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    • 4. 发明授权
    • Circular buffer using grouping for find first function
    • 循环缓冲器使用分组查找第一个功能
    • US06873184B1
    • 2005-03-29
    • US10653802
    • 2003-09-03
    • Brian D. McMinnMichael K. CiraulaGerald D. Zuraski, Jr.
    • Brian D. McMinnMichael K. CiraulaGerald D. Zuraski, Jr.
    • G06F5/10G06F12/00G06F12/08
    • G06F5/10G06F12/0862G06F2205/106
    • An apparatus comprises a buffer comprising a plurality of entries, an insert pointer, a delete pointer, a plurality of first control circuits coupled to the buffer, and a second control circuit coupled to the buffer. The entries are logically divided into a plurality of groups. Each of the first control circuits corresponds to a respective group and selects an entry from the respective group for potential reading from the buffer. Furthermore, each of the first control circuits, in the event that the delete pointer indicates a first entry in the respective group and the insert pointer wraps around the buffer and indicates a second entry in the respective group, selects the first entry if the first entry is eligible for selection. The second control circuit selects a first group, and the entry selected from the first group by the first control circuits is the entry read from the buffer.
    • 一种装置包括缓冲器,该缓冲器包括多个条目,插入指针,删除指针,耦合到缓冲器的多个第一控制电路以及耦合到缓冲器的第二控制电路。 这些条目在逻辑上分为多个组。 每个第一控制电路对应于相应的组,并从相应组中选择一个来自缓冲器的电位读取的条目。 此外,在删除指针指示相应组中的第一条目并且插入指针围绕缓冲器包围并指示相应组中的第二条目的情况下,每个第一控制电路选择第一条目,如果第一条目 有资格选择。 第二控制电路选择第一组,并且由第一控制电路从第一组中选择的条目是从缓冲器读取的条目。
    • 8. 发明授权
    • Wafer stage storage structure speed testing
    • 晶圆级存储结构速度测试
    • US07417449B1
    • 2008-08-26
    • US11274595
    • 2005-11-15
    • Randal L. PoseyMichael K. Ciraula
    • Randal L. PoseyMichael K. Ciraula
    • G01R31/02
    • G01R31/318511G01R31/31917
    • A system for testing integrated circuit storage structures on a semiconductor wafer. A test IC manufactured on a semiconductor wafer includes a test storage structure such as a random access memory structure, for example, and an access controller including one or more clock sources. In various embodiments, the clock sources may include a ring oscillator and a pulse width generator. These clock sources may be programmable to provide a clock signal having a variety of frequencies for accessing the storage structure. In one embodiment, the frequencies provided by the access controller may be higher than a frequency that can be supplied to the wafer from ATE. In another embodiment, the pulse width generator may be programmable to provide a pulse train having a variety of duty cycles.
    • 一种用于在半导体晶片上测试集成电路存储结构的系统。 在半导体晶片上制造的测试IC包括例如随机存取存储器结构的测试存储结构和包括一个或多个时钟源的访问控制器。 在各种实施例中,时钟源可以包括环形振荡器和脉冲宽度发生器。 这些时钟源可以是可编程的,以提供具有用于访问存储结构的各种频率的时钟信号。 在一个实施例中,由访问控制器提供的频率可以高于可以从ATE提供给晶片的频率。 在另一个实施例中,脉冲宽度发生器可以是可编程的,以提供具有各种占空比的脉冲串。
    • 9. 发明授权
    • Decode structure with parallel rotation
    • 并行旋转解码结构
    • US07268591B1
    • 2007-09-11
    • US11274876
    • 2005-11-15
    • Jan-Michael HuberMichael K. Ciraula
    • Jan-Michael HuberMichael K. Ciraula
    • G11C8/00G06F12/00
    • G11C8/10
    • A memory subsystem and a method of operating therefor. The memory subsystem includes a memory array having 2n locations. The memory subsystem includes an address decoder and rotation logic each coupled to receive bits of a first address having n address bits. The rotation logic is also coupled to receive m rotation bits indicating a number of locations the first address is to be shifted if the first address falls within a specified range of addresses. The rotation logic and the address decoder are configured to operate in parallel with each other. Address selection logic is coupled to receive a first plurality of outputs from the address decoder and a second plurality of outputs from the rotation logic and is further configured to select a second address based on the first and second pluralities of outputs.
    • 存储器子系统及其操作方法。 存储器子系统包括具有2个N个位置的存储器阵列。 存储器子系统包括地址解码器和旋转逻辑,每个逻辑单元被耦合以接收具有n个地址位的第一地址的位。 如果第一地址落在指定的地址范围内,旋转逻辑还被耦合以接收指示第一地址将被移位的位置数量的m个旋转位。 旋转逻辑和地址解码器被配置为彼此并行操作。 地址选择逻辑被耦合以从地址解码器接收第一多个输出和来自旋转逻辑的第二多个输出,并且还被配置为基于第一和第二多个输出来选择第二地址。
    • 10. 发明授权
    • Circular buffer using age vectors
    • 使用年龄向量的循环缓冲
    • US07080170B1
    • 2006-07-18
    • US10653750
    • 2003-09-03
    • Gerald D. Zuraski, Jr.Brian D. McMinnMichael K. Ciraula
    • Gerald D. Zuraski, Jr.Brian D. McMinnMichael K. Ciraula
    • G06F3/00G06F9/30
    • G06F9/3842G06F5/10G06F9/3855
    • An apparatus comprises a buffer comprising a plurality of entries, a plurality of age vectors, and a control circuit coupled to the buffer. Each of the age vectors corresponds to one or more of the entries. Responsive to data being provided to the buffer to be written to at least a first entry, the control circuit is configured to generate a first age vector. The first age vector corresponds to the first entry, and is indicative of which of the plurality of entries contain data that is older than the data being written to the first entry. The control circuit is configured to select an entry for reading responsive to the plurality of age vectors. The selected entry has an attribute used to select the selected entry, and other entries indicated as storing older data in the age vector corresponding to the selected entry do not have the attribute.
    • 一种装置包括缓冲器,该缓冲器包括多个条目,多个老化向量以及耦合到该缓冲器的控制电路。 每个年龄向量对应于一个或多个条目。 响应于提供给要写入至少第一条目的缓冲器的数据,控制电路被配置为产生第一时代向量。 第一年龄向量对应于第一条目,并且指示多个条目中的哪个条目包含比被写入第一条目的数据更早的数据。 控制电路被配置为响应于多个年龄向量来选择用于读取的条目。 所选择的条目具有用于选择所选条目的属性,并且在对应于所选条目的年龄向量中指示为存储较旧数据的其他条目不具有该属性。