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1. 发明授权

US07035154B2 Semiconductor memory device and its test method as well as test circuit 失效
标题翻译：半导体存储器件及其测试方法以及测试电路
公开(公告)号：US07035154B2
公开(公告)日：2006-04-25
申请号：US10362891
申请日：2001-08-30
申请人： Hiroyuki Takahashi , Yoshiyuki Katou , Hideo Inaba , Shouzou Uchida , Masatoshi Sonoda
发明人： Hiroyuki Takahashi , Yoshiyuki Katou , Hideo Inaba , Shouzou Uchida , Masatoshi Sonoda
IPC分类号： G11C29/00 , G11C7/00
CPC分类号： G11C29/50016 , G11C11/401 , G11C29/12 , G11C29/46
摘要： The present invention provides a semiconductor memory device capable of checking operation in the worst case in address combinations, and its manufacturing method. Specific data for test are written into a memory cell array 30. Then, a test signal TE1 is set “1” to set a device in a test mode. Refresh addresses for test are then stored in a data store circuit 51. A first address for test is applied to an address terminal 21, whereby a normal read or write operation is accomplished based on the first address for test. A second address for test is applied to the address terminal 21, whereby a refresh operation is accomplished based on the address for test, and subsequently another normal read or write operation is accomplished based on the second address for test. Data of the memory cell array 30 are checked to decide the presence or absence of any abnormality.
摘要翻译：本发明提供一种能够在地址组合中的最坏情况下检查操作的半导体存储器件及其制造方法。用于测试的具体数据被写入存储单元阵列30.然后，将测试信号TE 1设置为“1”以将设备设置在测试模式中。然后将用于测试的刷新地址存储在数据存储电路51中。用于测试的第一地址被应用于地址终端21，由此基于用于测试的第一地址来完成正常的读取或写入操作。用于测试的第二地址被应用于地址终端21，由此基于用于测试的地址来完成刷新操作，并且随后基于第二测试地址来完成另一个正常的读取或写入操作。对存储单元阵列30的数据进行检查，判定有无异常。

2. 发明授权

US06646956B2 One-shot signal generating circuit 有权
标题翻译：单触发信号发生电路
公开(公告)号：US06646956B2
公开(公告)日：2003-11-11
申请号：US10221249
申请日：2002-09-10
申请人： Hiroyuki Takahashi , Hideo Inaba , Masatoshi Sonoda
发明人： Hiroyuki Takahashi , Hideo Inaba , Masatoshi Sonoda
IPC分类号： G11C800
CPC分类号： H03K5/1534 , G11C8/18 , H03K2005/00293
摘要： A one-shot signal generation circuit is provided which makes it easy to adjust pulse width and to deal with variation of skew of an ATD signal, and can reduce chip area. A timing determination section (100) is reset by an edge of a first detected signal among a plurality of address transition detection signals (ATD signals) which have arrived within the skew period of an address signal, measures a first predetermined time by taking an edge of a second detected signal as start instant, and outputs a signal DST which reflects the result of this measurement. A timing determination section (110) measures a second predetermined time by taking an edge of the first detected signal as start instant, and outputs a signal PG which reflects the result of this measurement. An LC generation circuit (14) outputs a one-shot signal (LC) whose start instant is determined by the signal PG and whose end instant is determined by the signal DST.
摘要翻译：提供了一个单触发信号发生电路，可以方便的调整脉冲宽度并应对ATD信号的偏斜变化，并可以减少芯片面积。定时确定部分（100）由在地址信号的歪斜时段内到达的多个地址转换检测信号（ATD信号）中的第一检测信号的边沿复位，通过取边缘来测量第一预定时间的第二检测信号作为开始时刻，并且输出反映该测量结果的信号DST。定时确定部分（110）通过将第一检测信号的边缘作为开始时刻来测量第二预定时间，并且输出反映该测量结果的信号PG。 LC生成电路（14）输出由信号PG确定开始时刻的单触发信号（LC），并且由信号DST确定其结束时刻。

