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1. 发明专利

JP2010197229A Fluorescent x-ray analyzer 审中-公开
标题翻译：荧光X射线分析仪
公开(公告)号：JP2010197229A
公开(公告)日：2010-09-09
申请号：JP2009042773
申请日：2009-02-25
申请人： Horiba Ltd , Osaka City Univ , 公立大学法人大阪市立大学 , 株式会社堀場製作所
发明人： TSUJI KOICHI , KOMATANI SHINTARO , OSAWA SUMUTO
IPC分类号： G01N23/223
摘要： PROBLEM TO BE SOLVED: To provide a miniaturizable fluorescent X-ray analyzer performing stably fluorescent X-ray analysis of a fine part included in a sample. SOLUTION: In this fluorescent X-ray analyzer, a sample S on a sample placing surface 141 is irradiated with X-rays in a wide range in an uncollected state from an X-ray tube (X-ray irradiation means) 11, and only a fluorescent X-ray generated from a fine part in a detection range restricted by a poly-capillary X-ray half lens (detection range restriction means) 13 is detected by an X-ray detector (fluorescent X-ray detection means) 12. The optical axis of the poly-capillary X-ray half lens 13 is orthogonal to the sample placing surface 141, and the fine part of the sample S is surely irradiated with the X-ray regardless of the height of the sample S, and the fluorescent X-ray from the fine part is detected, to thereby perform stable fluorescent X-ray analysis. Further, since a focal size of the X-ray tube 11 is not required to be reduced, the fluorescent X-ray analyzer can be miniaturized easily. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供对包含在样品中的微细部分进行稳定荧光X射线分析的小型化荧光X射线分析仪。解决方案：在该荧光X射线分析仪中，样品放置面141上的样品S以X射线管（X射线照射装置）11的未收集状态的宽范围的X射线照射，并且通过X射线检测器（荧光X射线检测装置）检测在由毛细管X射线半透半导体（检测范围限制装置）13限制的检测范围内的微细部分产生的荧光X射线）12.多毛细管X射线半透镜13的光轴与样品放置面141正交，试样S的微细部分可靠地用X射线照射，而与样品S的高度无关，并且检测来自微细部分的荧光X射线，从而进行稳定的荧光X射线分析。此外，由于不需要减小X射线管11的焦点尺寸，因此可以容易地使荧光X射线分析仪小型化。版权所有（C）2010，JPO＆INPIT

2. 发明专利

JP2011247882A Fluorescent x-ray detector and fluorescent x-ray detection method 有权
标题翻译：荧光X射线检测器和荧光X射线检测方法
公开(公告)号：JP2011247882A
公开(公告)日：2011-12-08
申请号：JP2011097579
申请日：2011-04-25
申请人： Horiba Ltd , Osaka City Univ , 公立大学法人大阪市立大学 , 株式会社堀場製作所
发明人： TSUJI KOICHI , KOMATANI SHINTARO , UCHIHARA HIROSHI , BANDO ATSUSHI
IPC分类号： G01N23/223
摘要： PROBLEM TO BE SOLVED: To provide a fluorescent X-ray detector and a fluorescent X-ray detection method capable of improving the spatial resolution of fluorescent X-ray analysis without reducing the concentration spot of an X-ray lens.SOLUTION: For the fluorescent X-ray detector, the position of the focus of a first X-ray lens 12 for concentrating primary X-rays from an X-ray tube (X-ray source) 11 to the concentration spot (first space) and the position of the focus of a second X-ray lens 22 for condensing fluorescent X-rays from a fetch spot (second space) to be detected by an X-ray detector (detection means) 21 are separated within such a range that the concentration spot and the fetch spot overlap. Only the fluorescent X-rays from a detection region where the concentration spot and the fetch spot overlap are detected, and the size of the detection region is the spatial resolution. Compared to a conventional fluorescent X-ray detector for which the size of the concentration spot is the spatial resolution, the spatial resolution of the fluorescent X-ray analysis is improved.
摘要翻译：解决问题：提供能够在不降低X射线透镜的浓度点的情况下提高荧光X射线分析的空间分辨率的荧光X射线检测器和荧光X射线检测方法。解决方案：对于荧光X射线检测器，第一X射线透镜12的焦点位置用于将来自X射线管（X射线源）11的初级X射线集中到浓度点（第一空间），并且用于聚集来自X射线检测器（检测装置）21检测的取指点（第二空间））的荧光X射线的第二X射线透镜22的焦点位置在这样的浓度点和获取点重叠的范围。只有检测到浓度点和取指点重叠的检测区域的荧光X射线，并且检测区域的大小是空间分辨率。与其中浓度点的尺寸为空间分辨率的常规荧光X射线检测器相比，荧光X射线分析的空间分辨率提高。版权所有（C）2012，JPO＆INPIT

