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    • 4. 发明申请
    • HIGH DIELECTRIC CONSTANT INSULATORS AND ASSOCIATED FABRICATION METHODS
    • 高介电常数绝缘子及相关制造方法
    • US20070176248A1
    • 2007-08-02
    • US11669086
    • 2007-01-30
    • THOMAS K. GAYLORDJames D. Meindl
    • THOMAS K. GAYLORDJames D. Meindl
    • H01L29/94
    • H01L29/51H01L21/02142H01L21/02175H01L21/02197H01L21/31637H01L21/31641H01L21/31645H01L21/31691
    • High-dielectric-constant (k) materials and electrical devices implementing the high-k materials are provided herein. According to some embodiments, an electrical device includes a substrate and a crystalline-oxide-containing composition. The crystalline-oxide-containing composition can be disposed on a surface of the substrate. Within the crystalline-oxide-containing composition, oxide anions can form at least one of a substantially linear orientation or a substantially planar orientation. A plurality of these substantially linear orientations of oxide anions or substantially planar orientations of oxide anions can be oriented substantially perpendicular or substantially normal to the surface of the substrate such that the oxide-containing composition has a dielectric constant greater than about 3.9 in a direction substantially normal to the surface of the substrate. Other embodiments are also claimed and described.
    • 本文提供了高介电常数(k)材料和实施高k材料的电气设备。 根据一些实施例,电气装置包括基底和含结晶氧化物的组合物。 含结晶氧化物的组合物可以设置在基材的表面上。 在含结晶氧化物的组合物中,氧化物阴离子可以形成基本上线性取向或基本平面取向中的至少一个。 氧化物阴离子的氧化物阴离子或基本上平面取向的多个这些基本上线性的取向可以被定向为基本上垂直于或基本上垂直于衬底的表面,使得含氧化物的组合物在基本上在基本上的方向上具有大于约3.9的介电常数 垂直于基底的表面。 还要求保护和描述其它实施例。