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1. 发明授权

US5550483A High speed test probe positioning system 失效
标题翻译：高速测试探头定位系统
公开(公告)号：US5550483A
公开(公告)日：1996-08-27
申请号：US342433
申请日：1994-11-18
申请人： James E. Boyette, Jr. , James M. Hammond , Jiann-Chang Lo , James C. Mahlbacher , Michael Servedio , Ali R. Taheri
发明人： James E. Boyette, Jr. , James M. Hammond , Jiann-Chang Lo , James C. Mahlbacher , Michael Servedio , Ali R. Taheri
IPC分类号： G01R1/067 , G01R31/02
CPC分类号： G01R1/06705
摘要： Probing system performance is improved by dynamically positioning a test probe at a test site during the gantry settling interval using a high performance secondary positioner to compensate for the inherent moving mass oscillational displacements. A primary positioner positions the gantry and its associated test probe to within a predetermined axis distance of the test site and a secondary positioner dynamically maintains the test probe at a target position corresponding to the test site during the settling interval by imparting compensating displacements to the test probe to counteract the displacement errors incurred as the primary positioner attempts to settle the gantry at the test site. Similarly, automatic machine tool performance is improved by dynamically positioning a work tool at a work site during the gantry settling interval using a high performance secondary positioner to compensate for the inherent moving mass oscillational displacements. A primary positioner positions the gantry and its associated work tool to within a predetermined axis distance of the work site and a secondary positioner dynamically maintains the work tool at a target position corresponding to the work site during the settling interval by imparting compensating displacements to the work tool to counteract the displacement errors incurred as the primary positioner attempts to settle the gantry at the work site.
摘要翻译：通过使用高性能辅助定位器在机架沉降间隔期间在测试位置处动态定位测试探头来补偿固有的移动质量振荡位移，来提高系统性能。主要定位器将机架及其相关联的测试探针定位在测试位置的预定轴距离内，并且辅助定位器通过赋予测试的补偿位移在静止间隔期间将测试探针动态地维持在对应于测试位置的目标位置探测器可以抵消由于主要定位器试图在测试现场安装龙门架时发生的位移误差。类似地，通过使用高性能二次定位器在机架沉降间隔期间通过在工作现场的动态定位工作工具来补偿固有的移动质量振荡位移，从而提高了自动机床性能。主要定位器将机架及其相关联的工作工具定位在工作现场的预定轴距离内，并且辅助定位器通过向工件施加补偿位移来将工作工具在对应于工作现场的目标位置处动态地维持在工作位置作为主要定位者试图在工地上定位龙门架时发生的位移错误的工具。

2. 发明授权

US5635849A Miniature probe positioning actuator 失效
标题翻译：微型探头定位执行器
公开(公告)号：US5635849A
公开(公告)日：1997-06-03
申请号：US643523
申请日：1996-05-06
申请人： Jiann-Chang Lo , Michael Servedio , James M. Hammond , James E. Boyette, Jr. , Hans-George H. Kolan
发明人： Jiann-Chang Lo , Michael Servedio , James M. Hammond , James E. Boyette, Jr. , Hans-George H. Kolan
IPC分类号： G01R31/26 , G01R1/067 , G01R1/073 , G01R31/28 , H01L21/66 , H02K41/03 , G01R31/22
CPC分类号： G01R1/06705
摘要： Disclosed is a Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging, as well as high in efficiency. The actuator assembly comprises a frame, and at least one pair of spaced apart, laterally extending, conductor carrying, flexible beams attached to the frame. A non-magnetic armature, substantially U-shaped in cross section, is attached adjacent or approximate the extended terminal ends of the beams, and a probe is attached to the base of the "U" of the armature for contacting selected points in the electrical circuit associated with the device being tested. The heart of the actuator includes a coil mounted on the upstanding legs of the U-shaped armature and arranged so that the axis of the coil is perpendicular to the base of the armature but substantially parallel to the probe tip. This arrangement places the `motor` portion of the actuator adjacent the probe and permits accurate and repeatable, fast control of not only probe tip position but probe tip movement. To complete the motor portion of the actuator, means, carried by the frame create a magnetic field across the coil, whereby upon energization of the coil, deflection of the armature (and thus the beams) occurs, effecting movement of the probe tip into contact with selected portions of the device being tested.
摘要翻译：公开了一种探头定位致动器，其成本和质量低，能够具有高加速度，相对长的行程和紧凑的包装以及高的效率。致动器组件包括框架，以及连接到框架的至少一对间隔开的横向延伸的导体承载的柔性梁。基本上U形的横截面的非磁性衔铁被安装在梁的延伸的末端附近或近似的位置，并且探头附接到电枢的“U”的底部，用于接触电气中的选定点与被测设备相关的电路。致动器的心脏包括安装在U形衔铁的直立腿上的线圈，并被布置成使得线圈的轴线垂直于电枢的基部，但基本上平行于探针尖端。这种布置使致动器的“电动机”部分邻近探头，并且允许精确和可重复地，快速地控制探针尖端位置，但是探针尖端运动。为了完成致动器的电动机部分，由框架承载的装置在线圈上产生磁场，由此在线圈通电时，发生电枢（以及因此的梁）的偏转，使探针尖端移动到接触该设备的选定部分被测试。

