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    • 3. 发明授权
    • Miniature probe positioning actuator
    • 微型探头定位执行器
    • US5804982A
    • 1998-09-08
    • US451634
    • 1995-05-26
    • Jiann-Chang LoMichael ServedioJames Michael Hammond
    • Jiann-Chang LoMichael ServedioJames Michael Hammond
    • G01L1/00G01R1/06G01R1/067G01R31/28G05D3/00H01L21/66
    • G01R1/06705
    • Disclosed is a Mini Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging. The probe positioning actuator is composed of a pair of substantially parallel cantilevered beams, each beam being comprised of flexible, signal carrying cable formed of a polyimide composition which allows for the probe tip to be suspended from and form part of the armature of the actuator. The armature also includes a pair of oppositely wound coils intermediate the beams, which coils coact electromagnetically with a pair of spaced apart but fixedly positioned (relative to the coils/armature) magnets forming a motor for effecting armature and thus probe tip movement. The light mass of the coils and armature and the dual functional purpose of the suspension beams serves to make the probe actuator highly accurate and sensitive while allowing for reliable operation.
    • 公开了一种小型探头定位致动器,其成本和质量低,能够高加速度,相对较长的行程和紧凑的包装。 探针定位致动器由一对基本上平行的悬臂梁组成,每个梁由柔性的由聚酰亚胺组合物形成的信号承载电缆组成,其允许探针尖端悬挂在驱动器的电枢上并形成其一部分。 电枢还包括一对相对缠绕的线圈,该线圈在电磁线圈共同电磁地与一对间隔开但固定地定位(相对于线圈/电枢)磁体形成用于实现电枢并因此探测尖端运动的电动机。 线圈和电枢的轻质量以及悬挂梁的双重功能用于使探头致动器高度精确和灵敏,同时允许可靠的操作。
    • 5. 发明授权
    • Open frame gantry probing system
    • 开式龙门探测系统
    • US5543726A
    • 1996-08-06
    • US176810
    • 1994-01-03
    • James E. Boyette, Jr.Jiann-Chang LoMichael Servedio
    • James E. Boyette, Jr.Jiann-Chang LoMichael Servedio
    • G01R31/28G01R1/06G01R1/073G01R31/02
    • G01R1/07335
    • A system for probing both sides of a high density printed circuit board includes an open frame extending around the circuit board when it is held in a test position by a circuit board carrier. The frame includes two parallel rail structures extending above, and at opposite ends of, the circuit board in the test position. The frame also includes another two parallel rail structures extending below, and at opposite ends of, the circuit board. The upper and lower rail structures extend perpendicularly to one another, and are fastened together at the corners of the frame by means of compression bolt assemblies. Two gantry structures are moved in a first direction between the upper rail structures, while two other gantry structures are moved in a direction perpendicular to the first direction between the lower rail structures. A carriage moves along each gantry structure, and a probe is mounted on each carriage to be moved toward and away from the adjacent surface of the circuit board. The circuit board is moved by a board carrier between a position, outside the frame, in which it is loaded and unloaded, and the test position.
    • 用于探测高密度印刷电路板的两侧的系统包括当通过电路板载体保持在测试位置时围绕电路板延伸的开放框架。 该框架包括在测试位置的电路​​板的上方和相对两端延伸的两个平行的轨道结构。 框架还包括在电路板的下方和相对端延伸的另外两个平行的轨道结构。 上下轨道结构彼此垂直延伸,并通过压缩螺栓组件在框架的角部处紧固在一起。 两个龙门结构在上轨道结构之间沿第一方向移动,而两个其他机架结构在垂直于下轨道结构之间的第一方向的方向上移动。 托架沿着每个机架结构移动,并且探针安装在每个托架上以朝向和远离电路板的相邻表面移动。 电路板由板载体在框架外部位于其装载和卸载位置之间的位置和测试位置之间移动。
    • 6. 发明授权
    • Split-fixture configuration and method for testing circuit traces on a
flexible substrate
    • 分离夹具配置和在柔性基板上测试电路迹线的方法
    • US5461324A
    • 1995-10-24
    • US287313
    • 1994-08-08
    • James E. BoyetteChristopher M. FleckJames C. MahlbacherMichael Servedio
    • James E. BoyetteChristopher M. FleckJames C. MahlbacherMichael Servedio
    • G01R27/02G01R1/073G01R31/02G01R31/28H05K3/00
    • G01R1/07328
    • A fixture is provided for locating open conditions within circuits and short conditions between adjacent circuits on a flexible substrate having circuits extending along each side, as well as individual circuits extending along both sides. In one station of the fixture, the flexible circuit extends against a conductive backing plate, and conductivity measurements, to detect open conditions, are made between two probes moving among test points on the first side of the substrate, which is opposite the backing plate, and between one of these probes and the conductive backing plate. The latter type of measurement is used particularly to detect an open condition in a via extending through the substrate. In another station of the fixture, the first side of the flexible circuit extends against a conductive backing plate having an insulating sheet adjacent to the substrate, conductivity measurements, to detect open conditions, are made between two test probes moving along a side of the substrate opposite this insulated conductive backing plate, and capacitance measurements, to detect short circuit conditions, are made between one of these probes and the insulated conductive backing plate.
