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    • 1. 发明授权
    • Compilable address magnitude comparator for memory array self-testing
    • 可编程地址幅度比较器用于存储器阵列自检
    • US07073112B2
    • 2006-07-04
    • US10681856
    • 2003-10-08
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • G01R31/28
    • G01R31/3187G01R31/3193G11C29/26G11C2029/1802
    • An apparatus that improves Built-In-Self-Test (BIST) flexibility. A compilable address magnitude comparator facilitates BIST testing of different size memory arrays without requiring customization of the BIST controller. The compilable address magnitude comparator is compiled within the compilable memory arrays of the ASIC to allow a single BIST controller to test multiple sizes of memory arrays without requiring that the BIST controller be compilable. The compilable magnitude address comparator overrides the self-test signal from the BIST when the BIST attempts to test addresses not existing in the memory. The BIST is prevented from writing to addresses that do not exist, and does not receive error signals from those addresses. The BIST controller is able to test memory arrays without regard for their particular size. A single BIST controller can be used to test multiple memory arrays of different sizes in the ASIC, reducing device complexity.
    • 一种改进内置自检(BIST)灵活性的设备。 可编译的地址幅度比较器便于对不同大小的存储器阵列进行BIST测试,而无需定制BIST控制器。 可编译地址幅度比较器在ASIC的可编译存储器阵列中编译,以允许单个BIST控制器测试多个大小的存储器阵列,而不需要BIST控制器可编译。 当BIST尝试测试存储器中不存在的地址时,可编译幅度地址比较器会覆盖BIST的自检信号。 BIST被阻止写入不存在的地址,并且不会从这些地址接收到错误信号。 BIST控制器能够测试存储器阵列,而不考虑其特定大小。 单个BIST控制器可用于在ASIC中测试不同大小的多个存储器阵列,从而降低器件的复杂性。
    • 2. 发明授权
    • Compilable address magnitude comparator for memory array self-testing
    • 可编程地址幅度比较器用于存储器阵列自检
    • US06658610B1
    • 2003-12-02
    • US09669117
    • 2000-09-25
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • G11C2900
    • G01R31/3187G01R31/3193G11C29/26G11C2029/1802
    • The present invention provides a method and apparatus that improves Built-In-Self-Test (BIST) flexibility without requiring the complexity of a compilable BIST circuit. Additionally, the present invention provides the ability to use a single BIST to test multiple memory arrays of different sizes. The preferred embodiment of the present invention provides a compilable address magnitude comparator to facilitate BIST testing of different size memory arrays without requiring customization of the BIST controller. The preferred embodiment compilable address magnitude comparator is compiled within the compilable memory arrays of the ASIC to allow a single BIST controller to test multiple sizes of memory arrays without requiring that the BIST controller itself be compilable. In the preferred embodiment, the compilable magnitude address comparator overrides the self-test signal from the BIST when the BIST attempts to test addresses that do not exist in the memory. As such, the BIST is prevented from writing to addresses that do not exist, and does not receive error signals from those addresses. Thus, the BIST controller is able to test memory arrays without regard for their particular size. Furthermore, a single BIST controller can then be used to test multiple memory arrays of different sizes in the ASIC, again reducing device complexity.
    • 本发明提供了一种改进内置自测(BIST)灵活性的方法和装置,而不需要可编译BIST电路的复杂性。 此外,本发明提供了使用单个BIST来测试不同大小的多个存储器阵列的能力。 本发明的优选实施例提供可编译的地址幅度比较器,以便于不需要定制BIST控制器的不同大小的存储器阵列的BIST测试。 优选实施例可编译地址幅度比较器被编译在ASIC的可编译存储器阵列内,以允许单个BIST控制器测试存储器阵列的多个大小,而不需要BIST控制器本身可编译。 在优选实施例中,当BIST尝试测试存储器中不存在的地址时,可编译幅度地址比较器覆盖来自BIST的自检信号。 因此,BIST被阻止写入不存在的地址,并且不从这些地址接收到错误信号。 因此,BIST控制器能够测试存储器阵列,而不考虑其特定大小。 此外,可以使用单个BIST控制器来测试ASIC中不同大小的多个存储器阵列,从而降低器件的复杂性。
    • 9. 发明申请
    • Circuit and method for subdividing a CAMRAM bank by controlling a virtual ground
    • 通过控制虚拟地面对CAMRAM组进行细分的电路和方法
    • US20070097722A1
    • 2007-05-03
    • US11262062
    • 2005-10-28
    • Michael PhanChiaming ChaiJeffrey BridgesJeffrey Fischer
    • Michael PhanChiaming ChaiJeffrey BridgesJeffrey Fischer
    • G11C15/00
    • G11C15/00G11C8/12G11C15/04
    • A CAM bank is functionally divided into two or more sub-banks, without replication CAM driver circuits, by disabling all match line discharge circuits in the bank, and selectively enabling the discharge circuits in comprising sub-banks. At least one selectively actuated switching circuit is interposed between the virtual ground node of each discharging comparator in the discharge circuit of a sub-bank and circuit ground. When the switching circuit is in a non-conductive state, the virtual ground node is maintained at a voltage level sufficiently above circuit ground to preclude discharging a connected match line within the CAM access time. When the switching circuit is placed in a conductive state, the virtual ground node is pulled to circuit ground and the connected match line may be discharged by a miscompare. Control signals, which may be decode from address bits, are distributed to the switching circuits to defined the CAM sub-banks.
    • 通过禁用组中的所有匹配线放电电路,并且选择性地使能包括子组的放电电路,CAM组在功能上被划分为两个或更多个子组,而不需要复制CAM驱动器电路。 至少一个选择性致动的切换电路插入在子组的放电电路中的每个放电比较器的虚拟接地节点和电路接地之间。 当开关电路处于非导通状态时,虚拟接地节点保持在足够高于电路接地的电压电平,以防止在CAM访问时间内放电连接的匹配线。 当开关电路处于导通状态时,虚拟接地节点被拉到电路接地,并且连接的匹配线可能被误比较地放电。 可以从地址位解码的控制信号被分配到切换电路以定义CAM子库。