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    • 1. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06400637B1
    • 2002-06-04
    • US09673419
    • 2000-10-18
    • Hironori AkamatsuToru IwataMakoto Kojima
    • Hironori AkamatsuToru IwataMakoto Kojima
    • G11C800
    • G11C8/14G11C8/12G11C11/4087
    • Four memory banks (10 to 13), each having a hierarchical word line structure, are provided. If a particular mode for one of the memory banks is specified by a control packet (PKT), a mode recognizer (15) produces the leading edges of change-of-sub-word enable (SEN0-3) and change-of-column enable (CEN-3) signals with the logical level of change-of-main-word enable (MEN0-3) signal fixed. This is done to make activated ones of sub-word and column select lines changeable in each of the memory banks with the same main word line still selected. In this manner, the row access speeds increase for the respective memory banks.
    • 提供四个具有分层字线结构的存储体(10至13)。 如果通过控制分组(PKT)指定存储器组中的一个的特定模式,则模式识别器(15)产生子字改变使能(SEN0-3)和列更改的前沿 使能(CEN-3)信号与主字使能(MEN0-3)信号的逻辑电平固定。 这样做是为了使具有相同主字线仍被选择的每个存储体中的子字和列选择线的激活的一个可变。 以这种方式,各存储体的行访问速度增加。
    • 3. 发明授权
    • Static random access memory capable of both reducing power consumption
and retaining data at standby-time
    • 静态随机存取存储器能够在待机时减少功耗并保留数据
    • US5734604A
    • 1998-03-31
    • US739392
    • 1996-10-29
    • Hironori AkamatsuToru IwataHisakazu Kotani
    • Hironori AkamatsuToru IwataHisakazu Kotani
    • G11C11/412G11C11/417G11C11/413
    • G11C11/412G11C11/417
    • When a memory chip is in a standby mode, a ground power supply line of a flip-flop forming a memory cell is intermittently placed in the floating state. A switching NMOS transistor is connected between the ground power supply line and a power supply VSS. The gate of the NMOS transistor is controlled by an activation signal. When entering the floating state, the ground power supply line is charged due to an off-leakage current flowing in the transistor of the memory cell. As a result, the voltage of the ground power supply line is increased from the voltage of the power supply VSS. Accordingly, the off-leakage current of the memory cell is reduced, whereby the standby-time power consumption of the memory chip is decreased. When the voltage of the ground power supply line keeps going up, it becomes impossible to read data held in the memory cell in a short time, resulting in the data being lost. In order to prevent the loss of the data, the switching NMOS transistor is made to intermittently turn on.
    • 当存储器芯片处于待机模式时,形成存储单元的触发器的接地电源线被间歇地置于浮置状态。 开关NMOS晶体管连接在接地电源线和电源VSS之间。 NMOS晶体管的栅极由激活信号控制。 当进入浮动状态时,由于在存储单元的晶体管中流过的漏电流导致接地电源线被充电。 结果,接地电源线的电压从电源VSS的电压增加。 因此,存储单元的泄漏电流减小,从而存储芯片的待机时功耗降低。 当接地电源线的电压持续上升时,不可能在短时间内读取保存在存储单元中的数据,导致数据丢失。 为了防止数据丢失,使开关式NMOS晶体管间歇地导通。
    • 6. 发明授权
    • Data holding circuit
    • 数据保持电路
    • US5757702A
    • 1998-05-26
    • US739363
    • 1996-10-29
    • Toru IwataHironori AkamatsuHiroyuki Yamauchi
    • Toru IwataHironori AkamatsuHiroyuki Yamauchi
    • G11C11/412G11C11/419G11C7/00
    • G11C11/419G11C11/412
    • A memory cell includes a first inverter and a second inverter connected with each other through the output node of one of the inverters and the input node of the other inverter, and first and second transistors. Each of the transistors connected with a word line at its gate electrode is interposed between one of a bit line pair and each memory node. This data holding circuit includes an element for increasing a memory cell supply potential for driving the pair of inverters to be higher than a supply potential applied to peripheral circuits, or an element for decreasing a ground voltage for driving the pair of inverters to be lower than a ground voltage applied to the peripheral circuits.
