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    • 1. 发明授权
    • Methods for forming interconnect structures
    • 形成互连结构的方法
    • US08841211B2
    • 2014-09-23
    • US13153992
    • 2011-06-06
    • Joung Joo LeeXianmin TangTza-Jing Gung
    • Joung Joo LeeXianmin TangTza-Jing Gung
    • H01L21/4763H01L21/285C23C14/34H01L21/768C23C14/04
    • H01L21/2855C23C14/046C23C14/345C23C14/3492H01L21/76882
    • Methods for forming interconnect structures are provided herein. In some embodiments, a method for forming an interconnect on a substrate may include depositing a material atop an upper surface of the substrate and atop one or more surfaces of a feature disposed in the substrate by a first deposition process that deposits the material at a faster rate on the upper surface than on a bottom surface of the feature; depositing the material atop the upper surface of the substrate and atop one or more surfaces of the feature by a second deposition process that deposits the material at a greater rate on the bottom surface of the feature than on the upper surface of the substrate; and heating the deposited material to draw the deposited material towards the bottom surface of the feature to at least partially fill the feature with the deposited material.
    • 本文提供形成互连结构的方法。 在一些实施例中,用于在衬底上形成互连的方法可以包括在衬底的上表面顶部沉积材料,并且通过第一沉积工艺沉积位于衬底中的特征的一个或多个表面上,所述第一沉积工艺以更快的速度沉积材料 在上表面上比在特征的底表面上的速率; 通过第二沉积工艺将所述材料沉积在所述基底的上表面顶部和所述特征的一个或多个表面上方,所述第二沉积工艺在所述特征的底表面上以比在所述基底的上表面上更大的速率沉积材料; 以及加热沉积的材料以将沉积的材料拉向特征的底表面,以至少部分地用沉积的材料填充该特征。
    • 3. 发明申请
    • PVD PROCESS WITH SYNCHRONIZED PROCESS PARAMETERS AND MAGNET POSITION
    • 具有同步工艺参数和磁体位置的PVD工艺
    • US20120181166A1
    • 2012-07-19
    • US13007228
    • 2011-01-14
    • QIAN LUOYe XuTza-Jing GungXianmin Tang
    • QIAN LUOYe XuTza-Jing GungXianmin Tang
    • C23C14/35
    • C23C14/345C23C14/3492C23C14/35H01J37/3455
    • Embodiments of the present invention generally relate to methods for physical vapor deposition processes. The methods generally include synchronizing process chamber conditions with the position of a magnetron. As the magnetron is scanned over a first area of a target, the conditions within the chamber are adjusted to a first set of predetermined process conditions. As the magnetron is subsequently scanned over a second area of the target, the conditions within the chamber are adjusted to a second set of predetermined process conditions different the first set. The target may be divided into more than two areas. By correlating the position of the magnetron with different sets of process conditions, film uniformity can be improved by reducing center-to-edge non-uniformities, such as re-sputter rates which may be higher when the magnetron is near the edge of the target.
    • 本发明的实施方案一般涉及物理气相沉积方法的方法。 方法通常包括使处理室条件与磁控管的位置同步。 当磁控管在目标的第一区域上被扫描时,腔室内的条件被调整到第一组预定的工艺条件。 随着磁控管随后在目标的第二区域上扫描,腔室内的条件被调整到与第一组不同的第二组预定过程条件。 目标可分为两个以上的区域。 通过将磁控管的位置与不同的工艺条件相关联,可以通过减小中心到边缘的不均匀性来改善膜均匀性,例如当磁控管靠近靶的边缘时可能更高的再溅射速率 。