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    • 1. 发明申请
    • MASS SPECTROMETER
    • 质谱仪
    • US20090020695A1
    • 2009-01-22
    • US12173328
    • 2008-07-15
    • Hiroyuki SatakeYuichiro HashimotoYasuaki Takada
    • Hiroyuki SatakeYuichiro HashimotoYasuaki Takada
    • B01D59/44
    • H01J49/004H01J49/422H01J49/4255H01J49/427
    • A mass spectrometer includes a linear multipole electrode, an auxiliary electrode that applies a DC potential on the center axis of the linear multipole electrode, and a DC power supply that supplies a DC power to the auxiliary electrode. The DC potential slope formed on the center axis of the multipole electrode is changed according to the measuring condition. The ejection time of ions can be adjusted optimally by adjusting the potential slope so as to satisfy the measuring condition. If the ejection time of ions is shortened, confusion of different ion information items that might otherwise occur on a spectrum can be avoided. If the ejection time of ions is lengthened, detection limit exceeding can be avoided and ions can be measured efficiently, thereby highly efficient ion measurements are always assured.
    • 质谱仪包括线性多极电极,在线性多极电极的中心轴上施加直流电位的辅助电极和向辅助电极提供直流电力的直流电源。 根据测量条件改变在多极电极的中心轴上形成的直流电位斜率。 通过调整电位斜率以满足测量条件,可以最佳地调节离子的喷射时间。 如果离子的喷射时间缩短,则可以避免在光谱上可能发生的不同离子信息项的混淆。 如果离子的喷射时间延长,则可以避免超过检测极限,有效测量离子,从而确保高效的离子测量。
    • 2. 发明授权
    • Mass spectrometer
    • 质谱仪
    • US08044349B2
    • 2011-10-25
    • US12173328
    • 2008-07-15
    • Hiroyuki SatakeYuichiro HashimotoYasuaki Takada
    • Hiroyuki SatakeYuichiro HashimotoYasuaki Takada
    • H01J49/00
    • H01J49/004H01J49/422H01J49/4255H01J49/427
    • A mass spectrometer includes a linear multipole electrode, an auxiliary electrode that applies a DC potential on the center axis of the linear multipole electrode, and a DC power supply that supplies a DC power to the auxiliary electrode. The DC potential slope formed on the center axis of the multipole electrode is changed according to the measuring condition. The ejection time of ions can be adjusted optimally by adjusting the potential slope so as to satisfy the measuring condition. If the ejection time of ions is shortened, confusion of different ion information items that might otherwise occur on a spectrum can be avoided. If the ejection time of ions is lengthened, detection limit exceeding can be avoided and ions can be measured efficiently, thereby highly efficient ion measurements are always assured.
    • 质谱仪包括线性多极电极,在线性多极电极的中心轴上施加直流电位的辅助电极和向辅助电极提供直流电力的直流电源。 根据测量条件改变在多极电极的中心轴上形成的直流电位斜率。 通过调整电位斜率以满足测量条件,可以最佳地调节离子的喷射时间。 如果离子的喷射时间缩短,则可以避免在光谱上可能发生的不同离子信息项的混淆。 如果离子的喷射时间延长,则可以避免超过检测极限,有效测量离子,从而确保高效的离子测量。
    • 4. 发明授权
    • Method for mass calibration
    • 质量校准方法
    • US06194716B1
    • 2001-02-27
    • US09143399
    • 1998-08-28
    • Yasuaki TakadaTakayuki NabeshimaMinoru SakairiYuichiro Hashimoto
    • Yasuaki TakadaTakayuki NabeshimaMinoru SakairiYuichiro Hashimoto
    • B01D5944
    • H01J49/424H01J49/0009H01J49/428
    • A method for performing a mass calibration under an application of a desired ion peak position of mass spectrum attained by a mass scanning of ions of substance having a known value of m/z and the known value of m/z is added with a step for ejecting an amount of unnecessary ions not contributing to the aforesaid mass calibration accumulated in the aforesaid ion trap type mass analysis region prior to the aforesaid mass scanning operation. An accumulation of a large amount of unnecessary ions in the ion trap type mass analysis region is restricted, a disturbance of electric field in the ion trap mass analysis region generated under an influence of a spatial charge caused by accumulation of the unnecessary ions can be prevented and the aforesaid mass calibration can be performed in an easy and accurate manner.