    • 提供了一种夹具,用于在柔性基板上的相邻电路之间的电路内和短路条件下定位开放状态,并具有沿着每一侧延伸的电路以及沿着两侧延伸的各个电路。 在固定装置的一个工位中,柔性电路相对于导电背板延伸,并且在两个探针之间进行电导率测量,以检测开放状态,这两个探头在与背板相对的基板的第一侧上的测试点之间移动, 并且在这些探针中的一个和导电背板之间。 后一类型的测量特别用于检测延伸穿过衬底的通孔中的开路状态。 在固定装置的另一工位中,柔性电路的第一侧相对于具有与衬底相邻的绝缘片的导电背板延伸,用于检测开放状态的电导率测量在沿衬底侧移动的两个测试探针之间进行 与该绝缘导电背板相反,并且在这些探针之一和绝缘导电背板之间进行电容测量以检测短路状况。
    • 7. 发明授权
    • Miniature probe positioning actuator
    • 微型探头定位执行器
    • US5635849A
    • 1997-06-03
    • US643523
    • 1996-05-06
    • Jiann-Chang LoMichael ServedioJames M. HammondJames E. Boyette, Jr.Hans-George H. Kolan
    • Jiann-Chang LoMichael ServedioJames M. HammondJames E. Boyette, Jr.Hans-George H. Kolan
    • G01R31/26G01R1/067G01R1/073G01R31/28H01L21/66H02K41/03G01R31/22
    • G01R1/06705
    • Disclosed is a Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging, as well as high in efficiency. The actuator assembly comprises a frame, and at least one pair of spaced apart, laterally extending, conductor carrying, flexible beams attached to the frame. A non-magnetic armature, substantially U-shaped in cross section, is attached adjacent or approximate the extended terminal ends of the beams, and a probe is attached to the base of the "U" of the armature for contacting selected points in the electrical circuit associated with the device being tested. The heart of the actuator includes a coil mounted on the upstanding legs of the U-shaped armature and arranged so that the axis of the coil is perpendicular to the base of the armature but substantially parallel to the probe tip. This arrangement places the `motor` portion of the actuator adjacent the probe and permits accurate and repeatable, fast control of not only probe tip position but probe tip movement. To complete the motor portion of the actuator, means, carried by the frame create a magnetic field across the coil, whereby upon energization of the coil, deflection of the armature (and thus the beams) occurs, effecting movement of the probe tip into contact with selected portions of the device being tested.
    • 公开了一种探头定位致动器,其成本和质量低,能够具有高加速度,相对长的行程和紧凑的包装以及高的效率。 致动器组件包括框架,以及连接到框架的至少一对间隔开的横向延伸的导体承载的柔性梁。 基本上U形的横截面的非磁性衔铁被安装在梁的延伸的末端附近或近似的位置,并且探头附接到电枢的“U”的底部,用于接触电气中的选定点 与被测设备相关的电路。 致动器的心脏包括安装在U形衔铁的直立腿上的线圈,并被布置成使得线圈的轴线垂直于电枢的基部,但基本上平行于探针尖端。 这种布置使致动器的“电动机”部分邻近探头,并且允许精确和可重复地,快速地控制探针尖端位置,但是探针尖端运动。 为了完成致动器的电动机部分,由框架承载的装置在线圈上产生磁场,由此在线圈通电时,发生电枢(以及因此的梁)的偏转,使探针尖端移动到接触 该设备的选定部分被测试。
    • 9. 发明授权
    • High speed test probe positioning system
    • 高速测试探头定位系统
    • US5550483A
    • 1996-08-27
    • US342433
    • 1994-11-18
    • James E. Boyette, Jr.James M. HammondJiann-Chang LoJames C. MahlbacherMichael ServedioAli R. Taheri
    • James E. Boyette, Jr.James M. HammondJiann-Chang LoJames C. MahlbacherMichael ServedioAli R. Taheri
    • G01R1/067G01R31/02
    • G01R1/06705
    • Probing system performance is improved by dynamically positioning a test probe at a test site during the gantry settling interval using a high performance secondary positioner to compensate for the inherent moving mass oscillational displacements. A primary positioner positions the gantry and its associated test probe to within a predetermined axis distance of the test site and a secondary positioner dynamically maintains the test probe at a target position corresponding to the test site during the settling interval by imparting compensating displacements to the test probe to counteract the displacement errors incurred as the primary positioner attempts to settle the gantry at the test site. Similarly, automatic machine tool performance is improved by dynamically positioning a work tool at a work site during the gantry settling interval using a high performance secondary positioner to compensate for the inherent moving mass oscillational displacements. A primary positioner positions the gantry and its associated work tool to within a predetermined axis distance of the work site and a secondary positioner dynamically maintains the work tool at a target position corresponding to the work site during the settling interval by imparting compensating displacements to the work tool to counteract the displacement errors incurred as the primary positioner attempts to settle the gantry at the work site.