3. 发明授权

US06876592B2 Semiconductor memory device 失效
标题翻译：半导体存储器件
公开(公告)号：US06876592B2
公开(公告)日：2005-04-05
申请号：US10220951
申请日：2001-03-07
申请人： Hiroyuki Takahashi , Hideo Inaba , Masatoshi Sonoda , Yoshiyuki Kato , Atsushi Nakagawa
发明人： Hiroyuki Takahashi , Hideo Inaba , Masatoshi Sonoda , Yoshiyuki Kato , Atsushi Nakagawa
IPC分类号： G11C11/403 , G11C11/401 , G11C11/406 , G11C11/407 , G11C11/408 , G11C29/04 , G11C7/00
CPC分类号： G11C11/406 , G11C11/4087
摘要： A semiconductor memory device capable of accelerating address access and shortening cycle time is provided. A first address decoder (2) and first refresh address decoder (5) respectively decode an external address (Xn) supplied from outside the semiconductor memory device and a refresh address (RXn) used for refreshing within the semiconductor memory device. A multiplexer (8) selects the external address side decode signal (XnDm) or the refresh address side decode signal (XnRm) and outputs the signal as a decode signal (XnMm) based on an external address transmission signal (EXTR) and refresh address transmission signal (RFTR) so that a refresh operation and a read/write operation is performed continuously within one memory cycle. A word driver (10) then decodes decode signals (XnMm, XpMq) selected with multiplexer (8) and so forth, and activates a word line (WLmq).
摘要翻译：提供能够加速地址访问和缩短周期时间的半导体存储器件。第一地址解码器（2）和第一刷新地址解码器（5）分别解码从半导体存储器件外部提供的外部地址（Xn）和在半导体存储器件内用于刷新的刷新地址（RXn）。复用器（8）根据外部地址发送信号（EXTR）和刷新地址发送（EXTR），选择外部地址侧解码信号（XnDm）或刷新地址侧解码信号（XnRm），并输出作为解码信号（XnMm）的信号信号（RFTR），使得在一个存储器周期内连续地执行刷新操作和读/写操作。字驱动器（10）然后解码用多路复用器（8）等选择的解码信号（XnMm，XpMq），并激活字线（WLmq）。

4. 发明授权

US06944081B2 Semiconductor storage and its refreshing method 失效
标题翻译：半导体存储及其刷新方法
公开(公告)号：US06944081B2
公开(公告)日：2005-09-13
申请号：US10363298
申请日：2001-08-30
申请人： Hiroyuki Takahashi , Atsushi Nakagawa , Yoshiyuki Katou , Hideo Inaba , Noriaki Komatsu , Takuya Hirota , Masahiro Yoshida
发明人： Hiroyuki Takahashi , Atsushi Nakagawa , Yoshiyuki Katou , Hideo Inaba , Noriaki Komatsu , Takuya Hirota , Masahiro Yoshida
IPC分类号： G11C11/406 , G11C7/00
CPC分类号： G11C11/406
摘要： A semiconductor memory device capable of a further reduction in power consumption for refresh operation is provided. Cell arrays S0, S1 are divided into respective four blocks B0˜B3 and B10˜B13. In a normal read/write operation, by address data designating a word line, one of the cell arrays is selected, and also one block is selected in the selected cell array, and further one word line is selected in the selected block. In a refresh operation, one of the cell arrays is selected, and four blocks in the selected cell array are simultaneously refreshed. Namely, respective one word line is selected from each of the four blocks, and the selected word lines are refreshed, thereby to reduce a power comsumption as compared to when the plural cell arrays are refreshed.
摘要翻译：提供能够进一步降低刷新操作的功耗的半导体存储器件。单元阵列S 0，S 1被分成四个块B 0〜B 3和B 10〜B 13。在通常的读/写操作中，通过指定字线的地址数据，选择单元阵列中的一个，并且在所选择的单元阵列中选择一个块，并且在所选块中还选择一个字线。在刷新操作中，选择单元阵列之一，同时刷新所选单元阵列中的四个块。也就是说，从四个块中的每一个中选择相应的一个字线，并且与多个单元阵列刷新时相比，刷新所选择的字线，从而降低功耗。

