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    • 1. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US08724409B2
    • 2014-05-13
    • US12947441
    • 2010-11-16
    • Kang Seol LeeJae Hyuk Im
    • Kang Seol LeeJae Hyuk Im
    • G11C7/00G11C29/00G05F3/16G05F3/20
    • H03K19/00384
    • A semiconductor integrated circuit includes an internal reference voltage generation unit configured to generate an internal reference voltage; a high voltage generation unit configured to pump an external driving voltage based on the internal reference voltage applied from the internal reference voltage generation unit, and generate a high voltage having a specified level; and a reference voltage transfer unit configured to generate a test reference voltage from a reference voltage in a package test mode to correspond to a change in a driving operation of the external driving voltage applied from outside, and monitor and force the internal reference voltage.
    • 半导体集成电路包括:内部参考电压生成单元,被配置为产生内部参考电压; 高电压产生单元,被配置为基于从内部参考电压产生单元施加的内部参考电压来泵浦外部驱动电压,并产生具有指定电平的高电压; 以及参考电压传送单元,被配置为在封装测试模式下从参考电压产生测试参考电压,以对应于从外部施加的外部驱动电压的驱动操作的变化,并监视和强制内部参考电压。
    • 5. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • 半导体集成电路
    • US20110291639A1
    • 2011-12-01
    • US12947441
    • 2010-11-16
    • Kang Seol LEEJae Hyuk Im
    • Kang Seol LEEJae Hyuk Im
    • G05F3/16
    • H03K19/00384
    • A semiconductor integrated circuit includes an internal reference voltage generation unit configured to generate an internal reference voltage; a high voltage generation unit configured to pump an external driving voltage based on the internal reference voltage applied from the internal reference voltage generation unit, and generate a high voltage having a specified level; and a reference voltage transfer unit configured to generate a test reference voltage from a reference voltage in a package test mode to correspond to a change in a driving operation of the external driving voltage applied from outside, and monitor and force the internal reference voltage.
    • 半导体集成电路包括:内部参考电压生成单元,被配置为产生内部参考电压; 高电压产生单元,被配置为基于从内部参考电压产生单元施加的内部参考电压来泵浦外部驱动电压,并产生具有指定电平的高电压; 以及参考电压传送单元,被配置为在封装测试模式下从参考电压产生测试参考电压,以对应于从外部施加的外部驱动电压的驱动操作的变化,并监视和强制内部参考电压。
    • 6. 发明申请
    • REDUNDANCY CIRCUIT
    • 冗余电路
    • US20080304341A1
    • 2008-12-11
    • US11958320
    • 2007-12-17
    • Jae Hyuk ImYong Ju Chon
    • Jae Hyuk ImYong Ju Chon
    • G11C7/00
    • G11C29/785G11C2229/763G11C2229/766
    • A redundancy circuit can include a first fuse set that is configured to receive an address signal and an initializing signal activated when power is up, and to output a first redundancy signal, the first redundancy signal being used to repair a defective cell by using a laser beam radiating method, a second fuse set that is configured to receive the initializing signal, a specific address signal, a test mode signal that is activated when a defective cell exists, and the address signal, and to output a second redundancy signal, the second redundancy signal being used to repair the defective cell by using an electrical fusing method, a first memory cell array that is controlled by the first redundancy signal, and a second memory cell array that is controlled by the second redundancy signal.
    • 冗余电路可以包括:第一熔丝组,其被配置为接收地址信号;以及在上电时激活的初始化信号;以及输出第一冗余信号,所述第一冗余信号用于通过使用激光器来修复有缺陷的单元 波束辐射方法,被配置为接收初始化信号的第二熔丝组,特定地址信号,当存在缺陷单元时被激活的测试模式信号和地址信号,并输出第二冗余信号,第二熔丝组 冗余信号用于通过使用电熔接方法修复故障单元,由第一冗余信号控制的第一存储单元阵列和由第二冗余信号控制的第二存储单元阵列。
    • 7. 发明授权
    • Internal voltage generators for semiconductor memory device
    • 用于半导体存储器件的内部电压发生器
    • US07468628B2
    • 2008-12-23
    • US11623396
    • 2007-01-16
    • Jae Hyuk ImJae Jin Lee
    • Jae Hyuk ImJae Jin Lee
    • G05F1/00H03B5/24
    • H02M3/073H02M2001/0041
    • An internal voltage generator capable of reducing the variation width in the level of an internal voltage VPP, by performing charge pumping only a predetermined number of times in a period where an oscillator driving signal is at a logic HIGH level, and then stopping the charge pumping operation. The oscillator controller generates an oscillation control signal for stopping an oscillation operation of a ring oscillator by using an output signal of a level detector and an output signal of the ring oscillator. The ring oscillator does not generate an oscillation signal at a predetermined time point where an output signal of the level detector is at a HIGH level in response to the oscillation control signal. The charge pump circuit generates an internal voltage by performing a charge pumping operation only predetermined times in response to the oscillation signal, and then stopping the charge pumping operation.
    • 内部电压发生器能够通过在振荡器驱动信号处于逻辑高电平的时段内仅进行预定次数的电荷泵浦来减小内部电压VPP的电平的变化宽度,然后停止电荷泵送 操作。 振荡器控制器通过使用电平检测器的输出信号和环形振荡器的输出信号产生用于停止环形振荡器的振荡操作的振荡控制信号。 响应于振荡控制信号,在电平检测器的输出信号处于高电平的预定时间点,环形振荡器不产生振荡信号。 电荷泵电路通过响应于振荡信号仅进行预定次数的电荷泵送操作来产生内部电压,然后停止电荷泵送操作。