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1. 发明专利

CZ3255U1 Circuit vector analyzer 未知
公开(公告)号：CZ3255U1
公开(公告)日：1995-06-14
申请号：CZ320994
申请日：1994-11-25
申请人： HOFFMANN KAREL DOC ING CSC , SKVOR ZBYNEK ING CSC
发明人： HOFFMANN KAREL DOC ING CSC , SKVOR ZBYNEK ING CSC
IPC分类号： G01R27/28 , G01R29/00 , H04B3/46 , H04B3/493 , H04L1/24 , G01R027/28 , G01R029/00 , H04B003/46 , H04L001/24

2. 发明申请

WO2003067275A3 MOISTURE AND DENSITY DETECTOR (MDD) 审中-公开
公开(公告)号：WO2003067275A3
公开(公告)日：2003-08-14
申请号：PCT/US2003/003317
申请日：2003-02-04
申请人： MISSISSIPPI STATE UNIVERSITY
发明人： STEELE, Philip, H. , COOPER, Jerome, E.
IPC分类号： G01R027/28
摘要： A Moisture and Density Detector (MDD) to determine the moisture content and/or density of any dielectric material (130) for various purposes. This device is very useful in detecting the moisture content (MC) of wood and wood-based materials, such as that of lumber in a dry kiln prior to, during and/or following drying. The MDD passes a radio frequency signal (105) between opposed or adjacent capacitance electrodes (110, 120) and measures the signal strength and phase shift of the signal. The addition of phase shift and multiple frequencies improves the accuracy of the results.

3. 发明申请

WO2003067275A2 MOISTURE AND DENSITY DETECTOR (MDD) 审中-公开
标题翻译：水分和密度检测仪（MDD）
公开(公告)号：WO2003067275A2
公开(公告)日：2003-08-14
申请号：PCT/US2003/003317
申请日：2003-02-04
申请人： MISSISSIPPI STATE UNIVERSITY
发明人： STEELE, Philip, H. , COOPER, Jerome, E.
IPC分类号： G01R027/28
CPC分类号： G01N9/24 , G01N22/04
摘要： A Moisture and Density Detector (MDD) that provides a method and apparatus to determine the moisture content and/or density of any dielectric material for various purposes. This device is very useful in detecting the moisture content (MC) of wood and wood-based materials, such as that of lumber in a dry kiln prior to, during and/or following drying. The MDD passes a radio frequency signal between opposed or adjacent capacitance electrodes and measures the signal strength and phase shift of the signal. The addition of phase shift and multiple frequencies improves the accuracy of the results.
摘要翻译：用于确定用于各种目的的任何介电材料（130）的水分含量和/或密度的水分和密度检测器（MDD）。该装置在检测木材和木质材料（例如在干燥之前，之中和/或之后的干燥窑中的木材的水分含量（MC））非常有用。 MDD通过相对或相邻电容电极（110,120）之间的射频信号（105），并测量信号的信号强度和相移。相移和多个频率的增加提高了结果的准确性。

4. 发明申请

US20040257092A1 Method and a test setup for measuring large-signal S-parameters 有权
标题翻译：测量大信号S参数的方法和测试设置
公开(公告)号：US20040257092A1
公开(公告)日：2004-12-23
申请号：US10856841
申请日：2004-06-01
发明人： Jan Verspecht
IPC分类号： G01R027/04 , G01R027/32 , G01R027/28
CPC分类号： G01R27/28
摘要： The values of the parameters of a large-signal S-parameter model of a device-under-test are determined by using a frequency-offset probe-tone method and by measuring and processing the spectral components of the scattered voltage waves with frequencies equal to the fundamental frequency, the fundamental frequency plus the said frequency offset and the fundamental frequency minus the said frequency offset. The resulting large-signal S-parameter model accurately and completely describes the amplifier nonlinear behavior with a large one-tone excitation at the input in a near matched environment at the output.
摘要翻译：通过使用频率偏移探测色调方法来确定被测器件的大信号S参数模型的参数值，并且通过测量和处理频率等于的频率的散射电压波的频谱分量来确定基频，基频加所述频偏和基频减去所述频偏。所得到的大信号S参数模型准确且完整地描述了在输出处的近匹配环境中的输入处具有大的单音激励的放大器非线性行为。

