会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Bipolar ESD protection for integrated circuits
    • 集成电路的双极ESD保护
    • US5502328A
    • 1996-03-26
    • US228834
    • 1994-04-18
    • Che-Tsung ChenThaddeus J. GabaraBernard L. MorrisYehuda Smooha
    • Che-Tsung ChenThaddeus J. GabaraBernard L. MorrisYehuda Smooha
    • H01L27/02H01L29/00
    • H01L27/0259
    • CMOS integrated circuit buffers typically use a dual-diode electrostatic discharge (ESD) protection technique. However, in some cases that technique inadvertently causes one of the diodes to conduct when a desired signal voltage is present on the bondpad, thereby clipping the desired signal. This occurs, for example, when an output buffer on an unpowered device is connected to an active bus, or when the input buffer of a 3 volt device receives a 5 volt signal. The present invention solves this problem by using a bipolar (e.g., pnp) protection transistor connected between the bondpad and a power supply bus (e.g., V.sub.SS). The base of the transistor is connected to the bondpad through a resistor that provides a time delay due to the R-C time constant that includes distributed capacitance. The time delay allows for a high conduction period, during which an ESD event is conducted through the bipolar transistor, thereby protecting the input or output buffer.
    • CMOS集成电路缓冲器通常使用双二极管静电放电(ESD)保护技术。 然而,在某些情况下,当在接合板上存在期望的信号电压时,该技术无意中导致二极管中的一个导通,从而限制期望的信号。 例如,当未供电设备上的输出缓冲器连接到有源总线时,或者当3伏器件的输入缓冲器接收到5伏特信号时,就会发生这种情况。 本发明通过使用连接在接合板和电源总线(例如VSS)之间的双极(例如,pnp)保护晶体管解决了该问题。 晶体管的基极通过电阻器连接到接合板,电阻器由于包括分布电容的R-C时间常数而提供时间延迟。 时间延迟允许高导通周期,在此期间ESD事件通过双极晶体管传导,从而保护输入或输出缓冲器。
    • 2. 发明授权
    • Bipolar ESD protection for integrated circuits
    • 集成电路的双极ESD保护
    • US5304839A
    • 1994-04-19
    • US847438
    • 1992-03-06
    • Che-Tsung ChenThaddeus J. GabaraBernard L. MorrisYehuda Smooha
    • Che-Tsung ChenThaddeus J. GabaraBernard L. MorrisYehuda Smooha
    • H01L27/02H01L29/06H01L29/02H01L29/72H01L29/78
    • H01L27/0259
    • CMOS integrated circuit buffers typically use a dual-diode electrostatic discharge (ESD) protection technique. However, in some cases that technique inadvertently causes one of the diodes to conduct when a desired signal voltage is present on the bondpad, thereby clipping the desired signal. This occurs, for example, when an output buffer on an unpowered device is connected to an active bus, or when the input buffer of a 3 volt device receives a 5 volt signal. The present invention solves this problem by using a bipolar (e.g., pnp) protection transistor connected between the bondpad and a power supply bus (e.g., V.sub.SS). The base of the transistor is connected to the bondpad through a resistor that provides a time delay due to the R-C time constant that includes distributed capacitance. The time delay allows for a high conduction period, during which an ESD event is conducted through the bipolar transistor, thereby protecting the input or output buffer.
    • CMOS集成电路缓冲器通常使用双二极管静电放电(ESD)保护技术。 然而,在某些情况下,当在接合板上存在期望的信号电压时,该技术无意中导致二极管中的一个导通,从而限制期望的信号。 例如,当未供电设备上的输出缓冲器连接到有源总线时,或者当3伏器件的输入缓冲器接收到5伏特信号时,就会发生这种情况。 本发明通过使用连接在接合板和电源总线(例如VSS)之间的双极(例如,pnp)保护晶体管解决了该问题。 晶体管的基极通过电阻器连接到接合板,电阻器由于包括分布电容的R-C时间常数而提供时间延迟。 时间延迟允许高导通周期,在此期间ESD事件通过双极晶体管传导,从而保护输入或输出缓冲器。
    • 5. 发明申请
    • Electrostatic Discharge Protection Circuit
    • 静电放电保护电路
    • US20100232078A1
    • 2010-09-16
    • US12438460
    • 2007-10-30
    • Dipankar BhattacharyaMakeshwar KothandaramanJohn C. KrizBernard L. MorrisYehuda Smooha
    • Dipankar BhattacharyaMakeshwar KothandaramanJohn C. KrizBernard L. MorrisYehuda Smooha
    • H02H9/04
    • H01L27/0266
    • An ESD protection circuit includes a first voltage clamp, connected between a first voltage supply node and a second voltage supply node of the circuit, and a second voltage clamp, connected between the second voltage supply node and a voltage return of the circuit. The first voltage supply node is adapted to receive a first voltage which is greater than a prescribed gate oxide reliability potential of the circuit. The second voltage supply node is operative to receive a second voltage which is less than the first voltage. The first voltage clamp is operative to clamp the first voltage on the first voltage supply node to a first value during an ESD event between the first and second voltage supply nodes, and the second voltage clamp is operative to clamp the second voltage on the second voltage supply node to a second value during an ESD event between the second voltage supply node and the voltage return.
