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    • 8. 发明授权
    • Circuit structures and methods for high-speed low-power select arbitration
    • 用于高速低功耗选择仲裁的电路结构和方法
    • US06512397B1
    • 2003-01-28
    • US09933188
    • 2001-08-20
    • Hans M. JacobsonPrabhakar N. KudvaPeter W. CookStanley Everett Schuster
    • Hans M. JacobsonPrabhakar N. KudvaPeter W. CookStanley Everett Schuster
    • H03K1720
    • G06F13/14Y02D10/14
    • A method is provided for selecting a participant to issue. The method includes signaling a domino OR gate arbitration device upon a ready request of a participant having a priority, determining within the domino OR gate arbitration device the relative priority of the participant, signaling the domino OR gate arbitration device through an any-request device upon the ready request of a higher priority participant, and issuing the higher priority participant upon determining the higher priority participant to have a priority highest among participants ready for issue. The method includes gating one of a precharge signal and an evaluate signal of the precharged domino OR gate arbitration device by the ready request of the participant. The method further includes latching a result of the domino OR gate arbitration device and a clock signal, and gating the clock signal by the ready signal of the participant.
    • 提供了一种用于选择参与者发行的方法。 该方法包括在具有优先权的参与者的就绪请求之后发信号通知多米诺骨牌或门仲裁装置,在多米诺诺或门仲裁装置内确定参与者的相对优先级,通过任何请求装置向多米诺骨牌或门仲裁装置发信号 确定较高优先权的参与者的准备好的请求,并且在确定较高优先权的参与者之后发出优先权较高的参与者以便在准备发行的参与者中具有最高优先权。 该方法包括通过参与者的就绪请求选通预充电多米诺OR门仲裁装置的预充电信号和评估信号之一。 该方法还包括锁存多米诺OROR仲裁装置的结果和时钟信号,并通过参与者的就绪信号门控时钟信号。
    • 9. 发明授权
    • Hardware execution driven application level derating calculation for soft error rate analysis
    • 软件错误率分析的硬件执行驱动应用级降额计算
    • US08949101B2
    • 2015-02-03
    • US13271827
    • 2011-10-12
    • Pradip BoseMeeta S. GuptaPrabhakar N. KudvaDaniel A. Prener
    • Pradip BoseMeeta S. GuptaPrabhakar N. KudvaDaniel A. Prener
    • G01R31/3181G06F17/50G01R31/3183
    • G01R31/31816G01R31/318357G06F17/5022
    • Mechanisms are provided for predicting effects of soft errors on an integrated circuit device design. A data processing system is configured to implement a unified derating tool that includes a machine derating front-end engine used to generate machine derating information, and an application derating front-end engine used to generate application derating information, for the integrated circuit device design. The machine derating front-end engine executes a simulation of the integrated circuit device design to generate the machine derating information. The application derating front-end engine executes an application workload on existing hardware similar in architecture to the integrated circuit device design and injects a fault into the existing hardware during execution of the application workload to generate application derating information. The machine derating information is combined with the application derating information to generate at least one soft error rate value for the integrated circuit device design.
    • 提供了用于预测软错误对集成电路器件设计的影响的机制。 数据处理系统被配置为实现统一的降额工具,其包括用于生成机器降额信息的机器降额前端引擎和用于生成应用降额信息的应用降级前端引擎用于集成电路器件设计。 机器降额前端引擎执行集成电路设备设计的仿真以生成机器降额信息。 应用降级前端引擎在架构上与集成电路设备设计类似的现有硬件上执行应用程序工作负载,并在执行应用程序工作负载期间将故障注入到现有硬件中,以生成应用程序降级信息。 机器降额信息与应用降级信息组合以产生用于集成电路设备设计的至少一个软错误率值。
    • 10. 发明授权
    • Modeling system-level effects of soft errors
    • 建模软错误的系统级影响
    • US08091050B2
    • 2012-01-03
    • US12243427
    • 2008-10-01
    • Pradip BosePrabhakar N. KudvaJude A. RiversPia N. SandaJohn-David Wellman
    • Pradip BosePrabhakar N. KudvaJude A. RiversPia N. SandaJohn-David Wellman
    • G06F17/50G06F11/22
    • G06F17/5036G06F2217/82
    • Mechanisms for modeling system level effects of soft errors are provided. Mechanisms are provided for integrating device-level and component-level soft error rate (SER) analysis mechanisms with micro-architecture level performance analysis tools during a concept phase of the IC design to thereby generate a SER analysis tool. A first SER profile for the IC design is generated by applying the SER analysis tool to the IC design. At a later phase of the IC design, detailed information about SER vulnerabilities of logic and storage elements within the IC design are obtained and the first SER profile is refined based on the detailed information about SER vulnerabilities to thereby generate a second SER profile for the IC design. Modifications to the IC design are made at one or more phases of the IC design based on one of the first SER profile or the second SER profile.
    • 提供了对软错误的系统级别影响进行建模的机制。 提供了在IC设计的概念阶段将器件级和组件级软错误率(SER)分析机制与微架构级性能分析工具集成的机制,从而生成SER分析工具。 通过将SER分析工具应用于IC设计,可以生成IC设计的第一个SER简档。 在IC设计的后期阶段,获得关于IC设计中逻辑和存储元件的SER漏洞的详细信息,并且基于关于SER漏洞的详细信息来改进第一SER简档,从而为IC生成第二SER简档 设计。 基于第一SER简档或第二SER简档中的一个,在IC设计的一个或多个阶段进行对IC设计的修改。