专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20130129511A1 WIND TURBINE AND APPARATUS AND METHOD FOR DETECTING DAMAGE TO WIND-TURBINE-BLADE SKIN 审中-公开
标题翻译：风力涡轮机及其检测对风力涡轮机皮肤的损伤的方法
公开(公告)号：US20130129511A1
公开(公告)日：2013-05-23
申请号：US13357231
申请日：2012-01-24
申请人： Hiroyuki KAYAMA , Takao KUROIWA , Eiji KATO , Nobuyasu NAKAMURA , Tetsuya SAKIMURA
发明人： Hiroyuki KAYAMA , Takao KUROIWA , Eiji KATO , Nobuyasu NAKAMURA , Tetsuya SAKIMURA
IPC分类号： F03D11/00 , G06F19/00
CPC分类号： F03D17/00 , F05B2240/30 , F05B2260/83 , F05B2270/301 , F05B2270/303 , Y02E10/721 , Y02E10/726
摘要： An object is to provide a wind turbine and an apparatus and method for detecting damage to a wind-turbine-blade skin, which can reduce the workload of workers who are in charge of inspection for damage to a wind-turbine-blade skin. Provided is an apparatus for detecting damage to a wind-turbine-blade skin that detects damage to the skin of a wind turbine blade having a hollow structure, the apparatus including a pressure sensor that measures the internal pressure of the wind turbine blade; and a nacelle-side control unit that detects damage based on the pressure measured by the pressure sensor.
摘要翻译：本发明的目的是提供一种用于检测对风力涡轮机叶片皮肤的损害的风力涡轮机和装置和方法，其可以减少负责对风力涡轮机叶片皮肤的损坏进行检查的工人的工作量。提供了一种用于检测风力涡轮机叶片皮肤的损伤的装置，其检测对具有中空结构的风力涡轮机叶片的皮肤的损坏，该装置包括测量风力涡轮机叶片的内部压力的压力传感器; 以及基于由压力传感器测量的压力来检测损伤的机舱侧控制单元。

2. 发明申请

US20110090431A1 LIGHT RECEIVING DEVICE, LIGHT RECEIVING DEVICE MANUFACTURING METHOD, AND LIGHT RECEIVING METHOD 有权
标题翻译：光接收装置，光接收装置的制造方法和光接收方法
公开(公告)号：US20110090431A1
公开(公告)日：2011-04-21
申请号：US12889230
申请日：2010-09-23
申请人： Shin MASUDA , Eiji KATO
发明人： Shin MASUDA , Eiji KATO
IPC分类号： G02F1/1335 , G02B5/30
CPC分类号： G01J1/04 , G01J1/0407 , G01J1/0422 , G01J1/0429 , G01J1/0437
摘要： There is provided a light receiving device including a polarization dispersing section that disperses a polarization direction of incoming light into a plurality of polarization directions, a light collecting section that has a metal pattern shaped like concentric circles on a surface thereof, where the light collecting section collects light that has passed through the polarization dispersing section, and a light receiving section that receives the light collected by the light collecting section. Also provided are a light receiving device manufacturing method and a light receiving method. The light collecting section may have a surface plasmon antenna that has the metal pattern shaped like the concentric circles on a surface thereof, and the light receiving section may receive the light collected toward a center of the concentric circles of the metal pattern of the light collecting section, through a hole at the center of the concentric circles, on a rear side of the light collecting section.
摘要翻译：提供了一种光接收装置，其包括将入射光的偏振方向分散成多个偏振方向的偏振光分散部，具有在其表面上形状为同心圆的金属图案的聚光部，收集通过偏振分散部的光，以及受光部，其接收由该光收集部收集的光。还提供了一种光接收装置的制造方法和光接收方法。集光部可以具有表面等离子体激元天线，其具有在其表面上形状与同心圆形状的金属图案，并且光接收部可以接收朝向聚光的金属图案的同心圆的中心收集的光通过在同心圆的中心的孔，在集光部的后侧。

