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    • 2. 发明授权
    • Apparatus and method for controlling temperature in a wafer using integrated temperature sensitive diode
    • 使用集成温度敏感二极管控制晶片温度的装置和方法
    • US06545494B1
    • 2003-04-08
    • US09612667
    • 2000-07-10
    • Douglas S. OlsenDavid Stura
    • Douglas S. OlsenDavid Stura
    • G01R3102
    • G05D23/20G01R31/2891G05D23/1934
    • An apparatus and method for controlling temperature in a wafer on a wafer chuck includes a temperature sensing device, such as a temperature sensitive diode, integrally formed in the wafer. A sensing circuit senses a signal from the diode indicative of temperature of the wafer. The sensing circuit can be part of a testing circuit in a wafer prober being used to test integrated circuits on the wafer. The sensing circuit sends a control signal to a temperature control system used to control the temperature of the chuck. In response to the control signal, the temperature control system controls the temperature of the chuck at a desired temperature to control the temperature of the wafer. The wafer can include multiple integrated circuit die, and each circuit can include its own temperature sensing diode. As a result, extremely accurate and individualized temperature testing can be performed on each integrated circuit on the wafer.
    • 用于控制晶片卡盘上的晶片温度的装置和方法包括一体地形成在晶片中的诸如温度敏感二极管的温度感测装置。 感测电路感测来自二极管的指示晶片温度的信号。 感测电路可以是用于测试晶片上的集成电路的晶圆探测器中的测试电路的一部分。 感测电路将控制信号发送到用于控制卡盘温度的温度控制系统。 响应于控制信号,温度控制系统将卡盘的温度控制在期望的温度以控制晶片的温度。 晶片可以包括多个集成电路管芯,并且每个电路可以包括其自己的温度感测二极管。 因此,可以对晶片上的每个集成电路进行非常精确和个性化的温度测试。
    • 5. 发明授权
    • Wafer chuck having thermal plate with interleaved heating and cooling elements
    • 晶圆卡盘具有带有交错加热和冷却元件的热板
    • US06969830B2
    • 2005-11-29
    • US10465716
    • 2003-06-19
    • Kenneth M. Cole, Sr.William M. StoneDouglas S. Olsen
    • Kenneth M. Cole, Sr.William M. StoneDouglas S. Olsen
    • H05B3/18C23C16/00G01R31/28H01L21/00H01L21/02H01L21/66H01L21/683H01L21/687H05B3/70H01B3/68C27C16/00
    • H01L21/67109G01R31/2891H01L21/67103H01L21/68785
    • A workpiece chuck includes a thermal plate assembly which includes both heating and cooling capability. The heating element can be a resistive heater in a coiled configuration disposed in a plane. The cooling can be performed via a cooling fluid circulated through cooling tubes which are also disposed in a coiled configuration in a plane. The plane of the heating element and the cooling tubes can be the same plane, and that plane can be a center plane of the thermal plate assembly. By locating the heating and cooling in the same plane, uniform heating and cooling are achieved. Also, by locating the heating element and cooling tubes in the center of the thermal plate, distortions such as doming and dishing in the thermal plate are eliminated such that the wafer can be held extremely flat on the chuck. The heating element and cooling tubes are coiled in an interleaved fashion to provide uniform heating and cooling while allowing them to simultaneously occupy the same plane.
    • 工件卡盘包括包括加热和冷却能力的热板组件。 加热元件可以是布置在平面中的盘绕构造的电阻加热器。 冷却可以通过冷却管循环的冷却流体进行,冷却管也被设置在平面内的盘绕结构中。 加热元件和冷却管的平面可以是相同的平面,并且该平面可以是热板组件的中心平面。 通过将加热和冷却定位在同一平面上,实现均匀的加热和冷却。 此外,通过将加热元件和冷却管定位在热板的中心,消除了热板中的翘曲和凹陷等变形,使得晶片能够在卡盘上保持非常平坦。 加热元件和冷却管以交错方式盘绕,以提供均匀的加热和冷却,同时允许它们同时占据同一平面。