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1. 发明申请

US20070195691A1 Self-repair system and method for providing resource failure tolerance 有权
标题翻译：提供资源故障容忍的自我修复系统和方法
公开(公告)号：US20070195691A1
公开(公告)日：2007-08-23
申请号：US11357227
申请日：2006-02-17
申请人： Erik Volkerink , Alan Hart
发明人： Erik Volkerink , Alan Hart
IPC分类号： H04J1/16 , H04J3/14
CPC分类号： G06F11/2007 , G06F11/2025
摘要： A self-repair system provides resource failure tolerance using an interconnection network that provides interconnection information identifying connections between system resources, redundant resources and ports that are connectable to consumers of the system resources. A controller identifies both defective system resources and the affected sinks connected to the defective system resources from the interconnection network. The controller further identifies compatible resources from the system resources and redundant resources that are capable of replacing the defective system resources for each of the affected sinks from the interconnection network. The controller determines a respective cost associated with each of the compatible resources, and in response to the determined costs, selects at least one of the compatible resources as a replacement resource for each of the defective system resources. The controller further configures the interconnection network to connect the replacement resources to the affected ports instead of the defective system resources.
摘要翻译：自修复系统使用互连网络提供资源容错，其提供识别可连接到系统资源的消费者的系统资源，冗余资源和端口之间的连接的互连信息。控制器从互连网络识别连接到有缺陷的系统资源的有缺陷的系统资源和受影响的汇点。控制器还从系统资源和冗余资源中识别出能够从互连网络替换每个受影响的接收器的有缺陷的系统资源的兼容资源。控制器确定与每个兼容资源相关联的相应成本，并且响应于确定的成本，选择至少一个兼容资源作为每个缺陷系统资源的替换资源。控制器还配置互连网络以将替换资源连接到受影响的端口，而不是有缺陷的系统资源。

2. 发明申请

US20200234098A1 CORRELATED ASSET IDENTIFIER ASSOCIATION 审中-公开
公开(公告)号：US20200234098A1
公开(公告)日：2020-07-23
申请号：US16839048
申请日：2020-04-02
申请人： Erik Volkerink , Ajay Khoche
发明人： Erik Volkerink , Ajay Khoche
IPC分类号： G06K19/077 , B32B37/12 , B32B37/06 , C09J7/38 , H04W4/029 , G06K19/07 , G06K19/06
摘要： Systems, methods, and computer-readable data storage apparatus provide automated identification techniques that seamlessly and accurately bridge the differences between different identification systems to enable more useful and advanced product and service offerings, such as realtime tracking of shipment location and status.

3. 发明申请

US20190222055A1 ENERGY HARVESTING SENSING NODES 审中-公开
公开(公告)号：US20190222055A1
公开(公告)日：2019-07-18
申请号：US16359808
申请日：2019-03-20
申请人： Ajay Khoche , Erik Volkerink
发明人： Ajay Khoche , Erik Volkerink
IPC分类号： H02J7/32 , G01K1/02 , H04L29/08 , H02J7/02 , H02J50/10 , H01L35/02 , B60C23/04 , G06K19/07
CPC分类号： H02J7/32 , B60C23/0408 , G01K1/024 , G06K19/0704 , G06K19/0723 , H01L35/02 , H02J7/025 , H02J50/10 , H02N2/0075 , H04L67/12
摘要： The disclosure generally relates to wireless sensing nodes, energy harvesting, and energy charging. The disclosure also generally relates to reporting data gathered by the wireless sensing nodes to one or more network services.

4. 发明授权

US08797056B2 System and method for electronic testing of partially processed devices 有权
标题翻译：部分处理设备的电子测试系统和方法
公开(公告)号：US08797056B2
公开(公告)日：2014-08-05
申请号：US14003414
申请日：2011-03-22
申请人： Ajay Khoche , Erik Volkerink
发明人： Ajay Khoche , Erik Volkerink
IPC分类号： G01R31/20
CPC分类号： G01R31/2851 , G01R31/318513 , H01L22/14 , H01L22/20 , H01L25/0657 , H01L25/50 , H01L2224/16145 , H01L2224/48091 , H01L2225/06513 , H01L2225/06541 , H01L2225/06596 , H01L2924/00014
摘要： Systems and methods are provided for testing partially completed three-dimensional ICs. Example methods may incorporate one or more of the following features: design for testing (DFT); design for partial wafer test; design for partial probing; partial IC probecards; partial IC test equipment; partial IC quality determinations; partial IC test optimization; and partial test optimization. Other aspects may also be included. Systems and methods incorporating these features to test partially completed three-dimensional ICs may result in saved time and effort, and less scraped material, as the partial device is not built any further when a bad partial device is detected. This results in lower costs and higher yield.
摘要翻译：提供系统和方法用于测试部分完成的三维IC。示例性方法可以包括一个或多个以下特征：用于测试的设计（DFT）; 部分晶圆测试设计; 部分探测设计; 部分IC问题; 部分IC测试设备; 部分IC质量测定; 部分IC测试优化; 和部分测试优化。还可以包括其他方面。结合这些特征来测试部分完成的三维IC的系统和方法可以节省时间和精力，并且减少刮擦材料，因为当检测到不良部分装置时，部分装置不再进一步构建。这导致较低的成本和更高的产量。

