会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Reliable optical add/drop device
    • 可靠的光学分插装置
    • US06797941B2
    • 2004-09-28
    • US10244510
    • 2002-09-17
    • Chin-Hsiang WangChih-Hsiang LinTsung-Yueh Tsai
    • Chin-Hsiang WangChih-Hsiang LinTsung-Yueh Tsai
    • H01J502
    • G02B6/29383G02B6/2937G02B6/32
    • A highly reliable optical add/drop device is described. The optical add/drop device has an external tube and a ring, wherein the external tube and the ring are made of metallic material. A WDM filter is fixed in the ring. The ring is inserted in the external tube at the middle portion and fixed therein by soft solder technique. A single fiber collimator and a dual fiber collimator are respectively coupled with the opposite surfaces of the filter, and aligned in the external tube. Additionally, the single and dual fiber collimators are also fixed therein by soft solder technique, as two metal tubes respectively hold the single and dual fiber collimators. In the invention, the WDM filter is rigidly fixed to avoid tilting during temperature variation. Moreover, the invention provides an optical add/drop device with low insertion loss and reflection loss.
    • 描述了一种高度可靠的光分插装置。 光学分插装置具有外管和环,其中外管和环由金属材料制成。 WDM滤波器固定在环中。 环在中间部分插入外管,并通过软焊技术固定在其中。 单纤维准直器和双光纤准直器分别与过滤器的相对表面耦合,并在外管中对准。 此外,单和双光纤准直器也通过软焊技术固定在其中,因为两个金属管分别保持单和双光纤准直器。 在本发明中,WDM过滤器是刚性固定的,以避免温度变化时的倾斜。 此外,本发明提供了具有低插入损耗和反射损耗的光学分插装置。
    • 5. 发明授权
    • Apparatus and method for testing non-contact pads of a semiconductor device to be tested
    • 用于测试要测试的半导体器件的非接触焊盘的装置和方法
    • US08253431B2
    • 2012-08-28
    • US12784121
    • 2010-05-20
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenI. L. LinKen JuangMing-Hsiang Cheng
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenI. L. LinKen JuangMing-Hsiang Cheng
    • G01R31/20G01R31/00
    • G01R1/0483G01R1/0466G01R31/2886
    • The present invention relates to an apparatus and a method for testing non-contact pads of a semiconductor device to be tested. The apparatus includes an insulating body, at least one testing module and a plurality of probes. The insulating body includes an accommodating cavity, a lower opening and at least one side opening. The side opening communicates with the accommodating cavity and the lower opening. The testing module is disposed in the side opening, and each testing module includes a circuit board and an active chip. The active chip is disposed on and electrically connected to the circuit board. The active chip has a plurality of testing pads exposed to the accommodating cavity. The probes are disposed in the lower opening. Whereby, the non-contact pads of the semiconductor device to be tested face but not in physically contact with the testing pads of the active chip, so as to test the proximity communication between the non-contact pads of the semiconductor device and the testing pads of the active chip.
    • 本发明涉及一种用于测试待测半导体器件的非接触焊盘的装置和方法。 该装置包括绝缘体,至少一个测试模块和多个探针。 绝缘体包括容纳腔,下开口和至少一个侧开口。 侧开口与容纳腔和下开口连通。 测试模块设置在侧开口中,每个测试模块包括电路板和有源芯片。 有源芯片设置在电路板上并与之电连接。 有源芯片具有暴露于容纳腔的多个测试焊盘。 探针设置在下开口中。 因此,要测试的半导体器件的非接触焊盘面对但不与有源芯片的测试焊盘物理接触,以便测试半导体器件的非接触焊盘与测试焊盘之间的接近连接 的有源芯片。