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    • 7. 发明授权
    • Thin film transistor, display unit, and method of manufacturing thin film transistor
    • 薄膜晶体管,显示单元和制造薄膜晶体管的方法
    • US08309956B2
    • 2012-11-13
    • US12629283
    • 2009-12-02
    • Toshiaki AraiNarihiro MorosawaKazuhiko Tokunaga
    • Toshiaki AraiNarihiro MorosawaKazuhiko Tokunaga
    • H01L29/10H01L29/12H01L29/08H01L35/24H01L51/00H01L31/102
    • H01L29/7869H01L27/1225H01L27/3262
    • A thin film transistor includes: a gate electrode; a gate insulting film formed on the gate electrode; an oxide semiconductor thin film layer forming a channel region corresponding to the gate electrode on the gate insulating film; a channel protective layer that is formed at least in a region corresponding to the channel region on the gate insulating film and the oxide semiconductor thin film layer, and that includes a first channel protective layer on a lower layer side and a second channel protective layer on an upper layer side; and a source/drain electrode that is formed on the channel protective layer and is electrically connected to the oxide semiconductor thin film layer. The first channel protective layer is made of an oxide insulating material, and one or both of the first channel protective layer and the second channel protective layer is made of a low oxygen permeable material.
    • 薄膜晶体管包括:栅电极; 形成在栅电极上的栅极绝缘膜; 形成与栅极绝缘膜上的栅电极对应的沟道区域的氧化物半导体薄膜层; 至少形成在与栅极绝缘膜和氧化物半导体薄膜层上的沟道区域对应的区域中的沟道保护层,其包括下层侧的第一沟道保护层和第二沟道保护层 上层侧 以及源极/漏极,其形成在沟道保护层上并与氧化物半导体薄膜层电连接。 第一沟道保护层由氧化物绝缘材料制成,第一沟道保护层和第二沟道保护层中的一个或两个由低透氧材料制成。
    • 8. 发明申请
    • THIN FILM TRANSISTOR, DISPLAY UNIT, AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR
    • 薄膜晶体管,显示单元及制造薄膜晶体管的方法
    • US20100133525A1
    • 2010-06-03
    • US12629283
    • 2009-12-02
    • Toshiaki AraiNarihiro MorosawaKazuhiko Tokunaga
    • Toshiaki AraiNarihiro MorosawaKazuhiko Tokunaga
    • H01L29/786H01L51/52H01L21/34
    • H01L29/7869H01L27/1225H01L27/3262
    • A thin film transistor includes: a gate electrode; a gate insulting film formed on the gate electrode; an oxide semiconductor thin film layer forming a channel region corresponding to the gate electrode on the gate insulating film; a channel protective layer that is formed at least in a region corresponding to the channel region on the gate insulating film and the oxide semiconductor thin film layer, and that includes a first channel protective layer on a lower layer side and a second channel protective layer on an upper layer side; and a source/drain electrode that is formed on the channel protective layer and is electrically connected to the oxide semiconductor thin film layer. The first channel protective layer is made of an oxide insulating material, and one or both of the first channel protective layer and the second channel protective layer is made of a low oxygen permeable material.
    • 薄膜晶体管包括:栅电极; 形成在栅电极上的栅极绝缘膜; 形成与栅极绝缘膜上的栅电极对应的沟道区域的氧化物半导体薄膜层; 至少形成在与栅极绝缘膜和氧化物半导体薄膜层上的沟道区域对应的区域中的沟道保护层,其包括下层侧的第一沟道保护层和第二沟道保护层 上层侧 以及源极/漏极,其形成在沟道保护层上并与氧化物半导体薄膜层电连接。 第一沟道保护层由氧化物绝缘材料制成,第一沟道保护层和第二沟道保护层中的一个或两个由低透氧材料制成。