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1. 发明授权

US07214910B2 On-chip power supply regulator and temperature control system 失效
标题翻译：片上电源调节器和温度控制系统
公开(公告)号：US07214910B2
公开(公告)日：2007-05-08
申请号：US10884933
申请日：2004-07-06
申请人： Howard Hao Chen , William J. Ferrante , Louis L. Hsu , Carl J. Radens
发明人： Howard Hao Chen , William J. Ferrante , Louis L. Hsu , Carl J. Radens
IPC分类号： H05B1/02
CPC分类号： G05D23/20 , G05D23/1931 , Y10T307/469
摘要： An on-chip temperature control system includes a temperature sensor, which monitors a temperature of a chip, and a hysteresis comparator which checks whether the temperature is in an acceptable range. A reference adjustment circuit is responsive to the hysteresis comparator to adjust an on-chip voltage to control the temperature locally by adjusting a local supply voltage, if the temperature is out of range.
摘要翻译：片上温度控制系统包括监测芯片温度的温度传感器和检查温度是否在可接受范围内的滞后比较器。如果温度超出范围，参考调节电路响应于迟滞比较器来调节片上电压以局部地调节局部电源电压来控制温度。

2. 发明授权

US07312529B2 Structure and method for producing multiple size interconnections 有权
标题翻译：用于生产多尺寸互连的结构和方法
公开(公告)号：US07312529B2
公开(公告)日：2007-12-25
申请号：US11160669
申请日：2005-07-05
申请人： Lawrence Clevenger , Mukta G. Farooq , Louis L. Hsu , William F. Landers , Donna S. Zupanski-Nielsen , Carl J. Radens , Chih-Chao Yang
发明人： Lawrence Clevenger , Mukta G. Farooq , Louis L. Hsu , William F. Landers , Donna S. Zupanski-Nielsen , Carl J. Radens , Chih-Chao Yang
IPC分类号： H01L23/48 , H01L23/52 , H01L23/40
CPC分类号： H05K3/3436 , H01L23/13 , H01L23/49811 , H01L23/49816 , H01L23/49838 , H01L24/11 , H01L24/12 , H01L24/17 , H01L24/49 , H01L24/73 , H01L24/81 , H01L2224/0401 , H01L2224/0603 , H01L2224/06102 , H01L2224/13099 , H01L2224/131 , H01L2224/13111 , H01L2224/1403 , H01L2224/49109 , H01L2224/81801 , H01L2924/00013 , H01L2924/00014 , H01L2924/01006 , H01L2924/01029 , H01L2924/01047 , H01L2924/0105 , H01L2924/01082 , H01L2924/01322 , H01L2924/014 , H05K2201/094 , H05K2201/09736 , H05K2201/09845 , Y02P70/613 , H01L2224/29099 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要： An electrical structure and method comprising a first substrate electrically and mechanically connected to a second substrate. The first substrate comprises a first electrically conductive pad and a second electrically conductive pad. The second substrate comprises a third electrically conductive pad, a fourth electrically conductive pad, and a first electrically conductive member. The fourth electrically conductive pad comprises a height that is different than a height of the first electrically conductive member. The electrically conductive member is electrically and mechanically connected to the fourth electrically conductive pad. A first solder ball connects the first electrically conductive pad to the third electrically conductive pad. The first solder ball comprises a first diameter. A second solder ball connects the second electrically conductive pad to the first electrically conductive member. The second solder ball comprises a second diameter. The first diameter is greater than said second diameter.
摘要翻译：一种电结构和方法，包括电和机械地连接到第二衬底的第一衬底。第一基板包括第一导电焊盘和第二导电焊盘。第二基板包括第三导电焊盘，第四导电焊盘和第一导电部件。第四导电焊盘包括与第一导电构件的高度不同的高度。导电构件电连接和机械地连接到第四导电垫。第一焊球将第一导电焊盘连接到第三导电焊盘。第一焊球包括第一直径。第二焊球将第二导电焊盘连接到第一导电构件。第二焊球包括第二直径。第一直径大于所述第二直径。

