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2. 发明申请

US20030135343A1 Methods and apparatus for testing electronic devices 有权
标题翻译：用于测试电子设备的方法和装置
公开(公告)号：US20030135343A1
公开(公告)日：2003-07-17
申请号：US10047506
申请日：2002-01-15
申请人： EAGLE TEST SYSTEMS, INC.
发明人： Gordon M. Samuelson , Jack Edward Weimer
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/2841
摘要： Apparatus for testing an electronic device under a plurality of test conditions created during a test sequence includes an arbitrary waveform generator that sequentially generates the plurality of test conditions. The test conditions include selectively forcing voltage or forcing current over a wide range of amplitudes, measuring a plurality of results with various resolutions and at selected times during the test sequence, changing filter settings, gains and other parameters. The test conditions are selected and set under the control of a system clock using data stored in memory. A controller initiates the test sequence of the apparatus and determines whether measured results are within predetermined specifications. The controller uses processor-driven software, but the settings of the test apparatus are changed at predetermined times during the test sequence, without controller intervention. Several test apparatus are typically managed by one controller. Performing test sequences without controller intervention reduces the time required for testing.
摘要翻译：用于在测试序列期间产生的多个测试条件下测试电子设备的装置包括顺序产生多个测试条件的任意波形发生器。测试条件包括在宽范围的幅度上选择性地强制电压或强制电流，以各种分辨率测量多个结果，并且在测试序列期间的选定时间，改变滤波器设置，增益和其它参数。使用存储在存储器中的数据在系统时钟的控制下选择和设置测试条件。控制器启动设备的测试顺序，并确定测量结果是否在预定规格内。控制器使用处理器驱动的软件，但是在测试序列期间，测试设备的设置在预定的时间被改变，而无需控制器干预。一些测试装置通常由一个控制器管理。执行测试序列而无需控制器干预可以减少测试所需的时间。

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