3. 发明申请

US20120286797A1 ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RECORDING MEDIUM 有权
标题翻译：电磁波测量装置，测量方法和记录介质
公开(公告)号：US20120286797A1
公开(公告)日：2012-11-15
申请号：US13458274
申请日：2012-04-27
申请人： Eiji KATO , Akiyoshi IRISAWA
发明人： Eiji KATO , Akiyoshi IRISAWA
IPC分类号： G01R31/02
CPC分类号： G01N21/8422 , G01N21/3563 , G01N21/3581 , G01N21/9508
摘要： According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector and a measurement unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test including at least two layers, and the electromagnetic wave detector detects reflected electromagnetic waves which are the electromagnetic waves reflected by the respective at least two layers. The measurement unit measures the device under test based on one or both of extreme values of electric fields of the respective reflected electromagnetic waves and a time difference between timings in which the electric fields of the respective reflected electromagnetic waves take the extreme values.
摘要翻译：根据本发明，电磁波测量装置包括电磁波输出装置，电磁波检测器和测量单元。电磁波输出装置向具有至少两层的被测设备输出频率等于或大于0.01 [THz]且等于或小于100 [THz]的电磁波，并且电磁波检测器检测反射电磁是由相应的至少两层反射的电磁波的波。测量单元基于各反射电磁波的电场的极值中的一个或两个以及反射电磁波的电场的极值的极值之间的时间差来测量被测设备。

4. 发明申请

US20120235043A1 MEASUREMENT APPARATUS AND MEASUREMENT METHOD 有权
标题翻译：测量装置和测量方法
公开(公告)号：US20120235043A1
公开(公告)日：2012-09-20
申请号：US13485686
申请日：2012-05-31
申请人： Yuichi OGAWA , Shinichiro HAYASHI , Eiji KATO
发明人： Yuichi OGAWA , Shinichiro HAYASHI , Eiji KATO
IPC分类号： G01J5/00
CPC分类号： G01N21/3581 , G01N21/95692 , H01L31/0232 , H01L31/101
摘要： There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.
摘要翻译：提供了一种测量装置，包括：空间布置结构，包括由平面内的导体包围的空间区域;朝向由所述空间布置结构保持的物体发射电磁波的电磁波发射器;以及测量电磁波的电磁波检测器已经通过了空间布置结构。这里，通过测量已经通过空间排列结构的电磁波来测量物体的特性。从电磁波发射器朝向空间配置结构发射的电磁波以一定角度入射在包含空间区域的平面上，并且测量已经通过空间布置结构的电磁波。

5. 发明申请

US20100040501A1 R-T-B Based Rare Earth Permanent Magnet and Method for Production Thereof 审中-公开
标题翻译： R-T-B型稀土永磁铁及其生产方法
公开(公告)号：US20100040501A1
公开(公告)日：2010-02-18
申请号：US12572025
申请日：2009-10-01
申请人： Eiji KATO , Chikara ISHIZAKA
发明人： Eiji KATO , Chikara ISHIZAKA
IPC分类号： H01F41/02 , B22F1/00 , B22F3/12
CPC分类号： C22C38/005 , H01F1/0577
摘要： An R-T-B system rare earth permanent magnet, which comprises at least main phase grains consisting essentially of R2T14B compounds and a grain boundary phase having a higher amount of R than the above described main phase grains, and which satisfies the following formulas: AVE(X)/Y=0.8 to 1.0; and (X/Y)max/(X/Y)min=2.0 to 13.0, wherein X represents (the weight ratio of heavy rare earth elements)/(the weight ratio of all the rare earth elements) for a given number of the above described main phase grains in the above described sintered body; Y represents (the weight ratio of heavy rare earth elements)/(the weight ratio of all the rare earth elements) for the sintered body as a whole; AVE(X) represents the mean value of X obtained for the given number of the main phase grains; (X/Y)min represents the minimum value of (X/Y) obtained for the given number of the main phase grains; and (X/Y)max represents the maximum value of (X/Y) obtained for the given number of the main phase grains.
摘要翻译：一种RTB系稀土永磁体，其至少包含主要由R2T14B化合物组成的主相晶粒和具有比上述主相晶粒高的R的晶界相，其满足下式：AVE（X） /Y=0.8〜1.0; 和（X / Y）max /（X / Y）min = 2.0〜13.0，其中X表示（重稀土元素的重量比）/（所有稀土元素的重量比）上述烧结体中的主相晶粒; Y表示（重稀土元素的重量比）/（所有稀土元素的重量比）作为整体烧结体; AVE（X）表示给定数量的主相晶粒获得的X的平均值; （X / Y）min表示给定数量的主相晶粒获得的（X / Y）的最小值; 和（X / Y）max表示对于给定数量的主相晶粒获得的（X / Y）的最大值。