3. 发明专利

JP2014130169A X-ray fluorescence analyzer 有权
标题翻译： X射线荧光分析仪
公开(公告)号：JP2014130169A
公开(公告)日：2014-07-10
申请号：JP2014081276
申请日：2014-04-10
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： OSAWA SUMUTO , KUROZUMI TAKUJI , KOMATANI SHINTARO
IPC分类号： G01N23/223
摘要： PROBLEM TO BE SOLVED: To provide an X-ray fluorescence analyzer that prevents occurrence of an error due to distortion of an X-ray transmission window provided at a sample cell and can analyze a flowing sample with high accuracy.SOLUTION: A support part 24 is provided in a protruding manner at the periphery of an opening 21c provided in a cell holder inner frame 21 of a cell holder 2. An annular ring shaped flat surface provided at a protruding end portion of the support part 24 comes into contact with an X-ray transmission window 54 provided inside an opening 52d at the bottom of a sample cell 5, so as to support the sample cell 5. Gas such as helium gas is filled in a housing 1 and a substantially sealed space surrounded by the X-ray transmission window 54 of the sample cell 5 and the support part 24 and an X-ray transmission window 23 of the cell holder 2, and gas such as helium gas is filled in a space from an X-ray tube 3 to the sample cell 5 and from the sample cell 5 to an X-ray detector 4. Thereafter, X-rays are radiated, and fluorescent X-rays are detected to analyze a sample.
摘要翻译：要解决的问题：提供一种X射线荧光分析仪，其能够防止由于样品池设置的X射线透射窗的畸变而产生误差，并能够高精度地分析流动的样品。解决方案：支撑部24 突出地设置在设置在电池座2的电池座内框架21中的开口21c的周边。设置在支撑部24的突出端部的环形平坦表面与X接触射线透射窗54设置在样品池5的底部的开口52d的内部，以便支撑样品池5.诸如氦气的气体填充在外壳1和被X射线包围的基本上密封的空间中将样品池5的透射窗口54和电池保持器2的支撑部24和X射线透过窗23以及诸如氦气的气体从X射线管3填充到样品池5 并从样品池5到X射线然后，照射X射线，并检测荧光X射线以分析样品。

4. 发明专利

JP2005164404A X-ray guide tube and its manufacturing method 审中-公开
标题翻译： X射线导管及其制造方法
公开(公告)号：JP2005164404A
公开(公告)日：2005-06-23
申请号：JP2003403992
申请日：2003-12-03
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： KAMISAKA HIROJI , KOMATANI SHINTARO , HORII YOSHIO
IPC分类号： G21K1/06
摘要： PROBLEM TO BE SOLVED: To provide an X-ray tube and its manufacturing method which enable elimination of scattering in efficiency of condensing X rays, and to manufacture with high reproducibility.
SOLUTION: Two metal half bodies 1, having grooves 2 which are nearly arc shape cross section vertical to the longitudinal direction, are provided. The two half bodies 1 are contacted so that the grooves 2 face each other.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供能够消除X射线聚焦效率的散射并且以高再现性制造的X射线管及其制造方法。解决方案：提供具有垂直于纵向的几乎弧形横截面的槽2的两个金属半体1。两个半体1接触，使得凹槽2彼此面对。版权所有（C）2005，JPO＆NCIPI

5. 发明专利

JP2004093511A X-ray analysis apparatus and computer program 有权
公开(公告)号：JP2004093511A
公开(公告)日：2004-03-25
申请号：JP2002258236
申请日：2002-09-03
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： OSAWA SUMUTO , KOMATANI SHINTARO , OHORI KENICHI
IPC分类号： G01N23/223 , G01N23/04
摘要： PROBLEM TO BE SOLVED: To provide an X-ray analysis apparatus and a computer program capable of performing phase separation including the interior of a sample.
SOLUTION: This X-ray analysis apparatus is provided with a sample stage 24 on which a sample 20 is placed; X-ray emitting means 12, 14 for irradiating the placed sample 20 with X-rays; a fluorescent X-ray detecting means 16 for detecting fluorescent X-rays generated by X-ray irradiation to the sample 20; a transmitted X-ray detecting means 22 for detecting transmitted X-rays transmitted through the sample 20; analysis means 40, 42 for analyzing the distribution of similar portions of the composition of the sample based on the detected fluorescent X-rays and transmitted X-rays; and a display means 44 for displaying the distribution of the similar portions of the composition of the sample 20.
COPYRIGHT: (C)2004,JPO

