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    • 2. 发明授权
    • System and method for conserving power in a content addressable memory by providing an independent search line voltage
    • 通过提供独立的搜索线电压来节省内容可寻址存储器中的功率的系统和方法
    • US06442055B1
    • 2002-08-27
    • US10016025
    • 2001-12-12
    • Robert E. BuschKevin A. Batson
    • Robert E. BuschKevin A. Batson
    • G11C1500
    • G11C15/043G11C15/04
    • A system and method is disclosed for operating a content addressable memory (CAM) within an integrated circuit using search signals at search input voltages which are substantially independent from an operating voltage of the CAM. A method is disclosed in which search signals are input to CAM cells of the CAM at search input voltages which are substantially independent of an operating voltage of storage elements within the CAM cells. A match signal is output upon detecting a matching condition between the search signals and data stored in the storage elements. The search input voltage can be within about 0.2V above a threshold voltage of a search input device of the CAM memory cell. Search input devices can be selected to have a lower threshold voltage than other devices included within the CAM cell.
    • 公开了一种用于在搜索输入电压下使用基本上独立于CAM的工作电压的搜索信号来操作集成电路内的内容可寻址存储器(CAM)的系统和方法。 公开了一种方法,其中搜索信号以基本上独立于CAM单元内的存储元件的工作电压的搜索输入电压输入到CAM的CAM单元。 在检测到搜索信号和存储在存储元件中的数据之间的匹配条件时输出匹配信号。 搜索输入电压可以在CAM存储器单元的搜索输入装置的阈值电压以上约0.2V内。 可以选择搜索输入设备以具有比包括在CAM单元内的其它设备更低的阈值电压。
    • 5. 发明授权
    • Scannable fuse latches
    • 可擦除保险丝锁存器
    • US06201750B1
    • 2001-03-13
    • US09598427
    • 2000-06-21
    • Robert E. BuschFred J. TowlerReid A. Wistort
    • Robert E. BuschFred J. TowlerReid A. Wistort
    • G11C700
    • G01R31/318541G11C17/16G11C17/18
    • Scannable fuse latches are provided that can override current fuse values, read current fuse values, and latch current fuse values. Using the scannable fuse latches of the current invention allows current fuse values to be overridden, which can be important in testing and failure analysis to place the integrated circuit in a known state. The scannable fuse latches of the current invention also allow current fuse values to be read. This aids failure analysis because the current state of the failed integrated circuit can be determined. Finally, the scannable fuse latches of the present invention allow the current state of fuses to be latched and provided to a core of an integrated circuit.
    • 提供了可以提供可以覆盖当前熔丝值,读取当前熔丝值和锁存当前熔丝值的可擦除保险丝锁存器。 使用本发明的可扫描的熔丝锁存器允许覆盖当前熔丝值,这对于将集成电路置于已知状态的测试和故障分析中可能是重要的。 本发明的可扫描的熔丝锁存器还允许读取当前熔丝值。 这有助于故障分析,因为可以确定故障集成电路的当前状态。 最后,本发明的可扫描熔丝锁存器允许保险丝的当前状态被锁存并提供给集成电路的核心。
    • 9. 发明授权
    • Alternating reference wordline scheme for fast DRAM
    • 快速DRAM的交替参考字线方案
    • US06501675B2
    • 2002-12-31
    • US09854987
    • 2001-05-14
    • Harold PiloRobert E. Busch
    • Harold PiloRobert E. Busch
    • G11C1124
    • G11C8/14G11C7/14G11C11/4099
    • A fast DRAM memory uses ground-sensing as opposed to traditional Vdd/2 sensing. A selected DRAM cell connects to a bit-line true (BLT) or a bit-line complement (BLC). At the start of each cycle the BLT and BLC are restored to ground potential. A pair of alternating reference cells are provided for each bit-line. When a selected DRAM cell is connected either BLT or BLC the first reference cell in the pair is connected to the other bitline to provide a reference voltage to the other bitline which can be compared to the voltage provided by the selected DRAM cell. On a subsequent cycle using the same bitline the second reference cell in the pair is used. Thus it is not necessary to wait for the first reference cell to recharge prior to beginning the next cycle. Switching between the first and second reference cells in the pair alternates in this manner resulting in faster cycle time. The write-back of the reference cells can be hidden since an alternate cell is available for next cycle's reference bitline generation.
