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    • 8. 发明授权
    • Methods for preparing a semiconductor assembly
    • 半导体组件的制备方法
    • US07256101B2
    • 2007-08-14
    • US10893596
    • 2004-07-15
    • Fabrice LetertreBruno GhyselenOlivier Rayssac
    • Fabrice LetertreBruno GhyselenOlivier Rayssac
    • H01L21/30H01L21/46
    • H01L21/76254H01L21/0445H01L21/187H01L21/7602H01L33/0012H01L33/0029
    • Methods for preparing a semiconductor assembly are disclosed. In an implementation, the technique includes providing a support substrate and a bonding surface thereon, providing a donor substrate having a weakened zone that defines a useful layer and a bonding surface on the useful layer, and providing an interface layer of a predetermined material on the bonding surface of either the support substrate or the useful layer to provide a bonding surface thereon. The method also includes molecularly bonding the bonding surface of the interface layer to the bonding surface of the other of the support substrate or the useful layer to form a separable bonding interface therebetween, and to thus form the semiconductor assembly, and heat treating the semiconductor assembly to a temperature of at least 1000 to 1100° C. without substantially increasing molecular bonding between the bonding surface of the interface layer and the bonding surface of the other of the support substrate or the useful layer, so that the separable bonding interface maintains a sufficiently weak bond that can later be overcome by applying stresses to detach the useful layer from the donor substrate.
    • 公开了制备半导体组件的方法。 在一个实施方案中,该技术包括在其上提供支撑衬底和结合表面,提供施主衬底,其具有限定可用层的弱化区和在有用层上的结合表面,以及在有用层上提供预定材料的界面层 粘合表面,以在其上提供粘合表面。 该方法还包括将界面层的结合表面分别结合到支撑衬底或有用层中的另一个的接合表面,以在其之间形成可分离的接合界面,从而形成半导体组件,并对半导体组件进行热处理 达到至少1000〜1100℃的温度,而不会在界面层的接合面与支撑基板或有用层的另一方的接合面之间基本上增加分子接合,使得可分离的接合界面保持足够的 弱键可以随后通过施加应力来克服有用层与施主衬底的分离。