3. 发明授权

US07138685B2 Vertical MOSFET SRAM cell 失效
标题翻译：垂直MOSFET SRAM单元
公开(公告)号：US07138685B2
公开(公告)日：2006-11-21
申请号：US10318495
申请日：2002-12-11
申请人： Louis L. Hsu , Oleg Gluschenkov , Jack A. Mandelman , Carl J. Radens
发明人： Louis L. Hsu , Oleg Gluschenkov , Jack A. Mandelman , Carl J. Radens
IPC分类号： H01L21/00
CPC分类号： H01L27/11 , G11C11/412 , H01L21/84 , H01L27/1104 , H01L27/1203
摘要： A method of forming an SRAM cell device includes the following steps. Form pass gate FET transistors and form a pair of vertical pull-down FET transistors with a first common body and a first common source in a silicon layer patterned into parallel islands formed on a planar insulator. Etch down through upper diffusions between cross-coupled inverter FET transistors to form pull-down isolation spaces bisecting the upper strata of pull-up and pull-down drain regions of the pair of vertical pull-down FET transistors, with the isolation spaces reaching down to the common body strata. Form a pair of vertical pull-up FET transistors with a second common body and a second common drain. Then, connect the FET transistors to form an SRAM cell.
摘要翻译：形成SRAM单元装置的方法包括以下步骤。形成栅极FET晶体管并形成一对垂直下拉FET晶体管，其具有第一共同体和第一公共源，图案化为平坦绝缘体上形成平行岛的硅层。通过交叉耦合的反相器FET晶体管之间的上扩散来蚀刻，以形成将一对垂直下拉FET晶体管的上拉和下拉漏极区的上层平分的下拉隔离空间，隔离空间达到到共同的身体层。形成一对具有第二共同体和第二公共漏极的垂直上拉FET晶体管。然后，连接FET晶体管以形成SRAM单元。

4. 发明授权

US07041525B2 Three-dimensional island pixel photo-sensor 有权
公开(公告)号：US07041525B2
公开(公告)日：2006-05-09
申请号：US10751205
申请日：2004-01-02
申请人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Li-Kong Wang , Kwong Hon Wong
发明人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Li-Kong Wang , Kwong Hon Wong
IPC分类号： H01L21/66 , H01L21/00
CPC分类号： H01L27/14634 , H01L27/1463 , H01L27/14643
摘要： A method and structure for a photodiode array comprising a plurality of photodiode cores, light sensing sidewalls along an exterior of the cores, logic circuitry above the cores, trenches separating the cores, and a transparent material in the trenches is disclosed. With the invention, the sidewalls are perpendicular to the surface of the photodiode that receives incident light. The light sensing sidewalls comprise a junction region that causes electron transfer when struck with light. The sidewalls comprise four vertical sidewalls around each island core. The logic circuitry blocks light from the core so light is primarily only sensed by the sidewalls.