    • 在通过具有已知m / z值的物质的离子的质量扫描和已知的m /​​ z值获得的质谱所需离子峰位置的施加下进行质量校准的方法添加了用于 在上述质量扫描操作之前,排出在上述离子阱型质量分析区域中累积的对上述质量校准无贡献的不需要的离子的量。 离子阱型质量分析区域中的大量不需要的离子的积聚受到限制,可以防止在由不需要的离子的积聚引起的空间电荷的影响下产生的离子阱质量分析区域中的电场的扰动 并且可以容易且准确地进行上述质量校准。
    • 6. 发明申请
    • MASS SPECTROMETER AND MASS SPECTROMETRIC ANALYSIS METHOD
    • 质谱仪和质谱分析方法
    • US20090179149A1
    • 2009-07-16
    • US12354245
    • 2009-01-15
    • Masuyuki SUGIYAMAYuichiro HashimotoHideki HasegawaYasuaki Takada
    • Masuyuki SUGIYAMAYuichiro HashimotoHideki HasegawaYasuaki Takada
    • B01D59/44H01J49/26
    • H01J49/0045
    • An MS/MS spectrometric analysis method obtains throughput and mass resolving power of precursor ions. In a mass spectrometer, ions, which are introduced and accumulated in an ion trap unit, are resonance-extracted mass-selectively. A profile of precursor ions at the m/z axis of the ion trap and a profile at the mass analyzer portion, which performs mass analysis of the ions extracted from a collision induced dissociation portion, is obtained by performing a measurement when the injection energy to the collision induced dissociation portion is low, and when the injection energy to the collision induced dissociation portion is high. The profile at the m/z axis of the ion trap of the obtained two-dimensional spectrum is substituted with the profile at the m/z axis of the mass analyzer portion. In this way, the m/z of both the precursor ions and the fragment ions can be determined with high mass resolving power.
    • MS / MS光谱分析方法获得前体离子的通量和质量分辨能力。 在质谱仪中,离子阱单元中引入和积聚的离子是质量选择性共振提取的。 在离子阱的m / z轴处的前体离子的轮廓和质量分析器部分的轮廓,其进行从碰撞诱导的解离部分提取的离子的质量分析,通过在将注入能量 碰撞诱导的解离部分低,并且当碰撞诱导解离部分的注入能量高时。 所获得的二维光谱的离子阱的m / z轴的轮廓被质量分析器部的m / z轴的轮廓所取代。 以这种方式,可以以高质量分辨能力确定前体离子和碎片离子两者的m / z。
    • 9. 发明授权
    • Mass analyzer and mass analyzing method
    • 质量分析仪和质量分析方法
    • US08164053B2
    • 2012-04-24
    • US12039306
    • 2008-02-28
    • Masuyuki SugiyamaYuichiro HashimotoHideki HasegawaYasuaki Takada
    • Masuyuki SugiyamaYuichiro HashimotoHideki HasegawaYasuaki Takada
    • B01D59/44
    • H01J49/0045
    • There has been a problem that both detection sensitivity and throughput cannot be improved simultaneously by a conventional MS/MS analysis method.A mass analyzer having an ion trap for ejecting ions in a specific mass range, a collisional dissociation part for causing ions ejected from the ion trap to be dissociated, a mass analyzing part for performing a mass analysis of ions ejected from the collisional dissociation part, and a control part including a list in which measurement conditions for each ion are stored selectively resonance-ejects ions introduced into and accumulated in the ion trap based on masses. A scanning operation is a repetition of an operation of ejecting specific precursor ions in a direction of the collisional dissociation part and an operation of ejecting nothing, and each ion can be measured under optimal measurement conditions by controlling an output voltage of each part with reference to list information, realizing a mass analyzer that can perform an MS/MS measurement with high throughput and high sensitivity.
    • 存在通过常规MS / MS分析方法不能同时改善检测灵敏度和通过量的问题。 1.一种质量分析装置,具有用于将特定质量范围的离子排出的离子阱,用于使从离子阱排出的离子离解的碰撞解离部,用于进行从碰撞解离部喷出的离子的质量分析的质量分析部, 以及包括其中存储每个离子的测量条件的列表的控制部分选择性地基于质量共振 - 喷射引入和积聚在离子阱中的离子。 扫描操作是重复在碰撞解离部分的方向上排出特定的前体离子的操作和不喷射的操作,并且可以在最佳测量条件下测量每个离子,通过参考每个部分的输出电压 列表信息,实现能够以高吞吐量和高灵敏度执行MS / MS测量的质量分析器。