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    • 1. 发明申请
    • X-Ray Examination Apparatus and Radiation Detector
    • X射线检查仪和放射检测仪
    • US20070272871A1
    • 2007-11-29
    • US11568271
    • 2005-04-25
    • Dirk SchaferGeorg RoseJens WiegertMichael OverdickWalter Rutten
    • Dirk SchaferGeorg RoseJens WiegertMichael OverdickWalter Rutten
    • G01T1/24
    • H04N5/32
    • The invention relates to an X-ray detector (1) with an array (2) of sensor elements (21), wherein each row (i) of sensor elements is connected via an addressing line to an addressing unit (5), and wherein each column j) of sensor elements is connected via a read-out line to a read-out unit (3). In the read-out unit (3), sensor signals are preprocessed, for example amplified by amplifiers (31). The detector further comprises a control unit (6) which is adapted to set the gains of said amplifiers (31) for each column (j) and each row (i) individually. The values of the gains may particularly be derived from a priori knowledge, from previous images of the object, or from the image signals of rows that have already been read out.
    • 本发明涉及具有传感器元件(21)阵列(2)的X射线检测器(1),其中传感器元件的每一行(i)经由寻址线连接到寻址单元(5),并且其中 传感器元件的每个列j)经由读出线连接到读出单元(3)。 在读出单元(3)中,传感器信号被预处理,例如由放大器(31)放大。 检测器还包括控制单元(6),该控制单元适于为每个列(j)和每一行(i)分别设置所述放大器(31)的增益。 增益的值可以特别地从先验知识,从对象的先前图像,或者已经被读出的行的图像信号导出。
    • 2. 发明授权
    • X-ray examination apparatus and radiation detector
    • X射线检查仪和放射线检测仪
    • US07408166B2
    • 2008-08-05
    • US11568271
    • 2005-04-25
    • Dirk SchaferGeorg RoseJens WiegertMichael OverdickWalter Rutten
    • Dirk SchaferGeorg RoseJens WiegertMichael OverdickWalter Rutten
    • G01J1/24
    • H04N5/32
    • The invention relates to an X-ray detector (1) with an array (2) of sensor elements (21), wherein each row (i) of sensor elements is connected via an addressing line to an addressing unit (5), and wherein each column j) of sensor elements is connected via a read-out line to a read-out unit (3). In the read-out unit (3), sensor signals are preprocessed, for example amplified by amplifiers (31). The detector further comprises a control unit (6) which is adapted to set the gains of said amplifiers (31) for each column (j) and each row (i) individually. The values of the gains may particularly be derived from a priori knowledge, from previous images of the object, or from the image signals of rows that have already been read out.
    • 本发明涉及具有传感器元件(21)阵列(2)的X射线检测器(1),其中传感器元件的每一行(i)经由寻址线连接到寻址单元(5),并且其中 传感器元件的每个列j)经由读出线连接到读出单元(3)。 在读出单元(3)中,传感器信号被预处理,例如由放大器(31)放大。 检测器还包括控制单元(6),该控制单元适于为每个列(j)和每一行(i)分别设置所述放大器(31)的增益。 增益的值可以特别地从先验知识,从对象的先前图像,或者已经被读出的行的图像信号导出。
    • 6. 发明申请
    • Method of reading out the sensor elements of a sensor, and a sensor
    • US20050218332A1
    • 2005-10-06
    • US11142767
    • 2005-06-01
    • Walter RuttenFalko BusseNorbert Conrads
    • Walter RuttenFalko BusseNorbert Conrads
    • G01T1/20G01T1/24G01T1/29H01L27/14H01L31/09H04N5/32H04N5/347H04N5/374H04N7/18G01J1/00H01L25/00H01L27/00
    • H04N5/32H01L2924/0002H04N5/347H04N5/374H01L2924/00
    • The invention relates to a method of reading out the sensor elements of a sensor (1) with a matrix of light-sensitive or X-ray-sensitive sensor elements (S1,2; S1,2 . . . ) which are arranged in rows and columns and generate charges in dependence on the incident quantity of radiation, the switches (3) of the relevant sensor elements being activated via address lines (4, . . . , 8, . . . ) and the charges of the respective activated sensor elements being drained via read-out lines (9, 10, 11, . . . ) so as to be processed further by way of amplifiers (14, . . . , 18, . . . ) and transfer means (19). The invention also relates to a corresponding sensor as well as to an X-ray examination apparatus which includes an X-ray source for emitting an X-ray beam for irradiating an object in order to form an X-ray image, as well as a detector for generating an electrical image signal from said X-ray image. Despite the small incident X-ray doses, adequate amounts of charge, and hence electrical signals, are provided so as to form the image in that ingoing address lines (4, . . . , 8, . . . ) are selectably connected, by way of individually controllable switch elements (27, . . . , 30, . . . ) and by means of a switching operation, to each time the respective next address line and the sensor elements of at least two neighboring lines are activated by means of one ingoing signal, and corresponding outgoing read-out lines (9, . . . , 13, . . . ) are selectably connected, by way of individually controllable switch elements (31, . . . , 34, . . . ) and by means of a switching operation, to the respective next read-out line in such a manner that the charge signals read out from the activated sensor elements of at least two neighboring columns are combined so as to form one output signal.
    • 8. 发明申请
    • Circuit for addressing electronic units
    • 用于寻址电子单元的电路
    • US20070080916A1
    • 2007-04-12
    • US10578446
    • 2004-11-04
    • Augusto NascettiWalter Rutten
    • Augusto NascettiWalter Rutten
    • G09G3/36
    • H04N5/374
    • The invention relates to an addressing circuit for an array arrangement (100) of electronic units (101), which may be, for example, pixels of an X-ray detector. Every pixel (101) is connected to a spatially adjacent shift register (110), the shift registers (110) being connected in turn column-wise in series and also being connected to a common clock line (111,114). A trigger signal fed via an external trigger line (113) is passed by the shift registers (110) from row to row for every clock signal on the clock lines (111,114). In this process, triggered shift registers (110) activate the associate pixels (101) so that they can be read out via read-out lines (105) that extend column-wise.
    • 本发明涉及一种用于电子单元(101)的阵列布置(100)的寻址电路,其可以是例如X射线检测器的像素。 每个像素(101)连接到空间相邻的移位寄存器(110),移位寄存器(110)依次串联连接,并连接到公共时钟线(111,114)。 通过外部触发线(113)馈送的触发信号由时钟线(111,114)上的每个时钟信号通过移位寄存器(110)从一行到另一行。 在该过程中,触发移位寄存器(110)激活关联像素(101),使得它们可以通过逐列延伸的读出行(105)读出。