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    • 6. 发明授权
    • Functional device and method of manufacturing the same
    • 功能器件及其制造方法
    • US06953754B2
    • 2005-10-11
    • US10478888
    • 2002-06-04
    • Akio MachidaDharam Pal GosainSetsuo Usui
    • Akio MachidaDharam Pal GosainSetsuo Usui
    • B32B7/02H01L21/20H01L21/268H01L21/336H01L21/822H01L27/04H01L29/786H01L31/04H01L21/31
    • H01L21/02686H01L21/02532H01L21/2026H01L21/268H01L29/66757H01L29/66765H01L29/78603H01L29/78675H01L29/78678
    • The invention provides a functional device having no cracks and capable of delivering good functional characteristics and a method of manufacturing the same. A functional layer (14) is formed by crystallizing an amorphous silicon layer as a precursor layer by laser beam irradiation. A laser beam irradiation conducts heat up to a substrate (11) to cause it to try to expand; a stress to be produced by the difference in thermal expansion coefficient between the substrate (11) and the functional layer (14) is shut off by an organic polymer layer (12) lower in thermal expansion coefficient than the substrate (11), thereby causing no cracks nor separations in the functional layer (14). The organic polymer layer (12) is preferably made of an acrylic resin, an epoxy resin, or a polymer material containing these that is deformed by an optical or thermal process to undergo a three-dimensional condensation polymerization, for higher compactness and hardness. Inserting a metal layer and an inorganic heat resistant layer between the substrate (11) and the functional layer (14) will permit a more powerful laser irradiation.
    • 本发明提供了一种没有裂纹并且能够提供良好的功能特性的功能装置及其制造方法。 通过激光束照射使非晶硅层作为前体层结晶而形成功能层(14)。 激光束照射将热量传导到衬底(11)以使其试图膨胀; 由基板(11)和功能层(14)之间的热膨胀系数的差异产生的应力由热膨胀系数低于基板(11)的有机聚合物层(12)切断,从而导致 在功能层(14)中没有裂纹或分离。 有机聚合物层(12)优选由丙烯酸树脂,环氧树脂或包含它们的聚合物材料制成,这些材料通过光学或热过程变形以进行三维缩聚,以获得更高的紧凑性和硬度。 在基板(11)和功能层(14)之间插入金属层和无机耐热层将允许更强大的激光照射。
    • 8. 发明授权
    • Methods for fabricating memory devices
    • 制造存储器件的方法
    • US06410412B1
    • 2002-06-25
    • US09663006
    • 2000-09-15
    • Kenichi TairaNoriyuki KawashimaTakashi NoguchiDharam Pal GosainSetsuo Usui
    • Kenichi TairaNoriyuki KawashimaTakashi NoguchiDharam Pal GosainSetsuo Usui
    • H01L214763
    • B82Y10/00H01L21/28273H01L29/42332H01L29/66757H01L29/7881Y10S438/927
    • Methods for fabricating memory devices having a multi-dot floating gate ensuring a desirable crystallization of a semiconductor film without ruining the flatness of the surface of the polycrystallized silicon layer and a tunnel oxide film, allowing desirable semiconductor dots to be produced, and allowing production of the memory devices having a multi-dot floating gate with ease and at low costs even when a substrate is made of glass or plastic. Such a method for fabricating memory devices includes steps for forming on a substrate a semiconductor film and treating said semiconductor film by a first laser annealing so as to have a polycrystalline structure; forming on the semiconductor film a semiconductor dot forming film having a non-stoichiometric composition with an excessive content of a semiconductor element; and dispersing semiconductor dots within the semiconductor dot forming film by a second laser annealing thereby to produce semiconductor dots; in which a pulse energy density of the laser used for the first laser annealing is larger than a pulse energy density of the laser used for the second laser annealing.
    • 用于制造具有多点浮置栅极的存储器件的方法,其确保半导体膜的期望结晶,而不破坏多晶硅层的表面的平坦度和隧道氧化物膜,从而允许产生期望的半导体点,并且允许 存储器件具有多点浮置栅极,即使当衬底由玻璃或塑料制成时,其容易且成本低廉。 这种用于制造存储器件的方法包括以下步骤:在衬底上形成半导体膜并通过第一激光退火处理所述半导体膜以具有多晶结构; 在半导体膜上形成具有半导体元件含量过多的非化学计量组成的半导体点形成膜; 并通过第二激光退火将半导体点分散在半导体点形成膜内,从而产生半导体点; 其中用于第一激光退火的激光器的脉冲能量密度大于用于第二激光退火的激光器的脉冲能量密度。
    • 9. 发明授权
    • Display and method for manufacturing display
    • 显示器和制造显示方法
    • US08619208B2
    • 2013-12-31
    • US12530801
    • 2008-09-18
    • Dharam Pal GosainTsutomu TanakaMakoto Takatoku
    • Dharam Pal GosainTsutomu TanakaMakoto Takatoku
    • G02F1/136G02F1/13
    • H01L27/1222G02F1/1368G02F2001/13312G06F3/0412G06F3/0421H01L27/1214H01L27/124H01L29/66765
    • In the case of forming switching elements and light sensor elements over the same substrate, an increase in the film thickness of active layers in an attempt to enhance the sensitivity of the light sensor elements would adversely affect the characteristics of the switching elements (TFTs). In a configuration of a display in which a channel layer 25 for constituting thin film transistors to form the switching elements for pixels and a photoelectric conversion layer 35 for constituting the light sensor elements are provided over a gate insulating film 24 on a glass substrate 5 to be provided with a plurality of pixels arranged in a matrix pattern, the photoelectric conversion layer 35 is formed to be thicker than the channel layer 25, and/or the photoelectric conversion layer 35 is formed of a material different from the material for the channel layer 25, whereby the light absorption coefficient of the photoelectric conversion layer 35 is made to be higher than that of the channel layer 25.
    • 在同一衬底上形成开关元件和光传感器元件的情况下,为了提高光传感器元件的灵敏度,活性层的膜厚度的增加将不利地影响开关元件(TFT)的特性。 在用于构成用于像素的开关元件的薄膜晶体管的沟道层25和用于构成光传感器元件的光电转换层35的显示器的配置设置在玻璃基板5上的栅极绝缘膜24上 设置有以矩阵图案排列的多个像素,光电转换层35形成为比沟道层25厚,和/或光电转换层35由与沟道层材料不同的材料形成 25,由此使光电转换层35的光吸收系数高于沟道层25的光吸收系数。