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    • 1. 发明申请
    • Semiconductor Integrated Circuit Having Jitter Measuring Function
    • 具有抖动测量功能的半导体集成电路
    • US20080129562A1
    • 2008-06-05
    • US11661404
    • 2005-04-13
    • Keisuke NakahiraSeiji WatanabeTetsuo ArakawaAkifumi TakeyaTakashi Oka
    • Keisuke NakahiraSeiji WatanabeTetsuo ArakawaAkifumi TakeyaTakashi Oka
    • H03M1/06
    • G11B7/005G01R31/31709G11B7/22G11B20/10009G11B20/10027G11B20/10203G11B20/24
    • A semiconductor integrated circuit having jitter measuring function includes a slicer (11), a T/V converter (12), an A/D converter (13), a processor (14), a multiplexer (15), and a correction section (16). The slicer (11) binarizes an input signal to generate a data signal. The T/V converter (12) outputs a voltage corresponding to the data length of an input signal. The multiplexer (15) selects the data signal or a reference signal as the input signal to the T/V converter (12). The A/D converter (13) converts the output voltage of the TN converter (12) to digital data. The processor (14) measures jitter in the input signal to the T/V converter (12) in accordance with the digital data. The correction section (16) compares the output voltage of the T/V converter (12) produced where the reference signal has been selected by the multiplexer (15) with a predetermined voltage, and corrects the output characteristics of the T/V converter (12) according to the comparison results.
    • 具有抖动测量功能的半导体集成电路包括限幅器(11),T / V转换器(12),A / D转换器(13),处理器(14),多路复用器(15)和校正部分 16)。 限幅器(11)对输入信号进行二值化以产生数据信号。 T / V转换器(12)输出与输入信号的数据长度对应的电压。 多路复用器(15)选择数据信号或参考信号作为到T / V转换器(12)的输入信号。 A / D转换器(13)将TN转换器(12)的输出电压转换成数字数据。 处理器(14)根据数字数据测量到T / V转换器(12)的输入信号的抖动。 校正部分(16)将由多路复用器(15)选择的参考信号所产生的T / V转换器(12)的输出电压与预定电压进行比较,并校正T / V转换器的输出特性( 12)根据比较结果。