5. 发明申请

US20070266288A1 Re-configurable architecture for automated test equipment 有权
标题翻译：自动化测试设备的可重构架构
公开(公告)号：US20070266288A1
公开(公告)日：2007-11-15
申请号：US11435064
申请日：2006-05-15
申请人： Erik Volkerink , Hugh Wallace , Klaus-Dieter Hilliges , Ajay Khoche , Jochen Rivoir
发明人： Erik Volkerink , Hugh Wallace , Klaus-Dieter Hilliges , Ajay Khoche , Jochen Rivoir
IPC分类号： G01R31/28
CPC分类号： G01R31/31907
摘要： An adaptive test system includes one or more reconfigurable test boards, with each test board including at least one re-configurable test processor. The re-configurable test processors can transmit communicate with one another using an inter-processor communications controller associated with each re-configurable test processor. The communications include configuration information, control information, communication protocols, stimulus data, and responses. Configuration information and stimulus data can also be read from a memory. Configuration information is used to configure one or more re-configurable test processors. Once configured, the re-configurable test processor or processors process the data in order to generate one or more test signals. The one or more test signals are then used to test a DUT.
摘要翻译：自适应测试系统包括一个或多个可重新配置的测试板，每个测试板包括至少一个可重新配置的测试处理器。可重新配置的测试处理器可以使用与每个可重新配置的测试处理器相关联的处理器间通信控制器彼此进行通信。通信包括配置信息，控制信息，通信协议，刺激数据和响应。还可以从存储器读取配置信息和激励数据。配置信息用于配置一个或多个可重新配置的测试处理器。一旦配置，可重新配置的测试处理器或处理器处理数据，以产生一个或多个测试信号。然后使用一个或多个测试信号来测试DUT。

6. 发明申请

US20200265288A1 Wireless Sensor Networks Installation, Deployment, Maintenance, and Operation 审中-公开
公开(公告)号：US20200265288A1
公开(公告)日：2020-08-20
申请号：US16857177
申请日：2020-04-24
申请人： Erik Volkerink , Ajay Khoche , Scott Filler
发明人： Erik Volkerink , Ajay Khoche , Scott Filler
IPC分类号： G06K19/077 , G06K19/06 , G06K19/07 , H04W4/029 , C09J7/38 , B32B37/06 , B32B37/12
摘要： The present disclosure relates to wireless sensor networks installation, deployment, maintenance, and operation. A distributed network of wireless tags enable a wide variety of different indoor and outdoor applications to be implemented, including asset finding, workflow automation, and internet-of-things applications. The physical premises environment may be any location in which there are persons, places or things to be monitored, tracked, sensed, or inventoried, or other defined space. The distributed network of wireless tags is associated with a wireless client device that enables a customer to configure and retrieve status data, event data, and sensor data from wireless tags and other components in the physical premises environment. Embodiments utilize different types of network nodes to collect data from the physical premises environment. Examples of the types of data that may be collected by the wireless tags include asset status information, event data, and sensor data.

