-)pixels (2) of the detector. In the counting circuitry, the results counted by a fast counting stage (10) are at intervals transferred to a slow counting stage (20). The fast counting stage (10) may for example comprise a fast counter (111) with a low bit-depth operating as a frequency divider in front of a slow counter (121) of high bit-depth in the slow counting stage (20). The counting circuitry (10, 20, 30) can optionally be fed via a multiplexer (4) with the signals of several (sub-)pixels (2). Furthermore, the pixels (1, 2) of the radiation device may optionally deliver energy resolved pulses.
摘要翻译：本发明涉及一种辐射检测器，特别是一种X射线检测器（100），包括用于对由检测器的（子）像素（2）产生的电脉冲进行计数的计数电路（10,20,30）。在计数电路中，通过快速计数级（10）计数的结果以间隔传送到慢计数级（20）。快速计数级（10）可以例如包括具有低位深度的快速计数器（111），其作为在慢计数级（20）中的高位深度的慢计数器（121）前面的分频器操作，。计数电路（10,20,30）可以可选地通过多路复用器（4）与多个（子）像素（2）的信号馈送。此外，辐射装置的像素（1,2）可以可选地递送能量分辨脉冲。

5. 发明申请

WO2008155680A3 SPECTRAL PHOTON COUNTING DETECTOR 审中-公开
标题翻译：光谱计数检测器
公开(公告)号：WO2008155680A3
公开(公告)日：2009-09-24
申请号：PCT/IB2008052043
申请日：2008-05-23
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS INTELLECTUAL PROPERTY , HERRMANN CHRISTOPH , STEADMAN ROGER , BAEUMER CHRISTIAN , ZEITLER GUENTER
发明人： HERRMANN CHRISTOPH , STEADMAN ROGER , BAEUMER CHRISTIAN , ZEITLER GUENTER
IPC分类号： G01T1/17
CPC分类号： G01T1/171
摘要： An apparatus includes an integrator (120) that produces a pulse having a peak amplitude indicative of the energy of a detected photon. First discharging circuitry (136) discharges the integrator (120) at a first discharging speed, and second discharging circuitry (124) discharges the integrator (120) at a second discharging speed. The first discharging speed is less than the second discharging speed.
摘要翻译：一种装置包括产生具有指示被检测光子的能量的峰值振幅的脉冲的积分器（120）。第一放电电路（136）以第一放电速度放电积分器（120），第二放电电路（124）以第二放电速度放电积分器（120）。第一放电速度小于第二放电速度。

6. 发明申请

WO2008146218A3 SPECTRAL PHOTON COUNTING DETECTOR 审中-公开
标题翻译：光谱计数检测器
公开(公告)号：WO2008146218A3
公开(公告)日：2009-06-25
申请号：PCT/IB2008052029
申请日：2008-05-22
申请人： KONINKL PHILIPS ELECTRONICS NV , PHILIPS INTELLECTUAL PROPERTY , HERRMANN CHRISTOPH , STEADMAN ROGER , BAEUMER CHRISTIAN , ZEITLER GUENTER
发明人： HERRMANN CHRISTOPH , STEADMAN ROGER , BAEUMER CHRISTIAN , ZEITLER GUENTER
IPC分类号： G01T1/17
CPC分类号： G01T1/171
摘要： An apparatus includes a scale factor determiner (236) that determines a count scale factor based on a measured count of a number detected photons for an energy threshold and an estimated actual count of the number of detected photons. The photons include poly-energetic photons detected by a radiation sensitive detector. The apparatus further includes a count sealer (136) that employs the count scale factor to scale measured counts of detected photons for different energy thresholds.
摘要翻译：一种装置包括比例因子确定器（236），该比例因子确定器（236）基于针对能量阈值的检测到的光子数量的测量计数和检测到的光子数量的估计实际计数来确定计数比例因子。光子包括由辐射敏感检测器检测的多能光子。该装置还包括计数密封器（136），其使用计数比例因子来缩放检测到的光子对于不同能量阈值的计数。