5. 发明授权

US07054224B2 Non-synchronous semiconductor memory device having page mode read/write 有权
标题翻译：具有页模式读/写的非同步半导体存储器件
公开(公告)号：US07054224B2
公开(公告)日：2006-05-30
申请号：US10478369
申请日：2002-05-23
申请人： Hiroyuki Takahashi , Hideo Inaba , Atsushi Nakagawa
发明人： Hiroyuki Takahashi , Hideo Inaba , Atsushi Nakagawa
IPC分类号： G11C8/00
CPC分类号： G11C11/40615 , G11C7/1012 , G11C7/1051 , G11C11/406 , G11C11/4096
摘要： The present invention provides a non-synchronous semiconductor memory device configured as a pseudo-SRAM and capable of relaxing the limitation to address skew and improving the read rate. A data latch circuit 110 holds data having been read out of memory cells in a memory cell array 106 designated by a tow address included in an address ADD in a read mode. Upon transitions of column addresses A0, A1 included in the address, a multiplexer 111 sequentially and non-synchronously feeds out the data held in the data latch circuit 110 based on the column addresses A0, A1.
摘要翻译：本发明提供一种被配置为伪SRAM的非同步半导体存储器件，并且能够放宽对寻址偏移的限制并提高读取速率。数据锁存电路110将从存储单元读出的数据保存在由读取模式中包含在地址ADD中的拖尾地址指定的存储单元阵列106中。在地址中包括的列地址A 0，A 1的转换中，多路复用器111基于列地址A 0，A 1顺序地并且不同步地馈送保存在数据锁存电路110中的数据。

6. 发明申请

US20050207252A1 Semiconductor storage device, test method therefor, and test circuit therefor 失效
标题翻译：半导体存储装置及其测试方法及其测试电路
公开(公告)号：US20050207252A1
公开(公告)日：2005-09-22
申请号：US10498398
申请日：2002-12-10
申请人： Hiroyuki Takahashi , Hideo Inaba , Syouzou Uchida
发明人： Hiroyuki Takahashi , Hideo Inaba , Syouzou Uchida
IPC分类号： G01R31/28 , G01R31/3185 , G11C8/18 , G11C11/401 , G11C11/403 , G11C11/406 , G11C29/08 , G11C29/14 , G11C7/00
CPC分类号： G11C29/12015 , G11C8/18 , G11C11/401 , G11C11/406 , G11C29/14
摘要： A test method and a test circuit which enable operations to be checked when the time interval between a refresh operation and a read or write operation is forcibly reduced. Timings for a read or write operation in a normal operation mode and in a test mode are determined on the basis of an address transition detection circuit. A timing for a refresh operation in the normal operation mode is set on the basis of a normal refreshing pulse signal generated by a refresh pulse generating circuit in response to a timing signal generated by a timer circuit. A timing for a refresh operation in the test mode is set on the basis of a first testing refresh pulse generation signal generated by a first testing refresh pulse generating circuit in response to the address transition detection signal. By controlling a timing for generating the first testing refresh pulse generation signal, it is possible to generate a read or write operation and a refresh operation so that there is a predetermined time interval between these operations.
摘要翻译：当刷新操作和读/写操作之间的时间间隔被强制降低时，能够检查操作的测试方法和测试电路。基于地址转换检测电路来确定在正常操作模式和测试模式下进行读或写操作的时序。基于由定时器电路产生的定时信号由刷新脉冲发生电路产生的正常刷新脉冲信号来设定正常操作模式下的刷新操作的定时。基于由第一测试刷新脉冲发生电路响应于地址转换检测信号产生的第一测试刷新脉冲产生信号来设置测试模式下的刷新操作的定时。通过控制用于产生第一测试刷新脉冲产生信号的定时，可以产生读或写操作和刷新操作，使得在这些操作之间存在预定的时间间隔。