6. 发明申请

US20100321682A1 HOLDING FIXTURE, PLACEMENT METHOD OF HOLDING FIXTURE, AND MEASUREMENT METHOD 审中-公开
标题翻译：保持夹具，夹具的放置方法和测量方法
公开(公告)号：US20100321682A1
公开(公告)日：2010-12-23
申请号：US12776538
申请日：2010-05-10
申请人： Eiji KATO , Shigeki NISHINA , Kodo KAWASE
发明人： Eiji KATO , Shigeki NISHINA , Kodo KAWASE
IPC分类号： G01N21/01
CPC分类号： G01N21/3581 , G01N21/4795
摘要： A container according to the present invention contains at least a part of a device under test to be measured by a terahertz wave measurement device. The container includes a gap portion that internally disposes at least a part of the device under test, and an enclosure portion that includes a first flat surface portion and a second flat surface portion, and disposes the gap portion between the first flat surface portion and the second flat surface portion, thereby enclosing the gap portion. Moreover, a relationship n1−0.1≦n2≦n1+0.1 holds where n2 denotes a refractive index of the enclosure portion, and n1 denotes a refractive index of the device under test. Further, the first flat surface portion intersects at the right angle with a travel direction of the terahertz wave.
摘要翻译：根据本发明的容器包含被太赫兹波测量装置测量的被测器件的至少一部分。容器包括内部配置被测设备的至少一部分的间隙部分和包括第一平坦表面部分和第二平坦表面部分的封闭部分，并且将间隙部分设置在第一平坦表面部分和第二平坦部分之间第二平坦表面部分，从而包围间隙部分。此外，关系n1-0.1＆nlE; n2＆nlE; n1 + 0.1，其中n2表示封装部分的折射率，n1表示被测器件的折射率。此外，第一平面部分与太赫兹波的行进方向成直角相交。

7. 发明申请

US20100025586A1 MEASUREMENT APPARATUS AND MEASUREMENT METHOD 有权
标题翻译：测量装置和测量方法
公开(公告)号：US20100025586A1
公开(公告)日：2010-02-04
申请号：US12511016
申请日：2009-07-28
申请人： Yuichi OGAWA , Shinichiro HAYASHI , Eiji KATO
发明人： Yuichi OGAWA , Shinichiro HAYASHI , Eiji KATO
IPC分类号： G01N21/00 , G01R27/04 , G01J5/02
CPC分类号： G01N21/3581 , G01N21/95692 , H01L31/0232 , H01L31/101
摘要： There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.
摘要翻译：提供了一种测量装置，包括：空间布置结构，包括由平面内的导体包围的空间区域;朝向由所述空间布置结构保持的物体发射电磁波的电磁波发射器;以及测量电磁波的电磁波检测器已经通过了空间布置结构。这里，通过测量已经通过空间排列结构的电磁波来测量物体的特性。从电磁波发射器朝向空间配置结构发射的电磁波以一定角度入射在包含空间区域的平面上，并且测量已经通过空间布置结构的电磁波。

8. 发明申请

US20110001048A1 ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM 有权
标题翻译：电磁波测量装置，测量方法，程序和记录介质
公开(公告)号：US20110001048A1
公开(公告)日：2011-01-06
申请号：US12731617
申请日：2010-03-25
申请人： Shigeki NISHINA , Motoki IMAMURA , Akiyoshi IRISAWA , Tomoyu YAMASHITA , Eiji KATO
发明人： Shigeki NISHINA , Motoki IMAMURA , Akiyoshi IRISAWA , Tomoyu YAMASHITA , Eiji KATO
IPC分类号： G01J5/28
CPC分类号： G01N21/3581 , G01N21/3563
摘要： According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test and a container storing at least a part of the device under test. The electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. The relative position changing unit changes a relative position of an intersection at which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. The delay period recording unit records a delay period of the electromagnetic wave caused by a transmission of the electromagnetic wave through the container. The phase deriving unit that derives, based on a detected result by the electromagnetic wave detector, a phase in the frequency domain of the electromagnetic wave which has transmitted through the device under test. The delay-corrected phase deriving unit that derives a delay-corrected phase obtained by subtracting an integral of the delay period with respect to the frequency from the phase. The sinogram deriving unit that derives a sinogram based on a derived result by the delay-corrected phase deriving unit. The image deriving unit derives, based on the sinogram, an image of a cross section of the device under test including the intersection.
摘要翻译：根据本发明，电磁波测量装置包括电磁波输出装置，电磁波检测器，相对位置改变单元，延迟周期记录单元，相位导出单元，延迟校正相位导出单元，正弦图导出单元和图像导出单元。电磁波输出装置向受试装置输出频率等于或大于0.01 [THz]且等于或小于100 [THz]的电磁波，以及容纳至少部分被测器件的容器。电磁波检测器检测已通过被测器件传输的电磁波。相对位置改变单元改变通过被测设备传输的电磁波的光路与被测设备相对于被测设备相交的交点的相对位置。延迟周期记录单元记录由电磁波的发射引起的电磁波的延迟时间通过容器。基于电磁波检测器检测结果的相位导出单元，通过被测设备传输的电磁波的频域中的相位。延迟校正相位导出单元，其导出通过从该相位减去相对于频率的延迟周期的积分而获得的延迟校正相位。基于经延迟校正的相位导出单元的导出结果导出正弦图的正弦图导出单元。图像导出单元基于正弦图导出被测设备的横截面的图像，包括交点。