7. 发明授权

US09335347B2 Method and apparatus for massively parallel multi-wafer test 有权
标题翻译：用于大规模并行多晶片测试的方法和装置
公开(公告)号：US09335347B2
公开(公告)日：2016-05-10
申请号：US13609154
申请日：2012-09-10
申请人： John W. Andberg , Ira H. Leventhal , Matthew W. Losey , Yohannes Desta , Lakshmikanth Namburi , Vincent E. Lopopolo , Sanjeev Grover , Erik Volkerink
发明人： John W. Andberg , Ira H. Leventhal , Matthew W. Losey , Yohannes Desta , Lakshmikanth Namburi , Vincent E. Lopopolo , Sanjeev Grover , Erik Volkerink
IPC分类号： G01R31/28 , G01R1/04 , G01R1/073 , G01R35/00
CPC分类号： G01R1/073 , G01R1/0408 , G01R31/2891 , G01R31/2893 , G01R35/005
摘要： Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.
摘要翻译：本文公开了一种成本有效，高效，大规模并行的多晶圆测试电池。此外，该测试单元可用于单触地板和多触地应用。本发明使用新颖的“分离式墨盒”设计，结合将晶片与探针卡组件分离时对准的方法，以创建成本有效的，高效的多晶圆测试单元。可以在墨盒内使用“探针卡停止”设计，以简化总体墨盒的设计和操作。

8. 发明授权

US07590903B2 Re-configurable architecture for automated test equipment 有权
标题翻译：自动化测试设备的可重构架构
公开(公告)号：US07590903B2
公开(公告)日：2009-09-15
申请号：US11435064
申请日：2006-05-15
申请人： Erik Volkerink , Hugh S. C. Wallace , Klaus-Dieter Hilliges , Ajay Khoche , Jochen Rivoir
发明人： Erik Volkerink , Hugh S. C. Wallace , Klaus-Dieter Hilliges , Ajay Khoche , Jochen Rivoir
IPC分类号： G01R31/28 , G11C29/00 , G06F11/00
CPC分类号： G01R31/31907
摘要： An adaptive test system includes one or more reconfigurable test boards, with each test board including at least one re-configurable test processor. The re-configurable test processors can transmit communicate with one another using an inter-processor communications controller associated with each re-configurable test processor. The communications include configuration information, control information, communication protocols, stimulus data, and responses. Configuration information and stimulus data can also be read from a memory. Configuration information is used to configure one or more re-configurable test processors. Once configured, the re-configurable test processor or processors process the data in order to generate one or more test signals. The one or more test signals are then used to test a DUT.
摘要翻译：自适应测试系统包括一个或多个可重新配置的测试板，每个测试板包括至少一个可重新配置的测试处理器。可重新配置的测试处理器可以使用与每个可重新配置的测试处理器相关联的处理器间通信控制器彼此进行通信。通信包括配置信息，控制信息，通信协议，刺激数据和响应。还可以从存储器读取配置信息和激励数据。配置信息用于配置一个或多个可重新配置的测试处理器。一旦配置，可重新配置的测试处理器或处理器处理数据，以产生一个或多个测试信号。然后使用一个或多个测试信号来测试DUT。

9. 发明授权

US10819137B2 Energy harvesting wireless sensing system 有权
公开(公告)号：US10819137B2
公开(公告)日：2020-10-27
申请号：US16359808
申请日：2019-03-20
申请人： Ajay Khoche , Erik Volkerink
发明人： Ajay Khoche , Erik Volkerink
IPC分类号： G06K19/07 , H02J7/32 , G01K1/02 , H04L29/08 , H02J7/02 , H01L35/02 , B60C23/04 , H02J50/10 , H02N2/00
摘要： The disclosure generally relates to wireless sensing nodes, energy harvesting, and energy charging. The disclosure also generally relates to reporting data gathered by the wireless sensing nodes to one or more network services.

10. 发明授权

US07707468B2 System and method for electronic testing of multiple memory devices 有权
标题翻译：用于多个存储器件的电子测试的系统和方法
公开(公告)号：US07707468B2
公开(公告)日：2010-04-27
申请号：US11726542
申请日：2007-03-22
申请人： Erik Volkerink , Duncan Gurley
发明人： Erik Volkerink , Duncan Gurley
IPC分类号： G11C29/00
CPC分类号： G11C29/08 , G11C5/04 , G11C2029/0401 , G11C2029/2602
摘要： A testing device may include a memory controller managing a transfer of data; and a plurality of interface boards. Each interface board includes a controller buffer. Each controller buffer transfers data between the memory controller and at least one memory module. The memory controller tests the at least one memory module. The testing device is operable to test the at least one memory module independent of an operating rate of the at least one memory module. The memory controller receives operating data of the at least one memory module.
摘要翻译：测试设备可以包括管理数据传送的存储器控制器; 和多个接口板。每个接口板包括控制器缓冲区。每个控制器缓冲器在存储器控制器和至少一个存储器模块之间传送数据。存储器控制器测试至少一个存储器模块。测试设备可操作以独立于至少一个存储器模块的操作速率来测试所述至少一个存储器模块。存储器控制器接收至少一个存储器模块的操作数据。

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