3. 发明授权

US5532611A Miniature probe positioning actuator 失效
标题翻译：微型探头定位执行器
公开(公告)号：US5532611A
公开(公告)日：1996-07-02
申请号：US451635
申请日：1995-05-26
申请人： Jiann-Chang Lo , Michael Servedio , James M. Hammond , James E. Boyette, Jr. , Hans-George H. Kolan
发明人： Jiann-Chang Lo , Michael Servedio , James M. Hammond , James E. Boyette, Jr. , Hans-George H. Kolan
IPC分类号： G01R31/26 , G01R1/067 , G01R1/073 , G01R31/28 , H01L21/66 , H02K41/03 , G01R31/22
CPC分类号： G01R1/06705
摘要： Disclosed is a Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging, as well as high in efficiency. The actuator assembly comprises a frame, and at least one pair of spaced apart, laterally extending, conductor carrying, flexible beams attached to the frame. A non-magnetic armature, substantially U-shaped in cross section, is attached adjacent or approximate the extended terminal ends of the beams, and a probe is attached to the base of the "U" of the armature for contacting selected points in the electrical circuit associated with the device being tested. The heart of the actuator includes a coil mounted on the upstanding legs of the U-shaped armature and arranged so that the axis of the coil is perpendicular to the base of the armature but substantially parallel to the probe tip. This arrangement places the `motor` portion of the actuator adjacent the probe and permits accurate and repeatable, fast control of not only probe tip position but probe tip movement. To complete the motor portion of the actuator, means, carried by the frame create a magnetic field across the coil, whereby upon energization of the coil, deflection of the armature (and thus the beams) occurs, effecting movement of the prob into contact with selected portions of the device being tested.
摘要翻译：公开了一种探头定位致动器，其成本和质量低，能够具有高加速度，相对长的行程和紧凑的包装以及高的效率。致动器组件包括框架，以及连接到框架的至少一对间隔开的横向延伸的导体承载的柔性梁。基本上U形的横截面的非磁性衔铁被安装在梁的延伸的末端附近或近似的位置，并且探头附接到电枢的“U”的底部，用于接触电气中的选定点与被测设备相关的电路。致动器的心脏包括安装在U形衔铁的直立腿上的线圈，并被布置成使得线圈的轴线垂直于电枢的基部，但基本上平行于探针尖端。这种布置使致动器的“电动机”部分邻近探头，并且允许精确和可重复地，快速地控制探针尖端位置，但是探针尖端运动。为了完成致动器的电动机部分，由框架承载的装置在线圈上产生磁场，由此在线圈通电时，发生电枢（以及因此的梁）的偏转，从而实现与该正在测试的设备的所选部分。

4. 发明授权

US5543726A Open frame gantry probing system 失效
标题翻译：开式龙门探测系统
公开(公告)号：US5543726A
公开(公告)日：1996-08-06
申请号：US176810
申请日：1994-01-03
申请人： James E. Boyette, Jr. , Jiann-Chang Lo , Michael Servedio
发明人： James E. Boyette, Jr. , Jiann-Chang Lo , Michael Servedio
IPC分类号： G01R31/28 , G01R1/06 , G01R1/073 , G01R31/02
CPC分类号： G01R1/07335
摘要： A system for probing both sides of a high density printed circuit board includes an open frame extending around the circuit board when it is held in a test position by a circuit board carrier. The frame includes two parallel rail structures extending above, and at opposite ends of, the circuit board in the test position. The frame also includes another two parallel rail structures extending below, and at opposite ends of, the circuit board. The upper and lower rail structures extend perpendicularly to one another, and are fastened together at the corners of the frame by means of compression bolt assemblies. Two gantry structures are moved in a first direction between the upper rail structures, while two other gantry structures are moved in a direction perpendicular to the first direction between the lower rail structures. A carriage moves along each gantry structure, and a probe is mounted on each carriage to be moved toward and away from the adjacent surface of the circuit board. The circuit board is moved by a board carrier between a position, outside the frame, in which it is loaded and unloaded, and the test position.
摘要翻译：用于探测高密度印刷电路板的两侧的系统包括当通过电路板载体保持在测试位置时围绕电路板延伸的开放框架。该框架包括在测试位置的电路板的上方和相对两端延伸的两个平行的轨道结构。框架还包括在电路板的下方和相对端延伸的另外两个平行的轨道结构。上下轨道结构彼此垂直延伸，并通过压缩螺栓组件在框架的角部处紧固在一起。两个龙门结构在上轨道结构之间沿第一方向移动，而两个其他机架结构在垂直于下轨道结构之间的第一方向的方向上移动。托架沿着每个机架结构移动，并且探针安装在每个托架上以朝向和远离电路板的相邻表面移动。电路板由板载体在框架外部位于其装载和卸载位置之间的位置和测试位置之间移动。