    • 存储单元包括通过其中一个反相器的输出节点和另一个反相器的输入节点以及第一和第二晶体管彼此连接的第一反相器和第二反相器。 在其栅电极处与字线连接的晶体管中的每一个插入在位线对和每个存储器节点之一之间。 该数据保持电路包括用于将用于驱动该对反相器的存储单元电源电位增加到高于施加到外围电路的电源电位的元件,或者用于将用于驱动该对反相器的接地电压降低到低于 施加到外围电路的接地电压。
    • 7. 发明授权
    • Semiconductor integrated circuit with voltage-detecting circuit and signal transmitting and receiving system
    • 具有电压检测电路和信号发射和接收系统的半导体集成电路
    • US06944003B2
    • 2005-09-13
    • US10365527
    • 2003-02-13
    • Hirokazu SugimotoTakashi HirataHironori AkamatsuToru IwataSatoshi Takahashi
    • Hirokazu SugimotoTakashi HirataHironori AkamatsuToru IwataSatoshi Takahashi
    • G01R31/28H01L21/66H02H9/04H02H3/24
    • H02H9/046
    • A first semiconductor integrated circuit is connected to a second semiconductor integrated circuit with a cable. In the first semiconductor integrated circuit, when a power supply voltage becomes less than a set voltage detection level, a voltage-detecting circuit outputs a voltage-detected signal to lower the voltage of the cable and to stop the operation. The second semiconductor integrated circuit detects the decrease in the voltage of the cable to recognize the halt of the operation of the first semiconductor integrated circuit. In the first semiconductor integrated circuit thus configured, in testing the operation under low-voltage conditions in which the power supply voltage is less than the set voltage detection level, the voltage-detecting circuit receives a control signal from an external terminal to stop the operation forcibly. Consequently, even when the power supply voltage is made lower than the set voltage-detecting level, the first semiconductor integrated circuit properly operates until the power supply voltage reaches a predetermined lower limit of operating voltage. Thus, evaluation of operation is possible under low-voltage conditions.
    • 第一半导体集成电路通过电缆连接到第二半导体集成电路。 在第一半导体集成电路中,当电源电压变得小于设定电压检测电平时,电压检测电路输出电压检测信号来降低电缆的电压并停止工作。 第二半导体集成电路检测电缆的电压的降低以识别第一半导体集成电路的操作停止。 在这样配置的第一半导体集成电路中,在电源电压小于设定电压检测电平的低电压条件下进行测试时,电压检测电路从外部端子接收控制信号,停止动作 强制。 因此,即使电源电压低于设定电压检测电平,第一半导体集成电路也可以正常工作,直到电源电压达到预定的工作电压下限。 因此,在低电压条件下可以进行运行评估。
    • 9. 发明授权
    • Static random access memory capable of reducing stendly power
consumption and off-leakage current
    • 静态随机存取存储器能够降低待机功耗和漏电流
    • US5764566A
    • 1998-06-09
    • US893682
    • 1997-07-11
    • Hironori AkamatsuToru IwataHisakazu Kotani
    • Hironori AkamatsuToru IwataHisakazu Kotani
    • G11C11/412G11C11/417G11C11/413
    • G11C11/412G11C11/417
    • When a memory chip is in a standby mode, a ground power supply line of a flip-flop forming a memory cell is intermittently placed in the floating state. A switching NMOS transistor is connected between the ground power supply line and a power supply VSS. The gate of the NMOS transistor is controlled by an activation signal. When entering the floating state, the ground power supply line is charged due to an off-leakage current flowing in the transistor of the memory cell. As a result, the voltage of the ground power supply line is increased from the voltage of the power supply VSS. Accordingly, the off-leakage current of the memory cell is reduced, whereby the standby-time power consumption of the memory chip is decreased. When the voltage of the ground power supply line keeps going up, it becomes impossible to read data held in the memory cell in a short time, resulting in the data being lost. In order to prevent the loss of the data, the switching NMOS transistor is made to intermittently turn on.
    • 当存储器芯片处于待机模式时,形成存储单元的触发器的接地电源线被间歇地置于浮置状态。 开关NMOS晶体管连接在接地电源线和电源VSS之间。 NMOS晶体管的栅极由激活信号控制。 当进入浮动状态时,由于在存储单元的晶体管中流过的漏电流导致接地电源线被充电。 结果,接地电源线的电压从电源VSS的电压增加。 因此,存储单元的泄漏电流减小,从而存储芯片的待机时功耗降低。 当接地电源线的电压持续上升时,不可能在短时间内读取保存在存储单元中的数据,导致数据丢失。 为了防止数据丢失,使开关式NMOS晶体管间歇地导通。