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    • 7. 发明授权
    • Wavelength selective detector
    • 波长选择检测器
    • US06693311B2
    • 2004-02-17
    • US10162928
    • 2002-06-04
    • James K. GuenterRalph H. Johnson
    • James K. GuenterRalph H. Johnson
    • H01L310328
    • H01L31/101H01L31/02161H01L31/02164
    • A wavelength selective detector having a first absorbing layer for absorbing light with a wavelength below a lower band cutoff, a second absorbing layer downstream of the first absorbing layer for absorbing light with a wavelength below an upper band cutoff, and a confinement layer situated between the first and second absorbing layers. The lower and upper band cutoffs can be set by controlling the bandgaps and/or thicknesses of the first and second absorbing layers. The wavelength selective detector of the present invention has a good out-of-band rejection, a narrow spectral responsivity, and a high in-band responsivity. In addition, the wavelength selective detector is relatively easy to manufacture using conventional integrated circuit fabrication techniques.
    • 一种波长选择性检测器,具有用于吸收波长低于低频带截止的波长的第一吸收层,在第一吸收层下游的第二吸收层,用于吸收波长低于上带截止的波长的光,以及位于第二吸收层之间的限制层 第一和第二吸收层。 可以通过控制第一和第二吸收层的带隙和/或厚度来设定下限和上限截止值。 本发明的波长选择性检测器具有良好的带外抑制,窄的光谱响应度和高的带内响应性。 此外,使用传统的集成电路制造技术,波长选择检测器相对容易制造。
    • 10. 发明授权
    • Distributed bragg reflector for optoelectronic device
    • 光电器件分布式布拉格反射器
    • US06990135B2
    • 2006-01-24
    • US10283381
    • 2002-10-28
    • Ralph H. JohnsonKlein L. JohnsonJimmy A. TatumJames K. GuenterJames R. BiardRobert A. Hawthorne, III
    • Ralph H. JohnsonKlein L. JohnsonJimmy A. TatumJames K. GuenterJames R. BiardRobert A. Hawthorne, III
    • H01S5/00
    • H01S5/423H01S5/18308H01S5/18313H01S5/18333H01S5/18338H01S5/2063H01S5/3054H01S5/3211
    • An oxide-confined VCSELs having a distributed Bragg reflector with a heavily doped high Al content oxide aperture forming layer disposed between a low Al content first layer and a medium Al content second layer. Between the first layer and the oxide aperture forming layer there may be a thin transition region wherein the Al content changes from a higher Al content to a lower Al content. In some embodiments, the Al concentration from the oxide aperture forming layer to the second layer may occur in a step. The oxide aperture forming layer may be disposed at or near a null or a node of the electric field produced by resonant laser light. During the oxidization of the oxide aperture forming layer, all or some of the other aluminum bearing DBR layers may also become oxidized, but to a substantially lesser degree. The junction between the oxidized portion and un-oxidized portion of these layers is believed to reduce the stability and/or reliability of the device. To alleviate this, the present invention contemplates providing an implant, etch or other suitable process to reduce or eliminate one or more electrical artifacts associated with the junction between the oxidized portion and un-oxidized portion of these layers as well as reducing the oxidation of other aluminum bearing layers of the DBR.
    • 具有分布布拉格反射器的氧化物限制性VCSEL,其具有设置在低Al含量第一层和介质Al含量第二层之间的重掺杂高Al含量氧化物孔形成层。 在第一层和氧化物孔形成层之间可能存在其中Al含量从较高Al含量变为较低Al含量的薄过渡区。 在一些实施方案中,从氧化物孔形成层到第二层的Al浓度可以在一个步骤中发生。 氧化物孔形成层可以设置在由共振激光产生的电场的零点或节点附近或附近。 在氧化物孔形成层的氧化过程中,其它所有的一部分的含铝DBR层也可能被氧化,但是其程度基本较小。 认为这些层的氧化部分和未氧化部分之间的连接点降低了装置的稳定性和/或可靠性。 为了减轻这一点,本发明设想提供一种植入物,蚀刻或其它合适的方法,以减少或消除与这些层的氧化部分和未氧化部分之间的接合相关联的一个或多个电赝象以及减少其它的氧化部分 铝合金轴承层的DBR。