5. 发明授权

US06355531B1 Method for fabricating semiconductor devices with different properties using maskless process 失效
标题翻译：使用无掩模工艺制造具有不同特性的半导体器件的方法
公开(公告)号：US06355531B1
公开(公告)日：2002-03-12
申请号：US09634225
申请日：2000-08-09
申请人： Jack A. Mandelman , Louis L. Hsu , Carl J. Radens , William R. Tonti , Li-Kong Wang
发明人： Jack A. Mandelman , Louis L. Hsu , Carl J. Radens , William R. Tonti , Li-Kong Wang
IPC分类号： H01L218236
CPC分类号： H01L21/823892 , H01L21/823807 , H01L21/82385 , Y10S438/981
摘要： A method is provided for fabricating semiconductor devices having different properties on a common semiconductor substrate. The method includes the steps of (a) forming N openings on the semiconductor substrate, wherein each opening is corresponding to a channel region of each semiconductor device, (b) forming oxide layers of an ith type on surfaces of the N openings, (c) depositing gate conductor material of an ith type over structure of the semiconductor devices, the gate conductor material of the ith type having a gate conductor work-function of an ith type, (d) removing the gate conductor material of the ith type such that a predetermined amount of the gate conductor material of the ith type remains in an ith opening to form a gate conductor material layer of the ith type on top surface in the ith opening and the gate conductor material of the ith type deposited in the structure other than the ith opening is removed, (e) removing the oxide layers of the ith type from openings other than the ith opening, (f) repeating the steps of (a) through (e) from “i=1” to “i=N”, and (g) forming at least one layer on surface of each of N gate conductor material layers in the N openings to form a gate conductor, whereby the N semiconductor devices have N gate conductors, respectively, wherein the N gate conductors have N types of gate conductor work-functions. The semiconductor devices also have channel regions of which doping levels are different from each other by implanting the channel regions with different types of implants.
摘要翻译：提供了一种在公共半导体衬底上制造具有不同特性的半导体器件的方法。该方法包括以下步骤：（a）在半导体衬底上形成N个开口，其中每个开口对应于每个半导体器件的沟道区，（b）在N个开口的表面上形成第i个类型的氧化物层，（c ）沉积所述半导体器件的第i型结构的栅极导体材料，所述第i型栅极导体材料具有第i类型的栅极导体功函数，（d）去除所述第i种类型的栅极导体材料，使得第i个类型的栅极导体材料的预定量保持在第i个开口中，以在第i个开口的顶表面上形成第i型的栅极导体材料层，并且沉积在除第除去第i个开口，（e）从第i个开口以外的开口除去第i个类型的氧化物层，（f）重复步骤（a）至（e）从“i = 1”到“i = N “，（g）在其上形成至少一层在N个开口中的N个栅极导体材料层中的每一个的表面形成栅极导体，由此N个半导体器件分别具有N个栅极导体，其中N个栅极导体具有N种类型的栅极导体功函数。半导体器件还具有通过用不同类型的植入物植入沟道区域而使掺杂水平彼此不同的沟道区域。

6. 发明授权

US06933189B2 Integration system via metal oxide conversion 失效
标题翻译：集成系统通过金属氧化物转换
公开(公告)号：US06933189B2
公开(公告)日：2005-08-23
申请号：US10870382
申请日：2004-06-16
申请人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Joseph F. Shepard, Jr.
发明人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Joseph F. Shepard, Jr.
IPC分类号： H01L21/285 , H01L21/30 , H01L21/306 , H01L21/3205 , H01L21/336 , H01L21/768 , H01L21/8232 , H01L21/8234 , H01L29/49 , H01L29/76 , H01L29/78 , H01L29/84 , H01L31/062 , H01L31/107 , H01L31/113 , H01L31/119
CPC分类号： H01L29/4983 , H01L21/28194 , H01L21/28518 , H01L21/28568 , H01L21/3003 , H01L21/76823 , H01L21/76895 , H01L29/517 , H01L29/7833
摘要： A method and structure for a transistor device comprises forming a source, drain, and trench region in a substrate, forming a first insulator over the substrate, forming a gate electrode above the first insulator, forming a pair of insulating spacers adjoining the electrode, converting a portion of the first insulator into a metallic film, converting the metallic film into one of a silicide and a salicide film, forming an interconnect region above the trench region, forming an etch stop layer above the first insulator, the trench region, the gate electrode, and the pair of insulating spacers, forming a second insulator above the etch stop layer, and forming contacts in the second insulator. The first insulator comprises a metal oxide material, which comprises one of a HfOx and a ZrOx.
摘要翻译：晶体管器件的方法和结构包括在衬底中形成源极，漏极和沟槽区域，在衬底上形成第一绝缘体，在第一绝缘体之上形成栅电极，形成邻接电极的一对绝缘衬垫，转换将所述第一绝缘体的一部分转变为金属膜，将所述金属膜转化成硅化物和自对隔硅膜之一，在所述沟槽区上方形成互连区，在所述第一绝缘体上方形成蚀刻停止层，所述沟槽区，所述栅电极和一对绝缘间隔物，在蚀刻停止层上方形成第二绝缘体，并在第二绝缘体中形成接触。第一绝缘体包括金属氧化物材料，其包括HfO x x和ZrO x x之一。

7. 发明授权

US07112502B2 Method to fabricate passive components using conductive polymer 有权
公开(公告)号：US07112502B2
公开(公告)日：2006-09-26
申请号：US10828374
申请日：2004-04-20
申请人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Li-Kong Wang , Kwong Hon Wong
发明人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Li-Kong Wang , Kwong Hon Wong
IPC分类号： H01L21/20
CPC分类号： H01C7/005 , H01C7/006 , H01C17/075 , H01G4/18 , H01G4/33 , H01L23/5223 , H01L23/5227 , H01L23/5228 , H01L23/5328 , H01L27/0688 , H01L2924/0002 , H01L2924/00
摘要： A method and structure for an integrated circuit chip has a logic core which includes a plurality of insulating and conducting levels, an exterior conductor level and passive devices having a conductive polymer directly connected to the exterior conductor level. The passive devices contain RF devices which also includes resistor, capacitor, and/or inductor. The resistors can be serpentine resistors and the capacitors can be interdigitated capacitors.