7. 发明申请

WO2005096946A8 MODULAR DEVICE FOR THE DETECTION AND/OR TRANSMISSION OF RADIATION 审中-公开
标题翻译：用于检测和/或传输辐射的模块化设备
公开(公告)号：WO2005096946A8
公开(公告)日：2006-11-02
申请号：PCT/IB2005050971
申请日：2005-03-22
申请人： PHILIPS INTELLECTUAL PROPERTY , KONINKL PHILIPS ELECTRONICS NV , DORSCHEID RALF , VOGTMEIER GEREON , STEADMAN ROGER
发明人： DORSCHEID RALF , VOGTMEIER GEREON , STEADMAN ROGER
IPC分类号： A61B6/03 , G01T1/20
CPC分类号： G01T1/2018 , A61B6/032 , A61B6/4233 , A61B6/4291 , A61B6/4411
摘要： The invention relates to a device for the detection and/or transmission of radiation, particularly an X-ray detector 1, that consists of a carrier 10 on which an array of detector modules 20 is arranged. The carrier 10 comprises holes 11 through which a ball at the backside of the detector modules 20 can be inserted in order to fix the modules such that they can still rotate to a certain degree. Due to this freedom, the sensor modules 20 can align themselves during assembly.
摘要翻译：本发明涉及一种用于检测和/或传输辐射的装置，特别是一种X射线检测器1，其由载体10组成，其上布置有检测器模块阵列20。载体10包括孔11，通过该孔11可以插入检测器模块20的后侧的球，以便固定模块，使得它们仍然可以一定程度地旋转。由于这种自由度，传感器模块20可以在组装期间自己对准。

8. 发明申请

WO2007034352A3 GRID FOR SELECTIVE ABSORPTION OF ELECTROMAGNETIC RADIATION AND METHOD FOR ITS MANUFACTURE 审中-公开
标题翻译：用于选择性吸收电磁辐射的网格及其制造方法
公开(公告)号：WO2007034352A3
公开(公告)日：2008-11-20
申请号：PCT/IB2006053208
申请日：2006-09-11
申请人： PHILIPS INTELLECTUAL PROPERTY , KONINKL PHILIPS ELECTRONICS NV , DORSCHEID RALF , VOGTMEIER GEREON , STEADMAN ROGER , GROOM ROY K , ELGALY AVNER
发明人： DORSCHEID RALF , VOGTMEIER GEREON , STEADMAN ROGER , GROOM ROY K , ELGALY AVNER
IPC分类号： G21K1/02 , A61B6/06
CPC分类号： G21K1/025 , A61B6/032 , A61B6/037 , A61B6/06 , A61B6/4258 , A61B6/4291
摘要： A Grid (1) for selective absorption of electromagnetic radiation (2, 3), as used e.g. in CT or NM imaging, comprises a block of a rigid foam material (4), where the foam material is essentially transparent to the electromagnetic radiation (2, 3), a first set of radiation absorbing lamellae (5), and a second set of radiation absorbing lamellae (6), the first and the second set of lamellae are arranged in the block of foam material so that a radiation transmission direction (T) is defined, the first set of lamellae and the second set of lamellae being arranged on top of each other with respect to the transmission direction (T). Such a grid arrangement is rigid due to the use of a carrier material, can be manufactured precisely and, furthermore, two-dimensional grids can be manufactured without the need to physically intersect the lamellae.
摘要翻译：用于选择性吸收电磁辐射（2,3）的格栅（1）在CT或NM成像中包括刚性泡沫材料块（4），其中泡沫材料对电磁辐射（2,3）基本上是透明的，第一组辐射吸收薄片（5）和第二组的辐射吸收薄片（6），第一和第二组薄片布置在泡沫材料块中，从而定义辐射透射方向（T），第一组薄片和第二组薄片布置在相对于传输方向（T）彼此相邻。由于使用载体材料，这种格栅布置是刚性的，因此可以精确地制造，此外，可以制造二维格栅，而不需要物理地与薄片相交。

