会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Methods for transferring a useful layer of silicon carbide to a receiving substrate
    • 将有用的碳化硅层转移到接收衬底的方法
    • US06974760B2
    • 2005-12-13
    • US10893192
    • 2004-07-15
    • Bruno GhyselenFabrice Letertre
    • Bruno GhyselenFabrice Letertre
    • H01L21/265H01L21/02H01L21/18H01L21/20H01L21/266H01L21/76H01L21/762H01L27/12H01L21/30
    • H01L21/02032H01L21/187H01L21/2007H01L21/26586H01L21/266H01L21/7602H01L21/76254
    • Methods for transferring a useful layer of silicon carbide to a receiving substrate are described. In an embodiment, the technique includes implanting at least H+ ions through a front face of a source substrate of silicon carbide with an implantation energy E greater than or equal to 95 keV and an implantation dose D chosen to form an optimal weakened zone near a mean implantation depth, the optimal weakened zone defining the useful layer and a remainder portion of the source substrate. The method also includes bonding the front face of the source substrate to a contact face of the receiving substrate, and detaching the useful layer from the remainder portion of the source substrate along the weakened zone while minimizing or avoiding forming an excess zone of silicon carbide material at the periphery of the useful layer that was not transferred to the receiving substrate during detachment. Such a method facilitates recycling the remainder portion of the source substrate.
    • 描述了将有用的碳化硅层转移到接收衬底的方法。 在一个实施例中,该技术包括将至少H + +离子注入到碳化硅源极基底的前面,其注入能量E大于或等于95keV,并且将植入剂量D选择为 在平均植入深度附近形成最佳弱化区,最佳弱化区限定有用层和源极衬底的剩余部分。 该方法还包括将源极基板的正面接合到接收基板的接触面,并且沿着弱化区域将有用层与源极基板的剩余部分分离,同时最小化或避免形成碳化硅材料的过剩区域 在有用层的外围,在分离期间未被转移到接收基板。 这种方法有助于再循环源极衬底的剩余部分。
    • 9. 发明授权
    • Method of fabricating a semiconductor hetero-structure
    • 制造半导体异质结构的方法
    • US07601611B2
    • 2009-10-13
    • US11147575
    • 2005-06-07
    • Ian CayrefourcqFabrice LetertreBruno Ghyselen
    • Ian CayrefourcqFabrice LetertreBruno Ghyselen
    • H01L21/30
    • H01L21/76254H01L21/76251
    • A method of fabricating a structure that includes at least one semiconductor material for applications in microelectronics, optoelectronics or optics. The method includes transferring, onto a support made of a first material, a thin monocrystalline layer made of a second material that differs from the first material, and performing a predetermined heat treatment carrying out at least one strengthening step on a bonding interface between the thin layer and the support. The thickness of the thin layer is selected as a function of the difference between the coefficients of thermal expansion of the first and second materials and as a function of parameters of predetermined heat treatment, such that the stresses exerted by the heat treatment on the assembly of the support and the transferred thin layer leaves the assembly intact. The method further includes depositing an additional thickness of the second material in the monocrystalline state on the thin layer to thicken it. The method is useful for fabrication of hetero-substrates with a relatively thick useful layer.
    • 一种制造包括用于微电子学,光电子学或光学学中的至少一种半导体材料的结构的方法。 该方法包括将由第一材料制成的支撑体转移到与第一材料不同的第二材料制成的薄单晶层上,并且进行至少一个加强步骤的预定热处理,该加强步骤在薄的 层和支持。 选择薄层的厚度作为第一和第二材料的热膨胀系数之间的差异的函数,并且作为预定热处理的参数的函数,使得通过热处理施加在组件上的应力 支撑和转移的薄层离开组件完好无损。 该方法还包括在薄层上沉积单晶状态的第二材料的附加厚度以使其变稠。 该方法可用于制造具有相对厚的有用层的异质衬底。