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    • 4. 发明申请
    • Repair bits for a low voltage cache
    • 修复低电压缓存的位
    • US20070168836A1
    • 2007-07-19
    • US11322988
    • 2005-12-30
    • Morgan DempseyJose Maiz
    • Morgan DempseyJose Maiz
    • G11C29/00
    • G11C29/808G11C15/00
    • A method and apparatus for repairing cache memories/arrays is described herein. A cache includes a plurality of lines and logically viewable in columns. A repair cache coupled to the cache includes a repair bit mapped to each logically viewable column. A repair module determines a bad bit to be repaired within a column based on any individual or combination of factors, such as the number of errors per line of the cache, the number of errors correctable per line of the cache due to error correction code (ECC), the failure rate of bits, or other considerations. The bad bit is transparently repaired by the repair bit mapped to the column including the bad bit, upon an access to a cache line including the bad bit.
    • 本文描述了用于修复高速缓冲存储器/阵列的方法和装置。 缓存包括多个行,并且可以在列中逻辑地查看。 耦合到高速缓存的修复缓存包括映射到每个逻辑可见列的修复位。 修复模块基于任何个体或因素组合来确定在列内修复的坏位,例如每个高速缓存行的错误数量,由于错误校正码每行高速缓存可纠错的数量( ECC),位的故障率或其他考虑。 在访问包括坏位的高速缓存行时,坏位被映射到包括坏位的列的修复位透明地修复。
    • 7. 发明申请
    • Process charging and electrostatic damage protection in silicon-on-insulator technology
    • 硅绝缘体技术中的工艺充电和静电损伤保护
    • US20080105925A1
    • 2008-05-08
    • US11593706
    • 2006-11-03
    • Sangwoo PaeJose Maiz
    • Sangwoo PaeJose Maiz
    • H01L27/12
    • H01L27/1203H01L21/84H01L27/1207
    • A SOI device features a conductive pathway between active SOI devices and a bulk SOI substrate. The conductive pathway provides the ability to sink plasma-induced process charges into a bulk substrate in the event of process charging, such as interlayer dielectric deposition in a plasma environment, plasma etch deposition, or other fabrication provides. A method is also disclosed which includes dissipating electrostatic and process charges from a top of a SOI device to the bottom of the device. The top and bottom of the SOI device may characterize a region of active devices and a semiconductor method respectively. The method further includes a single masking step to create seed regions for an epitaxial-silicon pathway.
    • SOI器件在有源SOI器件和体SOI衬底之间具有导电通路。 导电通路提供了在处理充电的情况下(例如等离子体环境中的层间电介质沉积,等离子体蚀刻沉积或其它制造提供)将等离子体诱导的工艺电荷吸收到体衬底中的能力。 还公开了一种方法,其包括将静电和处理电荷从SOI器件的顶部消散到器件的底部。 SOI器件的顶部和底部可分别表征有源器件的区域和半导体方法。 该方法还包括单个掩模步骤以产生外延硅通路的种子区域。