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    • 6. 发明申请
    • Voltage Controlled Oscillation Circuit
    • 电压控制振荡电路
    • US20080136539A1
    • 2008-06-12
    • US11885410
    • 2007-03-12
    • Takashi OkaSeiji Watanabe
    • Takashi OkaSeiji Watanabe
    • H03K3/03
    • H03K3/0315H03L7/0995
    • In a voltage controlled oscillation circuit including a cascade connection of a voltage-to-current conversion circuit (310) for generating an input voltage converted current which is a current corresponding to an input voltage and a current controlled oscillation circuit (120) of which an oscillation frequency varies according to the input voltage converted current, the voltage-to-current conversion circuit (310) includes a first current source for outputting a current in proportion to the input voltage and a plurality of second current sources for outputting a current in proportion to a voltage obtained by shifting the input voltage. Then, a current obtained by adding a current output from the first current source and currents output from the plurality of current sources is output as the input voltage converted current to the current controlled oscillation circuit (120).
    • 在包括用于产生作为与输入电压对应的电流的输入电压转换电流的电压 - 电流转换电路(310)的级联连接的电压控制振荡电路和电流控制振荡电路(120)中, 振荡频率根据输入电压转换电流而变化,电压 - 电流转换电路(310)包括用于输出与输入电压成比例的电流的第一电流源和用于按比例输出电流的多个第二电流源 达到通过移位输入电压而获得的电压。 然后,将从第一电流源输出的电流和从多个电流源输出的电流相加得到的电流作为输入电压转换电流被输出到电流控制振荡电路(120)。
    • 7. 发明申请
    • Semiconductor Integrated Circuit Having Jitter Measuring Function
    • 具有抖动测量功能的半导体集成电路
    • US20080129562A1
    • 2008-06-05
    • US11661404
    • 2005-04-13
    • Keisuke NakahiraSeiji WatanabeTetsuo ArakawaAkifumi TakeyaTakashi Oka
    • Keisuke NakahiraSeiji WatanabeTetsuo ArakawaAkifumi TakeyaTakashi Oka
    • H03M1/06
    • G11B7/005G01R31/31709G11B7/22G11B20/10009G11B20/10027G11B20/10203G11B20/24
    • A semiconductor integrated circuit having jitter measuring function includes a slicer (11), a T/V converter (12), an A/D converter (13), a processor (14), a multiplexer (15), and a correction section (16). The slicer (11) binarizes an input signal to generate a data signal. The T/V converter (12) outputs a voltage corresponding to the data length of an input signal. The multiplexer (15) selects the data signal or a reference signal as the input signal to the T/V converter (12). The A/D converter (13) converts the output voltage of the TN converter (12) to digital data. The processor (14) measures jitter in the input signal to the T/V converter (12) in accordance with the digital data. The correction section (16) compares the output voltage of the T/V converter (12) produced where the reference signal has been selected by the multiplexer (15) with a predetermined voltage, and corrects the output characteristics of the T/V converter (12) according to the comparison results.
    • 具有抖动测量功能的半导体集成电路包括限幅器(11),T / V转换器(12),A / D转换器(13),处理器(14),多路复用器(15)和校正部分 16)。 限幅器(11)对输入信号进行二值化以产生数据信号。 T / V转换器(12)输出与输入信号的数据长度对应的电压。 多路复用器(15)选择数据信号或参考信号作为到T / V转换器(12)的输入信号。 A / D转换器(13)将TN转换器(12)的输出电压转换成数字数据。 处理器(14)根据数字数据测量到T / V转换器(12)的输入信号的抖动。 校正部分(16)将由多路复用器(15)选择的参考信号所产生的T / V转换器(12)的输出电压与预定电压进行比较,并校正T / V转换器的输出特性( 12)根据比较结果。