7. 发明申请

US20050207214A1 Semiconductor memory device 有权
标题翻译：半导体存储器件
公开(公告)号：US20050207214A1
公开(公告)日：2005-09-22
申请号：US11130464
申请日：2005-05-16
申请人： Hiroyuki Takahashi , Atsushi Nakagawa , Hideo Inaba
发明人： Hiroyuki Takahashi , Atsushi Nakagawa , Hideo Inaba
IPC分类号： G06F1/32 , G11C11/403 , G11C11/406 , G11C11/407 , G11C11/4074 , G11C11/00
CPC分类号： G11C11/40615 , G11C11/406 , G11C11/4074 , G11C2207/2227 , G11C2211/4067
摘要： A semiconductor memory device is provided which effectively reduces a consumption of current of a system of circuits associated with refresh operations. A control signal circuit 2 controls n-channel transistors 3C, 4B to be in an OFF-state based on an internal chip select signal SCI in an interval time period between the refresh operations, wherein the n-channel transistors 3C, 4B are connected between the system of circuits associated with refresh operations (an internal voltage-down circuit 3 and a boost circuit 4) and the ground, so as to break down a leak path of the system of circuits associated with refresh operations for reducing the leakage of current. At a timing of starting the refresh operation by triggering a timer, the internal chip select signal SCI is transitioned to a high level for supplying a ground voltage to the internal voltage-down circuit 3 and the boost circuit 4.
摘要翻译：提供一种半导体存储器件，其有效地减少与刷新操作相关的电路系统的电流消耗。在刷新操作之间的间隔时间内，控制信号电路2基于内部片选信号SCI控制n沟道晶体管3C，4B处于截止状态，其中n沟道晶体管3 C，4 B连接在与刷新操作（内部降压电路3和升压电路4）相关联的电路系统和地之间，以便分解与刷新操作相关联的电路系统的泄漏路径，以减少电流泄漏。在通过触发定时器开始刷新操作的定时，内部芯片选择信号SCI转换到用于向内部降压电路3和升压电路4提供接地电压的高电平。

8. 发明授权

US06947345B2 Semiconductor memory device 有权
标题翻译：半导体存储器件
公开(公告)号：US06947345B2
公开(公告)日：2005-09-20
申请号：US10473656
申请日：2002-03-28
申请人： Hiroyuki Takahashi , Hideo Inaba , Atsushi Nakagawa
发明人： Hiroyuki Takahashi , Hideo Inaba , Atsushi Nakagawa
IPC分类号： G11C7/22 , G11C11/406 , G11C11/4076 , G11C7/00
CPC分类号： G11C11/40615 , G11C7/22 , G11C11/406 , G11C11/4076 , G11C2207/2227 , G11C2211/4061 , G11C2211/4067
摘要： A semiconductor memory device is provided, which is capable of effectively reducing a current comsumption caused by a self-refresh operation in a stand-by mode.In the refresh operation in the stand-by mode, under the control by a refresh control circuit 8B, firstly, a suppression is made for current driving abilities of sense amplifiers 70A˜70D provided for amplifying data signals appearing on bit lines, and secondly, an expansion is made of a pulse width of a row enable signal RE, which defines a period of time for selecting word lines WL, and thirdly, parallel activations of plural word lines are made based on the row enable signal RE with the expanded pulse width, thereby reducing the frequency of operations of the circuit system associated with the refresh operations, resulting in a suppression of the current consumption.
摘要翻译：提供一种半导体存储器件，其能够有效地降低由待机模式中的自刷新操作引起的电流消耗。在待机模式的刷新操作中，在刷新控制电路8B的控制下，首先抑制用于放大位线上出现的数据信号的读出放大器70A〜70D的电流驱动能力，其次，扩展行限制信号RE的脉冲宽度，该行允许信号RE定义了用于选择字线WL的时间段，第三，基于行允许信号RE进行多条字线的并行激活，扩大的脉冲宽度，从而降低与刷新操作相关联的电路系统的操作频率，导致电流消耗的抑制。

