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    • 1. 发明授权
    • Static random access memory including potential control means for
writing data in memory cell and write method for memory cell
    • 静态随机存取存储器包括用于将数据写入存储单元的电位控制装置和用于存储单元的写入方法
    • US6011713A
    • 2000-01-04
    • US995769
    • 1997-12-22
    • Fumiyuki YamaneTadahiro KurodaToshinari TakayanagiMasataka MatsuiYasuo UnekawaTetsu Nagamatsu
    • Fumiyuki YamaneTadahiro KurodaToshinari TakayanagiMasataka MatsuiYasuo UnekawaTetsu Nagamatsu
    • G11C11/412G11C11/419H01L21/8244H01L27/11G11C11/00
    • G11C11/419
    • A semiconductor memory includes a memory cell including inverters (IN1, IN2), control transistors (T3, T4) that control the potential of a ground side terminal (N3) connected to the memory cell, and transfer transistors T1 and T2 that control transfer of data from bit lines (BL, /BL) to the memory cell. In writing data, the control transistors raise the potential of the ground side terminal (N3) to be higher than the ground potential by a predetermined potential. After the transfer transistors transfer data having a potential difference smaller than a potential difference between the power supply potential and the ground potential from the bit lines (BL, /BL) to the memory cell, and cause the memory cell to hold the data, the potential of the ground side terminal (N3) is decreased to the ground potential to write data. Since data written in the memory cell suffices to have a potential difference smaller than the potential difference between the power supply potential and the ground potential, the time required to drive the bit line having a large load capacitance is shortened, the power consumption is decreased, and the power consumption necessary for writing data in the memory cell is reduced.
    • 半导体存储器包括:存储单元,包括反相器(IN1,IN2),控制与存储单元连接的接地侧端子(N3)的电位的控制晶体管(T3,T4);以及控制晶体管T1和T2, 从位线(BL,/ BL)到存储单元的数据。 在写入数据时,控制晶体管将地侧端子(N3)的电位提高到高于接地电位预定电位。 在转移晶体管将具有比位线(BL,/ BL)的电源电位和接地电位之间的电位差的电位差的数据传送到存储单元之后,使存储单元保持数据, 接地侧端子(N3)的电位降低到接地电位以写入数据。 由于写入存储单元的数据足以具有比电源电位和接地电位之间的电位差小的电位差,所以驱动具有大负载电容的位线所需的时间缩短,功耗降低, 并且减少了在存储单元中写入数据所需的功耗。
    • 3. 发明授权
    • Semiconductor device and system
    • 半导体器件和系统
    • US07487370B2
    • 2009-02-03
    • US11216018
    • 2005-09-01
    • Shinichiro ShiratakeYukihito OowakiHiroyuki HaraTetsuya FujitaFumitoshi HatoriMasataka Matsui
    • Shinichiro ShiratakeYukihito OowakiHiroyuki HaraTetsuya FujitaFumitoshi HatoriMasataka Matsui
    • G06F1/00
    • G06F1/26G06F1/3203G06F1/3296Y02D10/172
    • According to the present invention, there is provided a semiconductor device including a power supply circuit which receives an external power supply voltage supplied, and outputs an internal power supply voltage not higher than the external power supply voltage; a system module which receives the internal power supply voltage, and performs a predetermined operation; and a performance monitor circuit which measures a processing speed of said system module when the internal power supply voltage is applied, and, on the basis of the processing speed, outputs a first control signal which requests to set the external power supply voltage at a first level, and a second control signal which requests said power supply circuit to set the internal power supply voltage at a second level. The power supply circuit outputs the internal power supply voltage having the second level on the basis of the second control signal applied thereto.
    • 根据本发明,提供了一种半导体器件,包括:电源电路,接收所提供的外部电源电压,并输出不高于外部电源电压的内部电源电压; 接收内部电源电压并执行预定操作的系统模块; 以及性能监视电路,其在施加所述内部电源电压时测量所述系统模块的处理速度,并且基于所述处理速度,输出请求将所述外部电源电压设置为第一的第一控制信号 电平和第二控制信号,其请求所述电源电路将内部电源电压设定在第二电平。 电源电路基于施加到其上的第二控制信号输出具有第二电平的内部电源电压。
    • 5. 发明授权
    • Static random access memory capable of preventing erroneous writing
    • 能够防止错误写入的静态随机存取存储器
    • US5357479A
    • 1994-10-18
    • US693608
    • 1991-04-30
    • Masataka Matsui
    • Masataka Matsui
    • G11C8/10G11C8/18G11C11/407G11C11/418G11C7/00G11C8/00
    • G11C8/10G11C11/418G11C8/18
    • Memory cell arranged in a matrix configuration are selected by a particular word line to supply the stored data to particular bit lines. The row address decoder selects a particular word line based on the address signal, while the column address decoder selects particular bit lines based on the address signal. Each of the row address decoder and column address decoder contains a first decoder for decoding the address signal, a delay circuit for delaying the output from the first decoder when data is written into the memory cell, and a second decoder for receiving the output signals from the first decoder and delay circuit and based on these signals, selecting either a particular word line or particular bit lines.