9. 发明申请

WO2007110799A3 LOW OHMIC THROUGH SUBSTRATE INTERCONNECTION FOR SEMICONDUCTOR CARRIERS 审中-公开
标题翻译：通过半导体载体的基板互连的低OHMIC
公开(公告)号：WO2007110799A3
公开(公告)日：2007-12-13
申请号：PCT/IB2007050914
申请日：2007-03-16
申请人： PHILIPS INTELLECTUAL PROPERTY , KONINKL PHILIPS ELECTRONICS NV , VOGTMEIER GEREON , STEADMAN ROGER , DORSCHEID RALF , JONKERS JEROEN
发明人： VOGTMEIER GEREON , STEADMAN ROGER , DORSCHEID RALF , JONKERS JEROEN
IPC分类号： H01L23/48
CPC分类号： H01L21/76898 , H01L23/481 , H01L2224/0401 , H01L2224/05 , H01L2224/131 , H01L2924/014
摘要： It is described a low ohmic Through Wafer Interconnection (TWI) for electronic chips formed on a semiconductor substrate (600). The TWI comprises a first connection (610) extending between a front surface and a back surface of the substrate (600). The first connection (610) comprises a through hole filled with a low ohmic material having a specific resistivity lower than poly silicon. The TWI further comprises a second connection (615) also extending between the front surface and the back surface. The second connection (615) is spatially separated from the first connection (610) by at least a portion of the semiconductor substrate (600). The front surface is provided with a integrated circuit arrangement (620) wherein the first connection (610) is electrically coupled to at least one node of the integrated circuit arrangement (620) without penetrating the integrated circuit arrangement (620). During processing the TWI the through hole may be filled first with a non-metallic material, e.g. poly silicon. After forming integrated components (620) on top of the front surface the substrate (600) may be thinned and the non-metallic material may be substituted with the low ohmic material, which is in particular a metallic material.
摘要翻译：描述了形成在半导体衬底（600）上的电子芯片的低欧姆通晶片互连（TWI）。 TWI包括在基板（600）的前表面和后表面之间延伸的第一连接（610）。第一连接（610）包括填充有低于多晶硅的比电阻率的低欧姆材料的通孔。 TWI还包括也在前表面和后表面之间延伸的第二连接（615）。第二连接（615）通过半导体衬底（600）的至少一部分在空间上与第一连接（610）分离。前表面设置有集成电路装置（620），其中第一连接（610）电耦合到集成电路装置（620）的至少一个节点而不穿透集成电路装置（620）。在处理TWI期间，通孔可以首先用非金属材料填充，例如，多晶硅。在前表面顶部形成集成组件（620）之后，可以使衬底（600）变薄并且非金属材料可以被低欧姆材料代替，这是特别是金属材料。

10. 发明申请

WO2007023422A3 INSPECTION METHOD AND INSPECTION DEVICE FOR SUBSTRATES 审中-公开
标题翻译：基板检查方法和检查装置
公开(公告)号：WO2007023422A3
公开(公告)日：2007-05-31
申请号：PCT/IB2006052825
申请日：2006-08-16
申请人： PHILIPS INTELLECTUAL PROPERTY , KONINKL PHILIPS ELECTRONICS NV , DORSCHEID RALF , VOGTMEIER GEREON , STEADMAN ROGER
发明人： DORSCHEID RALF , VOGTMEIER GEREON , STEADMAN ROGER
IPC分类号： G01R1/073
CPC分类号： G01R1/0735 , G01R31/2635 , G01R31/2889
摘要： An inspection method for through- wafer interconnects of a through- wafer interconnects substrate (105) the substrate having a front-side and a back-side on which back-side at least one contact (218) is formed, comprises the steps of placing a multi-contact foil (108) on the back-side and contacting the multi-contact foil (108) with a contacting substrate (109). An inspection device (107) for a through-wafer interconnects substrate (105) comprising a multi-contact foil (108) contactable to a through-wafer interconnects substrate (105) and contacted to a contacting substrate (105).
摘要翻译：一种用于贯穿晶片的晶片间互连的检查方法，其中，基片（105）具有形成有背侧至少一个触点（218）的前侧和后侧的基板，包括以下步骤：在多个接触箔（108）上的多个接触箔（108）与接触衬底（109）接触。一种用于贯穿晶片的检查装置（107），其包括可接触透晶片互连基板（105）并与接触基板（105）接触的多接触箔片（108）。

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