9. 发明授权

US06751144B2 Semiconductor storage and method for testing the same 有权
标题翻译：半导体存储和测试方法
公开(公告)号：US06751144B2
公开(公告)日：2004-06-15
申请号：US10148430
申请日：2002-05-29
申请人： Hiroyuki Takahashi , Hideo Inaba , Takashi Kusakari
发明人： Hiroyuki Takahashi , Hideo Inaba , Takashi Kusakari
IPC分类号： G11C700
CPC分类号： G11C11/40615 , G11C8/18 , G11C11/406 , G11C29/12
摘要： A semiconductor storage having the same memory cells as a DRAM, operating in SRAM specifications, and having advantages such as a small chop size, a low power consumption, a low manufacturing cost, no access delay due to skew, and no memory cell breakdown. An ATD circuit (3) generates a one-shot pulse added to an address change detection signal (ATD) from a change of the address (Address) supplied from external. By combining one-shot pulse produced for each bit of the address, only one one-shot pulse is generated even if the address includes skew. A memory cell is refreshed by using a refresh address (R_ADD) generated by a refresh control circuit (4) during the time when a one-shot pulse is generated. At the fall of the one-shot pulse, a latch control signal (LC) is generated, and the address is taken in a latch (2) so as to access a memory cell array (6).
摘要翻译：具有与DRAM相同的存储单元的半导体存储器，以SRAM规格工作，具有小斩尺寸，低功耗，低制造成本，无偏移的访问延迟以及无存储器单元故障等优点。 ATD电路（3）根据从外部提供的地址（地址）的改变产生添加到地址变化检测信号（ATD）的单触发脉冲。通过组合为地址的每个位产生的单触发脉冲，即使地址包含偏斜，也只产生一个单触发脉冲。通过使用在产生单次脉冲的时间期间由刷新控制电路（4）产生的刷新地址（R_ADD）来刷新存储器单元。在单触发脉冲的下降时，产生锁存控制信号（LC），并将该地址取入锁存器（2），以访问存储单元阵列（6）。

10. 发明授权

US07089351B2 Semiconductor memory device for preventing a late write from disturbing a refresh operation 有权
标题翻译：半导体存储装置，用于防止后期写入干扰刷新操作
公开(公告)号：US07089351B2
公开(公告)日：2006-08-08
申请号：US10479635
申请日：2002-05-28
申请人： Hiroyuki Takahashi , Atsushi Nakagawa , Hideo Inaba
发明人： Hiroyuki Takahashi , Atsushi Nakagawa , Hideo Inaba
IPC分类号： G06F12/16
CPC分类号： G11C11/40603 , G11C11/406 , G11C11/40615 , G11C2211/4067
摘要： A semiconductor memory device is provided for preventing a late-write from disturbing a refresh operation and also for reducing a current consumption in a write cycle with execution of the late-write. Upon a transition of an address ADD, an address transition detector circuit detects this address transition. Upon receipt of a result of detection by the address transition detector circuit, a state control circuit judges an operation to be executed, from an output enable signal /OE and a write enable signal /WE, and then outputs any of a read statement RS, a write statement WS, and a refresh statement FS. According to a clock signal ACLK, input signals such as addresses are taken for executions of operations based on the statements.
摘要翻译：提供一种半导体存储器件，用于防止后期写入干扰刷新操作，并且还用于通过执行后期写入来减少写周期中的电流消耗。地址转换检测器电路在地址ADD的转换时检测该地址转换。一旦状态控制电路接收到由地址转换检测器电路检测到的结果，就从输出使能信号/ OE和写使能信号/ WE判断要执行的操作，然后输出读出的语句RS，写入语句WS和刷新语句FS。根据时钟信号ACLK，基于语句执行诸如地址的输入信号来执行操作。

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