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    • 3. 发明申请
    • ANALYSING SPECTRAL DATA FOR THE SELECTION OF A CALIBRATION MODEL
    • 分析用于选择校准模型的光谱数据
    • US20110071807A1
    • 2011-03-24
    • US12736929
    • 2009-05-06
    • Philippe HubertEric ZiemonsFrançois Moonen
    • Philippe HubertEric ZiemonsFrançois Moonen
    • G06F17/10
    • G01N21/274G01N21/3554G01N21/359G01N2201/129
    • The invention relates to a method of analyzing spectral data for the selection of a calibration model, relating spectra of a substance to a physical or chemical parameter of the substance, over a predetermined range of the physical or chemical parameter, comprising the steps: a) capturing spectral data of the substance with respective values of the physical or chemical parameter over the predetermined range, b) creating a plurality of calibration models using the captured spectral data in dependence upon the values of the physical or chemical parameter based on the calibration data using statistical resampling methods, c) calculating tolerance intervals of the results at each reference level for each calibration model, and d) displaying the tolerance intervals at each reference level over the predetermined range for each calibration model. In this way, a possibility for analyzing spectra data is provided which is useful in spectroscopic applications for automated calibration model selection and makes analytical interpretation and evaluation easier and more accurate.
    • 本发明涉及一种分析用于选择校准模型的光谱数据的方法,所述校准模型在物理或化学参数的预定范围内将物质的光谱与物质的物理或化学参数相关联,包括以下步骤:a) 以预定范围的物理或化学参数的相应值捕获物质的光谱数据; b)使用所捕获的光谱数据,根据基于校准数据的物理或化学参数的值,使用所捕获的光谱数据创建多个校准模型,所述校准模型使用 统计重采样方法,c)计算每个校准模型的每个参考水平处的结果的容差间隔,以及d)在每个校准模型的预定范围上显示每个参考水平的公差间隔。 以这种方式,提供了分析光谱数据的可能性,其在用于自动校准模型选择的光谱应用中是有用的,并且使分析解释和评估更容易和更准确。
    • 7. 发明授权
    • Analyzing spectral data for the selection of a calibration model
    • 分析校准模型选择的光谱数据
    • US08494818B2
    • 2013-07-23
    • US12736929
    • 2009-05-06
    • Philippe HubertEric ZiemonsFrançois Moonen
    • Philippe HubertEric ZiemonsFrançois Moonen
    • G06F17/10
    • G01N21/274G01N21/3554G01N21/359G01N2201/129
    • The invention relates to a method of analyzing spectral data for the selection of a calibration model, relating spectra of a substance to a physical or chemical parameter of the substance, over a predetermined range of the physical or chemical parameter, comprising the steps: a) capturing spectral data of the substance with respective values of the physical or chemical parameter over the predetermined range, b) creating a plurality of calibration models using the captured spectral data in dependence upon the values of the physical or chemical parameter based on the calibration data using statistical resampling methods, c) calculating tolerance intervals of the results at each reference level for each calibration model, and d) displaying the tolerance intervals at each reference level over the predetermined range for each calibration model. In this way, a possibility for analyzing spectra data is provided which is useful in spectroscopic applications for automated calibration model selection and makes analytical interpretation and evaluation easier and more accurate.
    • 本发明涉及一种分析用于选择校准模型的光谱数据的方法,所述校准模型在物理或化学参数的预定范围内将物质的光谱与物质的物理或化学参数相关联,包括以下步骤:a) 以预定范围的物理或化学参数的相应值捕获物质的光谱数据; b)使用所捕获的光谱数据,根据基于校准数据的物理或化学参数的值,使用所捕获的光谱数据创建多个校准模型,所述校准模型使用 统计重采样方法,c)计算每个校准模型的每个参考水平处的结果的容差间隔,以及d)在每个校准模型的预定范围上显示每个参考水平的公差间隔。 以这种方式,提供了分析光谱数据的可能性,其在用于自动校准模型选择的光谱应用中是有用的,并且使分析解释和评估更容易和更准确。