8. 发明授权

US07087948B2 Forming electronic structures having dual dielectric thicknesses and the structure so formed 失效
公开(公告)号：US07087948B2
公开(公告)日：2006-08-08
申请号：US10995444
申请日：2004-11-23
申请人： Louis L. Hsu , Jack A. Mandelman , Carl J. Radens , Richard A. Strub , William R. Tonti
发明人： Louis L. Hsu , Jack A. Mandelman , Carl J. Radens , Richard A. Strub , William R. Tonti
IPC分类号： H01L27/108 , H01L29/76 , H01L29/94 , H01L31/119
CPC分类号： H01L29/66181 , H01L21/823462 , H01L27/10861 , H01L27/10894 , H01L29/945
摘要： A structure including a first device and a second device, wherein the second device has a dielectric thickness greater than the dielectric thickness of the first device, and the method of so forming the structure.

9. 发明授权

US06958522B2 Method to fabricate passive components using conductive polymer 有权
标题翻译：使用导电聚合物制造无源元件的方法
公开(公告)号：US06958522B2
公开(公告)日：2005-10-25
申请号：US09897891
申请日：2001-07-05
申请人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Li-Kong Wang , Kwong Hon Wong
发明人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Li-Kong Wang , Kwong Hon Wong
IPC分类号： H01L27/06 , H01L29/00 , H01L29/94 , H01L31/062 , H01L31/113 , H01L31/119
CPC分类号： H01C7/005 , H01C7/006 , H01C17/075 , H01G4/18 , H01G4/33 , H01L23/5223 , H01L23/5227 , H01L23/5228 , H01L23/5328 , H01L27/0688 , H01L2924/0002 , H01L2924/00
摘要： A method and structure for an integrated circuit chip has a logic core which includes a plurality of insulating and conducting levels, an exterior conductor level and passive devices having a conductive polymer directly connected to the exterior conductor level. The passive devices contain RF devices which also includes resistor, capacitor, and/or inductor. The resistors can be serpentine resistors and the capacitors can be interdigitated capacitors.
摘要翻译：集成电路芯片的方法和结构具有包括多个绝缘和导电水平的逻辑芯，外部导体水平和具有直接连接到外部导体水平的导电聚合物的无源器件。无源器件包含还包括电阻器，电容器和/或电感器的RF器件。电阻器可以是蛇形电阻器，电容器可以是交错电容器。

10. 发明授权

US06794721B2 Integration system via metal oxide conversion 有权
公开(公告)号：US06794721B2
公开(公告)日：2004-09-21
申请号：US10328650
申请日：2002-12-23
申请人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Joseph F. Shepard, Jr.
发明人： Lawrence A. Clevenger , Louis L. Hsu , Carl J. Radens , Joseph F. Shepard, Jr.
IPC分类号： H01L2976
CPC分类号： H01L29/4983 , H01L21/28194 , H01L21/28518 , H01L21/28568 , H01L21/3003 , H01L21/76823 , H01L21/76895 , H01L29/517 , H01L29/7833
摘要： A method and structure for a transistor device comprises forming a source, drain, and trench region in a substrate, forming a first insulator over the substrate, forming a gate electrode above the first insulator, forming a pair of insulating spacers adjoining the electrode, converting a portion of the first insulator into a metallic film, converting the metallic film into one of a silicide and a salicide film, forming an interconnect region above the trench region, forming an etch stop layer above the first insulator, the trench region, the gate electrode, and the pair of insulating spacers, forming a second insulator above the etch stop layer, and forming contacts in the second insulator. The first insulator comprises a metal oxide material, which comprises one of a HfOx and a ZrOx.

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