    • 快速DRAM存储器使用地面感测,而不是传统的Vdd / 2感测。 所选择的DRAM单元连接到位线真(BLT)或位线补码(BLC)。 在每个循环开始时,BLT和BLC恢复到地电位。 为每个位线提供一对交替参考单元。 当所选择的DRAM单元连接到BLT或BLC时,该对中的第一参考单元连接到另一位线,以向可与所选择的DRAM单元提供的电压进行比较的另一位线提供参考电压。 在使用相同位线的后续周期中,使用该对中的第二参考单元。 因此,在开始下一个周期之前,不需要等待第一个参考单元进行充电。 该对中的第一和第二参考单元之间的切换以这种方式交替地产生更快的周期时间。 可以隐藏参考单元的回写,因为替代单元可用于下一循环的参考位线生成。
    • 10. 发明授权
    • Fast access memory structure
    • 快速存取存储器结构
    • US5276846A
    • 1994-01-04
    • US829608
    • 1992-01-30
    • Frederick J. Aichelmann, Jr.Bruce E. BachmanRobert E. BuschTheodore M. RedmanEndre P. Thoma
    • Frederick J. Aichelmann, Jr.Bruce E. BachmanRobert E. BuschTheodore M. RedmanEndre P. Thoma
    • G11C7/10G06F12/06
    • G11C7/1006
    • A memory chip, comprising a chip memory section organized to hold a plurality of separate blocks of data, with each of the data blocks containing M individual data units; a circuit for addressing a given block of data in the chip memory section; and an N data unit chip parallel output interface from the memory chip where N is less than M, and N is greater than one. The memory chip further comprises a chip register for receiving from the chip memory section at least a portion of an addressed block of data, which portion comprises P data units, where P is greater than N, the chip register having P register stages for holding the P data units of the addressed data block, wherein the P register stages are grouped into at least a first and second groups of stages, with no group of stages comprising more than N register stages and with at least one of the groups of register stages having a plurality of stages. The memory chip also includes a gating structure for gating the respective groups of stages to the N data unit parallel output interface, the gating structure including at least a first gate circuit for gating in parallel the data units held in the first group of stages to the N data unit parallel output interface in accordance with a TOGGLE logic signal, and a second gate circuit for gating in parallel the data units held in the second group of stages to the N data unit parallel output interface in accordance with a NOT TOGGLE logic signal.
    • 一种存储器芯片,包括被组织为保持多个单独的数据块的芯片存储器部分,每个数据块包含M个单独的数据单元; 用于寻址芯片存储器部分中的给定数据块的电路; 以及来自存储器芯片的N个数据单元芯片并行输出接口,其中N小于M,N大于1。 存储器芯片还包括芯片寄存器,用于从芯片存储器部分接收所寻址的数据块的至少一部分,该部分包括P数据单元,其中P大于N,具有P寄存器级的芯片寄存器用于保持 所述寻址数据块的P数据单元,其中所述P寄存器级被分组为至少第一和第二组级,其中没有一组级包括多于N个寄存器级,并且所述寄存器级组中的至少一个具有 多个阶段。 存储器芯片还包括用于将N个数据单元并行输出接口的各个级组门控的选通结构,门控结构至少包括第一门电路,用于并行地选通保持在第一组级中的数据单元 N数据单元并行输出接口,以及第二门电路,用于根据NOT TOGGLE逻辑信号并行地将保持在第二组级中的数据单元门控到N个数据单元并行输出接口。