6. 发明专利

JP2003028815A X-ray analyzer and x-ray conduit used in the same 有权
标题翻译： X射线分析仪和X射线分析仪
公开(公告)号：JP2003028815A
公开(公告)日：2003-01-29
申请号：JP2001213928
申请日：2001-07-13
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： OSAWA SUMUTO , KOMATANI SHINTARO
IPC分类号： G01N23/223 , G01N23/02
摘要： PROBLEM TO BE SOLVED: To provide an X-ray analyzer which can quickly and correctly confirm an X-ray irradiation position or an irradiation area at a sample and can efficiently measure, and an X-ray conduit used in the same.
SOLUTION: In the X-ray analyzer which is constituted to irradiate X-rays (a) from an X-ray source 4 to the sample 2 by reducing X-rays, there are set between the X-ray source 4 and the sample 2, a visible light mirror 9 which passes the X-rays (a) and reflects a visible light e, and the X-ray conduit 10 where a visible light guide part 15 for passing the visible light e is formed to the periphery of an X-ray guide part 14 for guiding the X-rays (a). The irradiation position or the area of the X-rays (a) to the sample 2 can be confirmed on the basis of an optical image 24 of the sample obtained through the visible light guide part 15 and the visible light mirror 9 when the sample 2 is irradiated with a visible light d.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供一种可以快速且正确地确认样品的X射线照射位置或照射区域并能够有效测量的X射线分析仪，以及其中使用的X射线导管。解决方案：在通过X射线照射X射线（a）从X射线源4向样品2照射的X射线分析装置中，设置X射线源4和样本2之间，通过X射线（a）并反射可见光e的可见光反射镜9和X射线管10，其中可见光导向部分15用于使可见光e通过X的周边用于引导X射线（a）的射线引导部14。可以基于通过可见光导向部15获得的样品的光学图像24和可见光反射镜9来确认X射线（a）到样品2的照射位置或面积，用可见光d照射。

7. 发明专利

JP2012047470A Sample fixing method, fluorescent x-ray detection method, sample fixture and fluorescent x-ray detection device 审中-公开
标题翻译：样品固定方法，荧光X射线检测方法，样品固定和荧光X射线检测装置
公开(公告)号：JP2012047470A
公开(公告)日：2012-03-08
申请号：JP2010187104
申请日：2010-08-24
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： ONO HITOMI , GOTO SATOSHI , YOKOTA YOSHIHIRO , KOMATANI SHINTARO
IPC分类号： G01N23/223
摘要： PROBLEM TO BE SOLVED: To provide a sample fixing method capable of fixing a flaky sample flatly without overlap width, a fluorescent X-ray detection method, a sample fixture and a fluorescent X-ray detection device.SOLUTION: An X-ray transmission sheet 14 extended at an opening end of a cylindrical member 11 is fixed by an O-ring (first fitting member) 12, and a flaky sample S is overlappedly arranged on the X-ray transmission sheet 14. Further, an X-ray transmission sheet 15 is overlapped on the sample S and the X-ray transmission sheet 14 to be extended at the opening end of the cylindrical member 11, and fixed by an O-ring (second fitting member) 13. The sample S is sandwiched and fixed between the X-ray transmission sheet 14 and the X-ray transmission sheet 15. The sample S is fixed flatly without overlap width, and there is no support other than the X-ray transmission sheets. An X-ray is transmitted through the X-ray transmission sheet 15 and irradiates the sample S, and a fluorescent X-ray generated by the sample S is detected.
摘要翻译：要解决的问题：提供一种能够平坦地固定片状样品而不具有重叠宽度的样品定影方法，荧光X射线检测方法，样品夹具和荧光X射线检测装置。解决方案：在圆筒形构件11的开口端延伸的X射线透射片14通过O形环（第一配合构件）12固定，并且片状样品S重叠地布置在X射线透射此外，X射线透射片15重叠在样品S和X射线透射片14上，以在圆柱形构件11的开口端延伸，并由O形环（第二配合构件）13.将样品S夹在固定在X射线透射片14和X射线透射片15之间。样品S平坦地固定而没有重叠宽度，除了X射线透射片。通过X射线透射片15透射X射线，照射样品S，检测由样品S产生的荧光X射线。版权所有（C）2012，JPO＆INPIT