    • 通过使用高性能辅助定位器在机架沉降间隔期间在测试位置处动态定位测试探头来补偿固有的移动质量振荡位移,来提高系统性能。 主要定位器将机架及其相关联的测试探针定位在测试位置的预定轴距离内,并且辅助定位器通过赋予测试的补偿位移在静止间隔期间将测试探针动态地维持在对应于测试位置的目标位置 探测器可以抵消由于主要定位器试图在测试现场安装龙门架时发生的位移误差。 类似地,通过使用高性能二次定位器在机架沉降间隔期间通过在工作现场的动态定位工作工具来补偿固有的移动质量振荡位移,从而提高了自动机床性能。 主要定位器将机架及其相关联的工作工具定位在工作现场的预定轴距离内,并且辅助定位器通过向工件施加补偿位移来将工作工具在对应于工作现场的目标位置处动态地维持在工作位置 作为主要定位者试图在工地上定位龙门架时发生的位移错误的工具。
    • 10. 发明授权
    • Miniature probe positioning actuator
    • 微型探头定位执行器
    • US5532611A
    • 1996-07-02
    • US451635
    • 1995-05-26
    • Jiann-Chang LoMichael ServedioJames M. HammondJames E. Boyette, Jr.Hans-George H. Kolan
    • Jiann-Chang LoMichael ServedioJames M. HammondJames E. Boyette, Jr.Hans-George H. Kolan
    • G01R31/26G01R1/067G01R1/073G01R31/28H01L21/66H02K41/03G01R31/22
    • G01R1/06705
    • Disclosed is a Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging, as well as high in efficiency. The actuator assembly comprises a frame, and at least one pair of spaced apart, laterally extending, conductor carrying, flexible beams attached to the frame. A non-magnetic armature, substantially U-shaped in cross section, is attached adjacent or approximate the extended terminal ends of the beams, and a probe is attached to the base of the "U" of the armature for contacting selected points in the electrical circuit associated with the device being tested. The heart of the actuator includes a coil mounted on the upstanding legs of the U-shaped armature and arranged so that the axis of the coil is perpendicular to the base of the armature but substantially parallel to the probe tip. This arrangement places the `motor` portion of the actuator adjacent the probe and permits accurate and repeatable, fast control of not only probe tip position but probe tip movement. To complete the motor portion of the actuator, means, carried by the frame create a magnetic field across the coil, whereby upon energization of the coil, deflection of the armature (and thus the beams) occurs, effecting movement of the prob into contact with selected portions of the device being tested.
    • 公开了一种探头定位致动器,其成本和质量低,能够具有高加速度,相对长的行程和紧凑的包装以及高的效率。 致动器组件包括框架,以及连接到框架的至少一对间隔开的横向延伸的导体承载的柔性梁。 基本上U形的横截面的非磁性衔铁被安装在梁的延伸的末端附近或近似的位置,并且探头附接到电枢的“U”的底部,用于接触电气中的选定点 与被测设备相关的电路。 致动器的心脏包括安装在U形衔铁的直立腿上的线圈,并被布置成使得线圈的轴线垂直于电枢的基部,但基本上平行于探针尖端。 这种布置使致动器的“电动机”部分邻近探头,并且允许精确和可重复地,快速地控制探针尖端位置,但是探针尖端运动。 为了完成致动器的电动机部分,由框架承载的装置在线圈上产生磁场,由此在线圈通电时,发生电枢(以及因此的梁)的偏转,从而实现与该 正在测试的设备的所选部分。