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    • 2. 发明申请
    • Ion trap mass spectrometry method
    • 离子阱质谱法
    • US20080054173A1
    • 2008-03-06
    • US11889232
    • 2007-08-10
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • H01J49/04
    • H01J49/4265H01J49/0081
    • According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
    • 根据本发明的一个方面,提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪,该质谱仪包括:用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤:通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。
    • 4. 发明授权
    • Ion trap mass spectrometry method
    • 离子阱质谱法
    • US07989764B2
    • 2011-08-02
    • US11889232
    • 2007-08-10
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaShinji NagaiTetsuya Nishida
    • H01J49/42H01J49/40
    • H01J49/4265H01J49/0081
    • According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
    • 根据本发明的一个方面,提供了一种离子阱质谱法和使用质谱仪的离子阱质谱仪,该质谱仪包括:用于电离样品的离子源部分; 用于捕获在离子源中产生的离子的离子阱部分; 用于向离子阱部分施加主高频电压的主高频电源和用于向其提供辅助高频电压的辅助高频电源; 以及用于检测从离子阱排出的离子的检测器。 离子阱质谱方法和离子阱质谱装置包括以下步骤:通过在将离子聚集到离子阱部分的同时喷出不期望的离子将期望的离子累积到离子阱部分中; 并且交替地重复留在离子阱部分中并留下离子阱部分中的期望离子的不需要的离子。
    • 5. 发明申请
    • MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
    • 质谱仪和质谱方法
    • US20090179148A1
    • 2009-07-16
    • US12350328
    • 2009-01-08
    • Hiroyuki YasudaYasushi TeruiShinji NagaiTetsuya Nishida
    • Hiroyuki YasudaYasushi TeruiShinji NagaiTetsuya Nishida
    • B01D59/44H01J49/00
    • H01J49/004H01J49/063
    • Performing an MS3 with a tandem mass spectrometer causes problems of increase in size of the device and of increase in cost. Likewise, a plural number of times MS/MS analyses are even more difficult. An electrode to create a harmonic potential is disposed in a collision cell, and fragment ions produced by the first-time collision induced dissociation are accumulated in the harmonic potential. Target ions of the subsequent stage are let out, by means of an axial resonance excitation, selectively from the accumulated ions. The ions are excited in the axial direction to have a potential exceeding the harmonic potential. Thereby, the second-time collision induced dissociation is performed by means of a potential difference provided at the subsequent stage. In addition, an operation to return the ions back to the harmonic potential enables a plural number of times MS/MS analyses to be performed.
    • 使用串联质谱仪进行MS3会导致设备尺寸增加和成本增加的问题。 同样,多次MS / MS分析更加困难。 用于产生谐波电位的电极设置在碰撞室中,并且由第一次碰撞引起的解离产生的碎片离子累积在谐波电位中。 选择性地从累积的离子中排出后续阶段的目标离子,借助于轴向共振激发。 离子在轴向上被激发以具有超过谐波电位的电位。 因此,通过在后续阶段提供的电位差来执行第二次碰撞诱导解离。 此外,使离子返回到谐波电位的操作能够进行多次MS / MS分析。
    • 10. 发明授权
    • Extreme ultraviolet light generation apparatus
    • 极紫外光发生装置
    • US08242474B2
    • 2012-08-14
    • US13032172
    • 2011-02-22
    • Shinji NagaiTamotsu AbeTakanobu IshiharaOsamu Wakabayashi
    • Shinji NagaiTamotsu AbeTakanobu IshiharaOsamu Wakabayashi
    • G01N21/33H01J1/50G21K5/08
    • H05G2/003G01J3/10G03F7/70033H05G2/005H05G2/008
    • An extreme ultraviolet light generation apparatus used in combination with a laser system, the apparatus may include: a chamber provided with at least one inlet port for introducing a laser beam outputted from the laser system into the chamber; a target supply unit provided to the chamber for supplying a target material to a predetermined region inside the chamber, where the target material is irradiated with the laser beam; at least one optical element disposed inside the chamber; a magnetic field generation unit for generating a magnetic field around the predetermined region; an ion collection unit disposed in a direction of a line of magnetic force of the magnetic field for collection an ion which is generated when the target material is irradiated with the laser beam and is flowing along the line of magnetic force; and a gas introduction unit for introducing an etching gas into the chamber.
    • 一种与激光系统组合使用的极紫外光发生装置,该装置可以包括:设置有至少一个入口的腔室,用于将从激光系统输出的激光束引入腔室; 目标供给单元,其设置在所述室中,用于将所述目标材料供给到所述室内的预定区域,所述目标材料用所述激光束照射; 设置在所述室内的至少一个光学元件; 用于产生围绕预定区域的磁场的磁场产生单元; 离子收集单元,设置在所述磁场的磁力线的方向上,用于收集当所述靶材料被所述激光束照射并沿着所述磁力线流动时产生的离子; 以及用于将蚀刻气体引入到室中的气体引入单元。