5. 发明授权

US5467020A Testing fixture and method for circuit traces on a flexible substrate 失效
标题翻译：测试柔性基板上电路迹线的夹具和方法
公开(公告)号：US5467020A
公开(公告)日：1995-11-14
申请号：US219610
申请日：1994-03-29
申请人： James E. Boyette, Jr. , James C. Mahlbacher
发明人： James E. Boyette, Jr. , James C. Mahlbacher
IPC分类号： G01R1/06 , G01R31/00 , G01R31/02 , G01R31/28 , H05K13/08
CPC分类号： G01R31/2805 , H05K13/08
摘要： A mechanism is provided for testing circuit traces extending along a flexible substrate, which is fed in a longitudinal direction between an upper plate and a lower plate. The upper plate includes a number of upper apertures extending across the flexible substrate and a number of upper segments, also extending across the flexible substrate, between adjacent apertures. The lower plate includes lower segments extending under the upper apertures and lower apertures extending under the upper segments. Two upper test probes are moved above the flexible substrate, while two lower test probes are moved under the flexible substrate. Tests are applied to both sides of the flexible substrate as the probes are brought into contact with test points in the areas accessible through the upper and lower apertures, with segments extending along the apertures on the opposite sides of the flexible substrate providing a backing surface for probe contact. A two-probe method may be used to determine the electrical characteristics of a circuit trace extending between test points, or a single-probe method may be used to determine the capacitance between a circuit trace and the plates. Circuit areas on the substrate are moved between the plates in a series of incremental motions to expose various points through the apertures as required to complete the testing process.
摘要翻译：提供了一种用于测试沿着柔性基板延伸的电路迹线的机构，该柔性基板在上板和下板之间沿纵向供给。上板包括跨越柔性基板延伸的多个上孔，以及在相邻孔之间延伸穿过柔性基底的多个上段。下板包括在上孔下方延伸的下段和在上段下延伸的下孔。两个上部测试探针移动到柔性基底上方，而两个下部测试探针在柔性基底下移动。当探针与通过上孔和下孔可接近的区域中的测试点接触时，将测试应用于柔性基底的两侧，其中沿着柔性基底的相对侧上的孔延伸以提供背衬表面探针接触。可以使用双探针法来确定在测试点之间延伸的电路迹线的电特性，或者可以使用单探针方法来确定电路迹线和板之间的电容。衬底上的电路区域以一系列递增运动在板之间移动，以便根据需要暴露各个点以完成测试过程。

6. 发明授权

US5598104A Breakaway test probe actuator used in a probing apparatus 失效
标题翻译：用于探测装置的分离式测试探头致动器
公开(公告)号：US5598104A
公开(公告)日：1997-01-28
申请号：US322813
申请日：1994-10-13
申请人： James E. Boyette, Jr.
发明人： James E. Boyette, Jr.
IPC分类号： G01R1/04 , G01R31/02
CPC分类号： G01R1/04
摘要： A probe positioning apparatus for use in a probe testing system is disclosed. The probe positioning apparatus includes a probe tip, a probe actuator connected to the probe tip, a probe plate coupled to the probe actuator and a magnetic probe plate clamp that magnetically couples the probe plate. The magnetic coupling forms a slip plane that provides collision compliance for the probe positioning apparatus. One embodiment of the magnetic probe clamp uses a set of shoulder screws to provide quick attachment and release of the probe plate from the probe clamp. A second embodiment uses a magnetic shunt to disable the magnetic connection of the clamp from the probe plate.
摘要翻译：公开了一种用于探针测试系统的探针定位装置。探针定位装置包括探针尖端，连接到探针尖端的探针致动器，耦合到探针致动器的探针板和磁性耦合探针板的磁性探针板夹。磁耦合形成一个滑动平面，为探针定位装置提供碰撞顺应性。磁探头夹具的一个实施例使用一组肩螺钉来提供探针板从探针夹具的快速附接和释放。第二实施例使用磁分路来禁止夹具与探针板的磁连接。

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