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    • 1. 发明授权
    • Method and apparatus for a process, voltage, and temperature variation tolerant semiconductor device
    • 用于工艺,电压和温度变化的半导体器件的方法和装置
    • US08222954B1
    • 2012-07-17
    • US12362412
    • 2009-01-29
    • Guo Jun RenQi ZhangKetan Sodha
    • Guo Jun RenQi ZhangKetan Sodha
    • G05F1/10G05F3/02
    • H03K19/00369
    • A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.
    • 一种降低由于工艺,电压和温度(PVT)和/或其它变化原因导致的基于半导体的器件性能下降的方法和装置。 使用自适应反馈机制来感测和纠正性能下降,同时促进诸如可编程逻辑器件(PLD)之类的集成电路(IC)内的可配置性。 采用电压反馈机制来检测PVT变化,并自适应调整镜像电流参考以跟踪和基本上消除PVT变化。 可以替代地使用多于一个的电压反馈机构来检测差分装置内的基于PVT的变化,由此利用第一电​​压反馈机构来检测共模电压变化,而第二电压反馈机构产生镜像参考电流 基本上消除了共模电压变化,并促进了差动装置的对称运行。
    • 2. 发明授权
    • Method and apparatus for a process, voltage, and temperature variation tolerant semiconductor device
    • 用于工艺,电压和温度变化的半导体器件的方法和装置
    • US07728630B1
    • 2010-06-01
    • US12362417
    • 2009-01-29
    • Guo Jun RenQi ZhangKetan Sodha
    • Guo Jun RenQi ZhangKetan Sodha
    • H03K19/094H03K19/0175
    • H03K19/00384H03K17/163H03K2005/00123H03K2005/0013H03K2005/00143
    • A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device. Edge boosting modules are employed to improve performance during reduced output common mode voltage modes of operation.
    • 一种降低由于工艺,电压和温度(PVT)和/或其它变化原因导致的基于半导体的器件性能下降的方法和装置。 使用自适应反馈机制来感测和纠正性能下降,同时促进诸如可编程逻辑器件(PLD)之类的集成电路(IC)内的可配置性。 采用电压反馈机制来检测PVT变化,并自适应调整镜像电流参考以跟踪和基本上消除PVT变化。 可以替代地使用多于一个的电压反馈机构来检测差分装置内的基于PVT的变化,由此利用第一电​​压反馈机构来检测共模电压变化,而第二电压反馈机构产生镜像参考电流 基本上消除了共模电压变化,并促进了差动装置的对称运行。 边缘升压模块用于在降低输出共模电压工作模式的同时提高性能。
    • 4. 发明授权
    • Methods and apparatus for implementing an output circuit
    • 用于实现输出电路的方法和装置
    • US07635990B1
    • 2009-12-22
    • US12175925
    • 2008-07-18
    • Guo Jun RenQi Zhang
    • Guo Jun RenQi Zhang
    • H03K19/094H03K19/0175
    • H03K19/018528H03K19/00369H04L25/0272
    • An output circuit providing an adjustable output amplitude and common-mode voltage is described. The output circuit includes at least one driver circuit and a common-mode feedback circuit including a first replica circuit of the at least one driver circuit. The common-mode feedback circuit is coupled to receive a first bias and provide an output coupled to the at least one driver circuit. The output circuit may also include a current circuit having a configurable resistor and a second replica circuit of the at least one driver circuit. The current circuit may be coupled to receive a second bias and to provide an output coupled to the at least one driver circuit and the common-mode feedback circuit.
    • 描述了提供可调输出幅度和共模电压的输出电路。 输出电路包括至少一个驱动电路和包括至少一个驱动电路的第一复制电路的共模反馈电路。 共模反馈电路被耦合以接收第一偏置并提供耦合到至少一个驱动器电路的输出。 输出电路还可以包括具有可配置电阻器的电流电路和至少一个驱动器电路的第二复制电路。 当前电路可以被耦合以接收第二偏置并且提供耦合到至少一个驱动器电路和共模反馈电路的输出。
    • 5. 发明授权
    • Method and apparatus for a process, voltage, and temperature variation tolerant semiconductor device
    • 用于工艺,电压和温度变化的半导体器件的方法和装置
    • US08058924B1
    • 2011-11-15
    • US12361804
    • 2009-01-29
    • Guo Jun RenPrasad RauJian TanQi Zhang
    • Guo Jun RenPrasad RauJian TanQi Zhang
    • G05F1/10G05F3/02
    • H03K19/00384G11C29/022G11C29/028G11C2029/0409H03K19/018528
    • A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.
    • 一种降低由于工艺,电压和温度(PVT)和/或其它变化原因导致的基于半导体的器件性能下降的方法和装置。 使用自适应反馈机制来感测和纠正性能下降,同时促进诸如可编程逻辑器件(PLD)之类的集成电路(IC)内的可配置性。 采用电压反馈机制来检测PVT变化,并自适应调整镜像电流参考以跟踪和基本上消除PVT变化。 可以替代地使用多于一个的电压反馈机构来检测差分装置内的基于PVT的变化,由此利用第一电​​压反馈机构来检测共模电压变化,而第二电压反馈机构产生镜像参考电流 基本上消除了共模电压变化,并促进了差动装置的对称运行。