8. 发明专利

JP2005274139A Measuring intrument for specific component in sample 有权
标题翻译：测量样品中特定组分的入口
公开(公告)号：JP2005274139A
公开(公告)日：2005-10-06
申请号：JP2004083297
申请日：2004-03-22
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： KOMATANI SHINTARO , NOGUCHI SHINTARO
IPC分类号： G01N31/00 , G01N21/64 , G01N31/12
摘要： PROBLEM TO BE SOLVED: To provide a measuring instrument for a specific component in a sample for enabling a measuring person or an operator to automatically, precisely and simply perform desired measurement in a short time without performing wasteful measurment not only in a concentration estimated case but also in a case of a sample unknown in concentration. SOLUTION: In the measuring intrument for the specific component in the sample constituted so that the gap formed by burning the sample is measured in a gas analyzing part 10 and the output signal of the gas analyzing part 10 gas is processed in an operational control part 30 to quantitatively analyze the specific component contained in the sample, analysis is performed in a certain measuring range under a measuring component and the operational control part 30 sets a proper measuring range and a measuring condition automatically at this time on the basis of the magnitude of the output signal obtained in the gas analyzing part 10 to perform measurement in the proper measuring range and the proper measuring condition. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了提供用于样品中的特定部件的测量仪器，以使得测量人员或操作者能够在短时间内自动，精确和简单地执行期望的测量，而不进行不必要的浓度的浪费测量估计病例，但在浓度未知的样本的情况下也是如此。＆lt; P＆gt;解决方案：在样品中的特定成分的测量文件中，构成为在气体分析部10中测量燃烧样品所形成的间隙，并且气体分析部10的输出信号在操作中被处理控制部件30对样品中包含的特定成分进行定量分析，在测量部件的一定测量范围内执行分析，并且操作控制部件30基于该测量部件自动设定适当的测量范围和测量条件在气体分析部10中获得的输出信号的大小，以在适当的测量范围和适当的测量条件下进行测量。版权所有（C）2006，JPO＆NCIPI

9. 发明专利

JP2004093510A Analysis result display method, x-ray analyzer, and computer program 有权
公开(公告)号：JP2004093510A
公开(公告)日：2004-03-25
申请号：JP2002258233
申请日：2002-09-03
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： NAGAO TOSHIHARU , OSAWA SUMUTO , KOMATANI SHINTARO , OHORI KENICHI
IPC分类号： G01N23/04
摘要： PROBLEM TO BE SOLVED: To provide an analysis result display method capable of improving the contrast of a transmission X-ray image.
SOLUTION: The number of pulses corresponding to the output level of the transmission X-ray outputted from a transmission X-ray detector 28 is counted by a counting means such as a multi-channel analyzer. In the counting means, number of pulses is counted for each output level, and the counted values are stored in a memory. An X-ray analyzer 1 extracts the counted values corresponding to the output level in a specified range among the counted values corresponding to the output level counted by the counting means. Based on the counted values corresponding to the extracted output level, the analyzer generates a transmission X-ray image and outputs the generated transmission X-ray image to a display device.
COPYRIGHT: (C)2004,JPO

10. 发明专利

JP2003270235A Element analyzer and measuring method using the same 有权
标题翻译：元素分析仪及其测量方法
公开(公告)号：JP2003270235A
公开(公告)日：2003-09-25
申请号：JP2002072734
申请日：2002-03-15
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： KOMATANI SHINTARO , HIRATA HIROSHI
IPC分类号： G01N31/12 , G01N31/00
摘要： PROBLEM TO BE SOLVED: To provide an element analyzer capable of accurately performing measurements without being affected by previous samples to be measured and to provide a measuring method using the analyzer.
SOLUTION: In the element analyzer D, a sample S is gasified in a combustion part 1 and then analyzed. The element analyzer D is provided with a means for injecting a cleaning material W in the combustion part 1.
COPYRIGHT: (C)2003,JPO

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