5. 发明申请

US20040249608A1 System and method for detecting defects in a thin-film-transistor array 审中-公开
标题翻译：用于检测薄膜晶体管阵列中的缺陷的系统和方法
公开(公告)号：US20040249608A1
公开(公告)日：2004-12-09
申请号：US10641151
申请日：2003-08-15
申请人： YieldBoost Tech, Inc.
发明人： Kyo Young Chung
IPC分类号： G06F019/00 , G01R027/28
CPC分类号： G09G3/006 , H04N17/04
摘要： A system and method for detecting a defect in a transistor array includes applying a test signal to the array, monitoring pixel voltage along a gate line of the array, and detecting a defect associated with the gate line based on a variation in the pixel voltage during the monitoring step. The defect may be a short between the gate line and a common line of the array. The gate line and common line may be associated with a same pixel element or different pixel elements. The system and method also detect a precise location of the defect based on a rate of change in the variation of the pixel voltage along the gate line. The rate of change may be measured in any one of a variety of ways. For example, the rate of change may be measured as a sudden increase or increase of the pixel voltage or as a change in slope of a pixel voltage profile. Alternatively, the location of the defect may be detected as corresponding to a minimum or maximum value in a pixel voltage profile. The transistor array may be a TFT array or another circuit which includes an array of transistors.
摘要翻译：一种用于检测晶体管阵列中的缺陷的系统和方法，包括：向阵列施加测试信号，监测沿着阵列的栅极线的像素电压，以及基于像素电压的变化来检测与栅极线相关的缺陷监控步骤。缺陷可能是栅极线和阵列的公共线之间的短路。栅极线和公共线可以与相同的像素元件或不同的像素元件相关联。该系统和方法还基于沿着栅极线的像素电压的变化的变化率来检测缺陷的精确位置。变化率可以以各种方式中的任何一种来测量。例如，变化率可以被测量为像素电压的突然增加或增加，或像素电压分布的斜率的变化。或者，可以将像素电压分布中的最小值或最大值相应地检测缺陷的位置。晶体管阵列可以是TFT阵列或包括晶体管阵列的另一电路。

6. 发明申请

US20040217764A1 Electronic component characteristic measuring device 有权
标题翻译：电子元件特征测量装置
公开(公告)号：US20040217764A1
公开(公告)日：2004-11-04
申请号：US10486380
申请日：2004-02-10
发明人： Yoshikazu Sasaoka
IPC分类号： G01R027/28 , G01R027/32
CPC分类号： G01R1/0408 , G01R31/022
摘要： An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof includes a holder that holds an electronic component with the first and second external terminal electrodes pointing toward first and second open ends of a receiving cavity. The holder is provided with a shield layer extending between first and second measuring terminals, and the shield layer is electrically connected to a measurement reference potential. The shield layer reduces the stray parasitic capacitance adjacent to the electronic component, and reduces measurement errors resulting from size variations of the electronic component.
摘要翻译：一种用于测量在其第一和第二相对端处具有第一和第二外部端子电极的片状电子部件的电气特性的装置，包括保持器，其保持电子部件，其中第一和第二外部端子电极指向第一和第二开路接收腔的端部。保持器设置有在第一和第二测量端子之间延伸的屏蔽层，并且屏蔽层电连接到测量参考电位。屏蔽层减小了与电子部件相邻的杂散寄生电容，并减少了由电子部件的尺寸变化引起的测量误差。

7. 发明申请

US20040159154A1 Product having a sensor and a surface acoustic wave element, as well as a method and arrangement for determining a measurement variable, which corresponds to a reactance, by a sensor 失效
标题翻译：具有传感器和表面声波元件的产品，以及用于通过传感器确定对应于电抗的测量变量的方法和装置
公开(公告)号：US20040159154A1
公开(公告)日：2004-08-19
申请号：US10780051
申请日：2004-02-17
发明人： Franz Dollinger , Gernot Schimetta
IPC分类号： G01H011/08 , H01L041/107 , G01H011/06 , G01R027/28
CPC分类号： H03H9/6406 , B60C23/0408 , G01D5/48 , G01K7/34
摘要： The product comprises a sensor (1) via which a measured quantity that corresponds to a reactive resistance can be furnished within a measuring range. The product also comprises a matching network (2) and a surface wave element (3). The sensor (1) is connected to a first reflector (4) of the surface wave element (3) via the matching network (2). The first reflector (4) forms, together with the matching network (2) and the sensor (1), a resonator which, for a value of the measured quantity within the measuring range, has a resonance with regard to a reflection of an acoustic surface wave on the first reflector (4). The invention also relates to a method for determining the measured quantity and to a corresponding system.
摘要翻译：产品包括传感器（1），通过该传感器可以在测量范围内提供对应于无功电阻的测量量。该产品还包括匹配网络（2）和表面波元件（3）。传感器（1）经由匹配网络（2）连接到表面波元件（3）的第一反射器（4）。第一反射器（4）与匹配网络（2）和传感器（1）一起形成谐振器，对于测量范围内的测量量的值，相对于声学的反射具有谐振表面波在第一反射器（4）上。本发明还涉及一种用于确定测量量的方法和相应的系统。

