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    • 2. 发明授权
    • Fluorescent X-ray device
    • 荧光X射线装置
    • US4461017A
    • 1984-07-17
    • US343199
    • 1982-01-27
    • Toshiyuki KogaHiroshi Ishijima
    • Toshiyuki KogaHiroshi Ishijima
    • G01N23/223G21K1/02H05G1/02
    • G01N23/223G01N2223/076
    • A flourescent x-ray device for irradiating x-rays to a sample so that flourescent x-rays emitted from the sample can be detected is described. A stationary fixed collecting plate is used instead of the movable reflecting plate employed in the prior art. The reflecting plate possesses the characteristics of being transmissive to x-rays and being reflective to visible light so that an image of the sample can be viewed by an observer and the sample can be irradiated with x-rays passing through the plate. The invention permits a remarkable decrease in manufacturing cost. Moreover, the device can be operated in a stable condition with high accuracy for a long time.
    • 描述了用于将X射线照射到样品的荧光X射线装置,从而可以检测从样品发射的荧光x射线。 代替现有技术中使用的可动反射板,使用固定的固定集电板。 反射板具有对x射线透射并反射可见光的特性,使得观察者可以观察样品的图像,并且可以用穿过该板的x射线照射样品。 本发明允许制造成本显着降低。 此外,该装置可以长期稳定地工作在高精度的状态。
    • 4. 发明授权
    • Scanning tunneling microscope
    • 扫描隧道显微镜
    • US4999495A
    • 1991-03-12
    • US399910
    • 1989-08-29
    • Chikara MiyataMasatoshi YasutakeHiroshi Ishijima
    • Chikara MiyataMasatoshi YasutakeHiroshi Ishijima
    • G01Q10/04G01Q30/02G01Q60/10G01Q60/16
    • G01Q60/16B82Y35/00G01Q30/025Y10S977/872
    • In a tunneling unit of a scanning tunneling microscope (STM), a rough feed mechanism for approaching a sample and a probe to a tunnel area is disposed separately (or is provided to a stage on a sample side, for example), a fine movement element block is formed as a separate unit and the tunnel unit main body is made compact and provided with high rigidity so that it can be mounted to an optical microscope or a laser microscope. If the fine movement element block of the tunnel unit is mounted to a revolver of an optical microscope or the like, rotation positioning accuracy of the revolver is a few microns. Therefore, high precision positioning of the position to be observed by STM can be attained by optical means and measurement having high resolution in an nm order can be conducted by use of STM. Since STM can be mounted to an existing apparatus in accordance with the present invention, measurement accuracy can be improved drastically and the invention is extremely useful industrially.
    • 在扫描隧道显微镜(STM)的隧道单元中,将用于将样品和探针接近通道区域的粗略进给机构分开设置(例如,设置在样品侧的台面上),精细运动 元件块形成为单独的单元,并且隧道单元主体被制造成紧凑并且具有高刚性,使得其可以安装到光学显微镜或激光显微镜。 如果隧道单元的微细移动元件块安装在光学显微镜等的左轮手枪上,则左轮的旋转定位精度为几微米。 因此,可以通过光学装置实现STM观察到的位置的高精度定位,并且可以通过使用STM来进行具有nm分辨率的高分辨率的测量。 由于STM可以安装到根据本发明的现有设备中,因此可以大大提高测量精度,并且本发明在工业上是非常有用的。
    • 6. 发明授权
    • Detecting apparatus for inserts, thickness unevenness or impurities
    • 检测装置用于插入,厚度不均匀或杂质
    • US4165461A
    • 1979-08-21
    • US809437
    • 1977-06-23
    • Hiroshi Ishijima
    • Hiroshi Ishijima
    • G01N23/04G01N23/00G02B5/00
    • G01N23/04
    • Radiant rays irradiated from the source penetrate through an object in which inserts or the like are disposed at some distances. A radiant ray detector is provided at the opposite side of the object to the source to detect the radiant rays passed through and somewhat absorbed in the object. A slit or collimator is arranged movable along the object between the source and the detector. The output of the detector changes in accordance with the travel of the slit since the absorption coefficient of the inserts is different from that of the matrix. The output is displayed with a graphic display and further is operated into digital signals for computer input or indicating. The position signal of the slit is used for the display and for digital indicating.
    • 从源头照射的辐射线穿过其中插入件等以一定距离设置的物体。 辐射线检测器设置在物体的与源的相对侧,以检测通过并在物体中稍微吸收的辐射线。 狭缝或准直器被布置成沿着物体在源和检测器之间移动。 由于插入物的吸收系数与基质的吸收系数不同,检测器的输出根据狭缝的行程而变化。 输出显示图形显示,并进一步操作为计算机输入或指示的数字信号。 狭缝的位置信号用于显示和数字显示。