会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 6. 发明授权
    • Method of varying stepper exposure dose to compensate for across-wafer variations in photoresist thickness
    • 改变步进曝光剂量以补偿光致抗蚀剂厚度的跨晶片变化的方法
    • US06576385B2
    • 2003-06-10
    • US09776206
    • 2001-02-02
    • Christopher A. BodeJoyce S. Oey HewettAlexander J. Pasadyn
    • Christopher A. BodeJoyce S. Oey HewettAlexander J. Pasadyn
    • G03F900
    • G03F7/70558
    • A method of compensating for across-wafer variations in photoresist thickness is provided. The method comprises providing a wafer having a process layer formed there-above, forming a layer of photoresist above the process layer, measuring a thickness of the layer of photoresist at a plurality of locations to result in a plurality of thickness measurements, providing the thickness measurements to a controller that determines, based upon the thickness measurements, an exposure dose of an exposure process to be performed on the layer of photoresist, and performing the exposure process on the layer of photoresist using the determined exposure dose. This exposure dose may be varied on a flash-by-flash basis as the stepper tool “steps” across the surface of wafers. That is, the exposure dose for a group of flashes, or for each flash, may be varied in response to the thickness measurements.
    • 提供了补偿光致抗蚀剂厚度的跨晶片变化的方法。 该方法包括提供具有在其上形成的处理层的晶片,在处理层上方形成光致抗蚀剂层,测量多个位置处的光致抗蚀剂层的厚度,以产生多个厚度测量值,从而提供厚度 控制器的测量,其基于厚度测量确定将在光致抗蚀剂层上进行的曝光处理的曝光剂量,以及使用确定的曝光剂量对光致抗蚀剂层进行曝光处理。 当步进工具跨越晶片表面“步进”时,该曝光剂量可以在逐闪的基础上变化。 也就是说,一组闪光或每个闪光灯的曝光剂量可以响应于厚度测量而变化。
    • 7. 发明授权
    • Method for prioritizing production lots based on grade estimates and output requirements
    • 根据年龄估计和产出要求确定生产批次的方法
    • US06699727B1
    • 2004-03-02
    • US09821675
    • 2001-03-29
    • Anthony J. TopracJoyce S. Oey HewettChristopher A. BodeAlexander J. PasadynAnastasia Oshelski PetersonThomas J. SondermanMichael L. Miller
    • Anthony J. TopracJoyce S. Oey HewettChristopher A. BodeAlexander J. PasadynAnastasia Oshelski PetersonThomas J. SondermanMichael L. Miller
    • G01R3126
    • H01L22/20G05B19/418G05B2219/32194G05B2219/32263Y02P90/02Y02P90/18Y02P90/20Y02P90/22
    • A method for prioritizing production flow includes processing a plurality of manufactured items in a process flow; measuring characteristics of a plurality of manufactured items in the process flow; estimating performance grades for the plurality of manufactured items based on the measured characteristics; grouping the manufactured items with like estimated performance grades; assigning priorities to groups of manufactured items with like estimated performance grades; and directing the plurality of manufactured items through the process flow based on the assigned priorities. A manufacturing system includes a plurality of processing tools adapted to process a plurality of manufactured items in a process flow, a metrology tool, and a process control server. The metrology tool is adapted to measure characteristics of a plurality of manufactured items in the process flow. The process control server is adapted to estimate performance grades for the plurality of manufactured items based on the measured characteristics, group the manufactured items with like estimated performance grades, assign priorities to groups of manufactured items with like estimated performance grades, and direct the plurality of manufactured items through the process flow based on the assigned priorities.
    • 一种用于确定生产流程优先级的方法包括在处理流程中处理多个制造的物品; 测量处理流程中的多个制成品的特性; 基于所测量的特性来估计所述多个制造物品的性能等级; 对具有相似估计性能等级的制成品进行分组; 将优先事项分配给具有类似估计绩效等级的制成品组; 以及基于所分配的优先级,通过所述处理流程来引导所述多个制造的物品。 制造系统包括多个处理工具,其适用于处理流程中的多个制造物品,计量工具和过程控制服务器。 计量工具适于测量处理流程中的多个制造物品的特性。 过程控制服务器适于基于测量的特性来估计多个制造物品的性能等级,将具有相似估计性能等级的制造物品分组,将具有相似估计性能等级的制造商品组的优先级分配给多个 基于分配的优先级,通过流程流程制造出的物品。
    • 9. 发明授权
    • Method and apparatus for integrating multiple process controllers
    • 用于集成多个过程控制器的方法和设备
    • US06801817B1
    • 2004-10-05
    • US09789140
    • 2001-02-20
    • Christopher A. BodeAlexander J. PasadynAnthony J. TopracJoyce S. Oey HewettAnastasia Oshelski PetersonThomas J. SondermanMichael L. Miller
    • Christopher A. BodeAlexander J. PasadynAnthony J. TopracJoyce S. Oey HewettAnastasia Oshelski PetersonThomas J. SondermanMichael L. Miller
    • G06F1900
    • G05B19/41865G05B19/40937Y02P90/16Y02P90/20Y02P90/265
    • A method for controlling a manufacturing system includes processing workpieces in a plurality of tools; initiating a baseline control script for a selected tool of the plurality of tools; providing context information for the baseline control script; determining a tool type based on the context information; selecting a group of control routines for the selected tool based on the tool type; determining required control routines from the group of control routines based on the context information; and executing the required control routines to generate control actions for the selected tool. A manufacturing system includes a plurality of tools adapted to process workpieces, a control execution manager, and a control executor. The control execution manager is adapted to initiate a baseline control script for a selected tool of the plurality of tools and provide context information for the baseline control script. The control executor is adapted to execute the baseline control script, determine a tool type based on the context information, select a group of control routines for the selected tool based on the tool type, determine required control routines from the group of control routines based on the context information, and execute the required control routines to generate control actions for the selected tool.
    • 一种用于控制制造系统的方法包括:处理多个工具中的工件; 为所述多个工具的所选择的工具启动基线控制脚本; 提供基线控制脚本的上下文信息; 基于上下文信息确定工具类型; 基于所述工具类型为所选择的工具选择一组控制例程; 基于所述上下文信息来确定来自所述一组控制例程的所需控制例程; 并执行所需的控制例程以产生所选择的工具的控制动作。 制造系统包括适于处理工件的多个工具,控制执行管理器和控制执行器。 所述控制执行管理器适于启动用于所述多个工具的所选工具的基线控制脚本并提供所述基线控制脚本的上下文信息。 控制执行器适于执行基线控制脚本,基于上下文信息确定工具类型,基于工具类型为所选择的工具选择一组控制例程,从基于控制例程的组中确定所需的控制例程 上下文信息,并执行所需的控制例程以生成所选择的工具的控制动作。