8. 发明申请

US20030220759A1 Fail analyzer 审中-公开
标题翻译：故障分析仪
公开(公告)号：US20030220759A1
公开(公告)日：2003-11-27
申请号：US10297699
申请日：2003-06-02
发明人： Takeshi Katayama
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G11C29/56016 , G11C29/56 , G11C2029/5604
摘要： It is an object of the invention to provide a fail analyzer that can reduce the time and effort required for printing or editing of fail analysis result. A printing item setting section 22 sets the various detailed items, including the resolution of the printer 60 and the like, required for printing. A print data generation section 20 generates print data including a general purpose data format while taking account of the resolution. The print data is sent to the printer 60 and then printed on specified sheet. Alternatively, the print data is output as a file and then stored in an analysis result data storing section 40.
摘要翻译：本发明的目的是提供一种故障分析器，其可以减少打印或编辑失败分析结果所需的时间和精力。打印项目设置部分22设置打印所需的各种详细项目，包括打印机60的分辨率等。打印数据生成部分20在考虑分辨率的情况下生成包括通用数据格式的打印数据。打印数据被发送到打印机60，然后打印在指定的纸张上。或者，打印数据作为文件输出，然后存储在分析结果数据存储部分40中。

9. 发明申请

US20030204354A1 Apparatus and method for determining effect of on-chip noise on signal propagation 失效
公开(公告)号：US20030204354A1
公开(公告)日：2003-10-30
申请号：US10443552
申请日：2003-05-22
发明人： William E. Corr
IPC分类号： G06F019/00 , G01R027/28 , G01R031/00 , G01R031/14
CPC分类号： G01R31/318522 , G01R31/3016 , G01R31/31853 , G01R31/3187 , G01R31/31937
摘要： The invention relates to an integrated circuit testing apparatus having a first test circuit producing a signal for determining at least one of an operating reference signal and a substrate coupling effect on a plurality of components within the integrated circuit; a second test circuit producing a signal for determining at least one of a cross-talk effect on the plurality of components and the accuracy of an interconnect capacitance extraction value; a third test circuit producing a signal for determining at least one of an effect of system noise on the operational speed of the plurality of components and a maximum degradation expected for a logic path between the plurality of components; and a fourth test circuit producing a signal for determining an effect of power supply noise on a signal propagation delay within the plurality of components. Methods of operating such a testing apparatus are also disclosed.

10. 发明申请

US20030179000A1 Position and electromagnetic field sensor 有权
标题翻译：位置和电磁场传感器
公开(公告)号：US20030179000A1
公开(公告)日：2003-09-25
申请号：US10221543
申请日：2003-01-16
发明人： John Francis Gregg
IPC分类号： G01R027/28
CPC分类号： G01D5/2013 , G01D5/202 , G01V3/101
摘要： A position and electromagnetic field sensor is provided. The sensor relies upon an oscillator such as a Robinson marginal oscillator to generate an rf or microwave electromagnetic field. As an inhomogeneously shaped object, such as a metallic toothed wheel, for example, moves through the resultant field, the field experiences a change in electric or magnetic susceptibility. This in turn causes energy losses in the oscillator the magnitude of which can be output as a d.c. signal related thereto. To detect non-moving objects which nevertheless generate an electromagnetic field or have attached to them a source thereof, the sensor also includes a giant or colossal magnetoresistive structure located adjacent the oscillator coil, the structure having an imaginary magnetic susceptibility which is strongly dependent upon the magnitude and direction of the field generated by or at the object to be sensed.
摘要翻译：提供了位置和电磁场传感器。传感器依靠诸如罗宾逊边缘振荡器的振荡器来产生射频或微波电磁场。作为非均匀形状的物体，例如金属齿轮，例如移动通过合成的场，则该场经历电磁化或磁化率的变化。这反过来又引起振荡器的能量损失，其幅度可以直接输出。信号相关。为了检测仍然产生电磁场或附着于其源的非移动物体，传感器还包括位于振荡器线圈附近的巨大或巨大的磁阻结构，该结构具有假想的磁化率，其强烈依赖于由待检测物体或由待检测物体产生的场的大小和方向。

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