    • ESD保护电路包括连接在电路的第一电压供应节点和第二电压供应节点之间的第一电压钳位器,以及连接在第二电压供应节点和电路的电压回路之间的第二电压钳位。 第一电压供应节点适于接收大于电路的预定栅极氧化物可靠性电位的第一电压。 第二电压供应节点可操作以接收小于第一电压的第二电压。 第一电压钳位器用于在第一和第二电压供应节点之间的ESD事件期间将第一电压供应节点上的第一电压钳位到第一值,并且第二电压钳位器用于将第二电压钳位在第二电压 在第二电压供应节点和电压返回之间的ESD事件期间将供应节点提供给第二值。
    • 6. 发明授权
    • Electrostatic discharge protection in a semiconductor device
    • 半导体器件中的静电放电保护
    • US07495873B2
    • 2009-02-24
    • US10977881
    • 2004-10-29
    • Dipankar BhattacharyaJohn C. KrizBernard L. MorrisYehuda Smooha
    • Dipankar BhattacharyaJohn C. KrizBernard L. MorrisYehuda Smooha
    • H02H9/00
    • H01L27/0266
    • An ESD protection circuit for protecting a circuit from an ESD event occurring between a first voltage supply node and a second voltage supply node associated with the circuit to be protected includes an MOS device having a gate terminal, a first source/drain terminal and a second source/drain terminal. The first source/drain terminal is connected to the first voltage supply node and the second source/drain terminal is connected to the second voltage supply node. The ESD protection circuit further includes a trigger circuit coupled to the gate terminal of the MOS device. The trigger circuit is configured to generate a control signal at the gate terminal of the MOS device for activating the MOS device during the ESD event. At least a portion of the trigger circuit is formed in a floating well which becomes biased to a voltage that is substantially equal to a first voltage when the first voltage is supplied to the first voltage supply node or to a second voltage when the second voltage is applied to the second voltage supply node, whichever voltage is greater.
    • 一种ESD保护电路,用于保护电路免受在要被保护的电路的第一电压供应节点和第二电压供应节点之间发生的ESD事件的影响,包括具有栅极端子,第一源极/漏极端子和第二电压源的MOS器件 源极/漏极端子。 第一源极/漏极端子连接到第一电压供应节点,第二源极/漏极端子连接到第二电压供应节点。 ESD保护电路还包括耦合到MOS器件的栅极端子的触发电路。 触发电路被配置为在MOS器件的栅极端产生控制信号,以在ESD事件期间激活MOS器件。 触发电路的至少一部分形成在浮置阱中,当浮置第二电压为第二电压时,浮置阱被偏置到基本上等于第一电压的电压,或者当第一电压被提供给第一电压供应节点时, 施加到第二电压供应节点,无论哪个电压较大。
    • 7. 发明授权
    • Electrostatic discharge protection circuit
    • 静电放电保护电路
    • US08089739B2
    • 2012-01-03
    • US12438460
    • 2007-10-30
    • Dipankar BhattacharyaMakeshwar KothandaramanJohn C. KrizBernard L. MorrisYehuda Smooha
    • Dipankar BhattacharyaMakeshwar KothandaramanJohn C. KrizBernard L. MorrisYehuda Smooha
    • H02H3/22H02H3/20H02H9/04
    • H01L27/0266
    • An ESD protection circuit includes a first voltage clamp, connected between a first voltage supply node and a second voltage supply node of the circuit, and a second voltage clamp, connected between the second voltage supply node and a voltage return of the circuit. The first voltage supply node is adapted to receive a first voltage which is greater than a prescribed gate oxide reliability potential of the circuit. The second voltage supply node is operative to receive a second voltage which is less than the first voltage. The first voltage clamp is operative to clamp the first voltage on the first voltage supply node to a first value during an ESD event between the first and second voltage supply nodes, and the second voltage clamp is operative to clamp the second voltage on the second voltage supply node to a second value during an ESD event between the second voltage supply node and the voltage return.
    • ESD保护电路包括连接在电路的第一电压供应节点和第二电压供应节点之间的第一电压钳位器,以及连接在第二电压供应节点和电路的电压回路之间的第二电压钳位。 第一电压供应节点适于接收大于电路的预定栅极氧化物可靠性电位的第一电压。 第二电压供应节点可操作以接收小于第一电压的第二电压。 第一电压钳位器用于在第一和第二电压供应节点之间的ESD事件期间将第一电压供应节点上的第一电压钳位到第一值,并且第二电压钳位器用于将第二电压钳位在第二电压 在第二电压供应节点和电压返回之间的ESD事件期间将供应节点提供给第二值。