9. 发明申请

US20100295534A1 ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM 有权
标题翻译：电磁波测量装置，测量方法，程序和记录介质
公开(公告)号：US20100295534A1
公开(公告)日：2010-11-25
申请号：US12731483
申请日：2010-03-25
申请人： Shigeki NISHINA , Motoki IMAMURA , Akiyoshi IRISAWA , Tomoyu YAMASHITA , Eiji KATO , Kodo KAWASE
发明人： Shigeki NISHINA , Motoki IMAMURA , Akiyoshi IRISAWA , Tomoyu YAMASHITA , Eiji KATO , Kodo KAWASE
IPC分类号： G01R23/02
CPC分类号： G01J5/0285 , G01N21/3563 , G01N21/3581 , G01N21/8806
摘要： According to the electromagnetic wave measurement device of the present invention, an electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changing unit changes a relative position of an intersection across which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. A characteristic value deriving unit derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector while the characteristic value is associated with an assumed relative position which is the relative position if it is assumed that the electromagnetic wave is not refracted by the device under test. A first association correction unit changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the device under test is considered, thereby associating the result derived by the characteristic value deriving unit with the actual relative position. A corrected characteristic value deriving unit that derives the characteristic value associated with a predetermined relative position based on an output from the first association correction unit.
摘要翻译：根据本发明的电磁波测量装置，电磁波输出装置向被测设备输出等于或大于0.01 [THz]且等于或小于100 [THz]的频率的电磁波。电磁波检测器检测已经通过被测设备的电磁波。相对位置改变单元改变通过被测器件发送的电磁波的光路与被测器件相对于被测器件相交的相交位置的相对位置。特征值导出单元基于电磁波检测器的检测结果导出电磁波的特征值，而如果假设电磁波未被折射，则特征值与作为相对位置的假定相对位置相关联由被测设备第一关联校正单元将所假定的相对位置改变为实际相对位置，如果考虑被测设备的电磁波的折射，则该相对位置是相对位置，从而将由特征值导出单元导出的结果与实际相对位置相对位置。校正特征值导出单元，其基于来自第一关联校正单元的输出导出与预定相对位置相关联的特征值。

10. 发明申请

US20100271001A1 ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PROGRAM, AND A RECORDING MEDIUM 有权
标题翻译：电磁波测量装置，测量方法，程序和记录介质
公开(公告)号：US20100271001A1
公开(公告)日：2010-10-28
申请号：US12487177
申请日：2009-06-18
申请人： Eiji KATO , Shigeki NISHINA , Motoki IMAMURA , Akiyoshi IRISAWA , Tomoyu YAMASHITA
发明人： Eiji KATO , Shigeki NISHINA , Motoki IMAMURA , Akiyoshi IRISAWA , Tomoyu YAMASHITA
IPC分类号： G01R23/16
CPC分类号： G01N21/3581
摘要： According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test 1, an electromagnetic wave detector 4 which detects the electromagnetic wave which has transmitted through the device under test 1, a relative position changing unit 6 which changes a relative position of an intersection 100 at which an optical path of the electromagnetic wave transmitting through the device under test 1 and the device under test 1 intersect with respect to the device under test 1, a phase deriving unit 12 which derives, based on a detected result by the electromagnetic wave detector 4, a phase in the frequency domain of the electromagnetic wave which has transmitted through the device under test 1, a sinogram deriving unit 16 which derives a sinogram based on a derived result by the phase deriving unit 12, and a cross sectional image deriving unit 18 that derives, based on the sinogram, an image of a cross section of the device under test 1 including a trajectory of the intersection 100.
摘要翻译：根据本发明，根据吸收速度以外的参数进行CT。电磁波测量装置包括电磁波输出装置2，其以等于或大于0.01 [THz]且等于或小于100 [THz]的频率朝向被测设备1输出电磁波，电磁波检测器 4，其检测通过被测试装置1发送的电磁波;相对位置改变单元6，其改变通过被测试设备1发送的电磁波的光路和设备的相交位置100; 测试1相对于被测设备1相交，相位导出单元12基于电磁波检测器4的检测结果，导出已经通过设备传输的电磁波的频域中的相位测试1，基于相位导出单元12的导出结果导出正弦图的正弦图导出单元16，以及横截面ima ge导出单元18基于正弦图得出包括交会100的轨迹的被测设备1的横截面的图像。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式