    • 通过特定字线选择以矩阵配置布置的存储单元,以将存储的数据提供给特定的位线。 行地址解码器基于地址信号选择特定字线,而列地址解码器基于地址信号选择特定的位线。 行地址解码器和列地址解码器中的每一个包含用于解码地址信号的第一解码器,用于当数据被写入存储单元时将来自第一解码器的输出延迟的延迟电路,以及用于从第一解码器接收来自 第一解码器和延迟电路,并且基于这些信号,选择特定字线或特定位线。
    • 6. 发明授权
    • Static memory using a MIS field effect transistor
    • 使用MIS场效应晶体管的静态存储器
    • US4815040A
    • 1989-03-21
    • US100640
    • 1987-09-24
    • Masataka MatsuiTakayuki Ohtani
    • Masataka MatsuiTakayuki Ohtani
    • G11C11/41G11C11/413G11C11/419G11C7/00
    • G11C11/419
    • In a selected column, a pull-up transistor pair is not selected but, instead, a transmission gate transistor pair is selected. In the read mode, the transmission gate transistor pair serves as pull-up loads between the bit line pair. However, the transmission gate transistor pair is kept off until the voltage across the bit line pair is decreased from the power supply potential level to the threshold voltage level of the transmission gate transistors. Therefore, no DC current path is formed in the bit line pair when the voltage across the bit line pair is within a range from a voltage equal to the power supply potential level to a potential lower than the power supply potential by an amount equal to the threshold voltage level, and the rate of increase of a potential difference across the bit line pair is determined by a pull-in current of the memory cell. Therefore, a high-speed sense operation can be realized. In the write mode, the transmission gate transistor pair serves a bit line pull-up function. Since no normally-ON bit line load transistor is arranged, no direct current path including the bit line pair is present, and hence, low power consumption can be achieved.
    • 在选定的列中,不选择上拉晶体管对,而是选择传输栅极晶体管对。 在读取模式下,传输栅极晶体管对用作位线对之间的上拉负载。 然而,传输栅极晶体管对保持截止,直到位线对上的电压从电源电位电平降低到传输栅极晶体管的阈值电压电平。 因此,当位线对上的电压在等于电源电位电平的电压到低于电源电位的电位的范围内时,在位线对中不形成直流电流路径, 阈值电压电平,并且位线对上的电位差的增加速率由存储单元的引入电流决定。 因此,可以实现高速感测操作。 在写入模式下,传输栅极晶体管对用于位线上拉功能。 由于没有布置正常导通的位线负载晶体管,所以不存在包括位线对的直流电路,因此可以实现低功耗。
    • 10. 发明授权
    • Read/write control device for random access memory
    • 随机存取存储器的读/写控制装置
    • US5337276A
    • 1994-08-09
    • US969436
    • 1992-10-30
    • Masataka Matsui
    • Masataka Matsui
    • G11C11/413G11C7/22H01L27/10G11C7/00
    • G11C7/22
    • A first threshold value for detecting a potential indicating a read state, and a second threshold value for detecting a write state are set in an inverter circuit, to which a read/write signal R/W for setting the state of a memory cell is supplied, by means of a P-channel transistor, an N-channel transistor, and another P-channel transistor which is much smaller in gate width than the above transistors. The first or second threshold value is selected by a logic circuit constituted by an inverter circuit and a delay circuit in accordance with the level of the read/write signal R/W. Therefore, a change from a read state to a write state and a reverse change can be detected at high speed, thus providing a read/write control circuit for a random access memory, which can increase the speed of a read operation immediately after a write operation while ensuring a sufficient data write time, and can shorten the write recovery time.
    • 用于检测指示读取状态的电位的第一阈值和用于检测写入状态的第二阈值被设置在反相器电路中,用于设置存储单元的状态的读/写信号R / W被提供到该反相器电路中 通过P沟道晶体管,N沟道晶体管和栅极宽度比上述晶体管小得多的P沟道晶体管。 第一或第二阈值由根据读/写信号R / W的电平由逆变器电路和延迟电路构成的逻辑电路选择。 因此,可以高速检测从读取状态到写入状态和反向变化的改变,从而为随机存取存储器提供读/写控制电路,这可以在写入之后立即增加读取操作的速度 同时确保数据写入时间足够,并可以缩短写入恢复时间。