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    • 2. 发明申请
    • LED WITH CURENT CONFINEMENT STRUCTURE AND SURFACE ROUGHENING
    • LED具有牢固的结构和表面粗糙度
    • WO2006080958A1
    • 2006-08-03
    • PCT/US2005/036552
    • 2005-09-15
    • CREE, INC.
    • DENBAARS, Steven, P.NAKAMURA, ShujiBATRES, Max
    • H01L33/00
    • H01L33/42H01L33/145H01L33/22H01L33/405
    • An LED (10) having a p-type layer of material with an associated p-contact, an n-type layer of material with an associated n-contact and an active region (18) between the p-type layer and the n-type layer, includes a confinement structure (20) that is formed within one of the p-type layer of material and the n-type layer of material. The confinement structure (20) is generally aligned with the contact (22) on the top and primary emission surface of the LED (10) and substantially prevents the emission of light from the area of the active region (18) that is coincident with the area of the confinement structure and the top-surface contact (22). The LED (10) may include a roughened emitting side surface (25) to further enhance light extraction.
    • 具有相关联的p型接触的p型材料层的LED(10),具有相关联的n型接触的n型材料层以及p型层与n型接触之间的有源区(18) 型层包括在所述p型材料层和所述n型材料层之一内形成的约束结构(20)。 限制结构(20)通常与LED(10)的顶部和主要发射表面上的触点(22)对准,并且基本上防止来自与有源区域(18)重合的区域的光的发射 约束结构的面积和顶面接触面(22)。 LED(10)可以包括粗糙化的发射侧表面(25),以进一步增强光提取。
    • 3. 发明申请
    • LIFT-OFF PROCESS FOR GAN FILMS FORMED ON SIC SUBSTRATES AND DEVICES FABRICATED USING THE METHOD
    • 使用方法制作的SIC基板上形成的GAN膜的提升过程
    • WO2005112138A1
    • 2005-11-24
    • PCT/US2005/009327
    • 2005-03-22
    • CREE, INC.
    • NAKAMURA, ShujiDENBAARS, Steven
    • H01L33/00
    • H01L33/465H01L33/0079H01L33/105
    • One embodiment of a method according to the present invention for fabricating a high light extraction photonic device comprises growing a lift-off layer on a substrate and growing an epitaxial semiconductor device structure on the lift-off layer such that the lift-off layer is sandwiched between said device structure and substrate. The epitaxial semiconductor structure comprises an emitter adapted to emit light in response to a bias. The device structure, lift-off layer and substrate is flip-chip mounted on a submount such that the epitaxial semiconductor device structure is sandwiched between the submount and lift-off layer. The lift-off layer is removed to separate the substrate from the device structure. Different removal methods can be used such as removal by a photo electrochemical etch or by illuminating the lift-off layer with laser light.
    • 根据本发明的用于制造高光提取光子器件的方法的一个实施例包括在衬底上生长剥离层并在剥离层上生长外延半导体器件结构,使得剥离层夹在 在所述器件结构和衬底之间。 外延半导体结构包括适于响应于偏压而发光的发射极。 器件结构,剥离层和衬底被倒装安装在基座上,使得外延半导体器件结构夹在子安装座和剥离层之间。 去除剥离层以将衬底与器件结构分离。 可以使用不同的去除方法,例如通过光电化学蚀刻去除或通过用激光照射剥离层。
    • 5. 发明申请
    • METHOD FOR FABRICATING GROUP III NITRIDE DEVICES AND DEVICES FABRICATED USING METHOD
    • 用于制备III族氮化物装置的方法和使用方法织造的装置
    • WO2005117152A1
    • 2005-12-08
    • PCT/US2005/016987
    • 2005-05-17
    • CREE, INC.
    • NAKAMURA, ShujiDENBAARS, StevenEDMOND, JohnMISHRA, UmeshSWOBODA, Charles
    • H01L33/00
    • H01L33/465H01L33/0079H01L33/105H01L33/145H01L33/32H01L33/38H01L2933/0016
    • A method according to the present invention for fabricating high light extraction photonic device comprising growing an epitaxial semiconductor structure on a substrate and depositing a first mirror layer on the epitaxial semiconductor structure such that the epitaxial semiconductor structure is sandwiched between the first mirror layer and the substrate. Flip-chip mounting the epitaxial semiconductor structure, with its first mirror and substrate on a submount such that the epitaxial semiconductor device structure is sandwiched between the submount and substrate. The substrate is then removed from the epitaxial structure by introducing an etch environment to the substrate. A second mirror layer is deposited on the epitaxial semiconductor structure such that the epitaxial semiconductor structure is sandwiched between the first and second mirror layers. A device according to the present invention comprising a resonant cavity light emitting diode (RCLED) mounted to a submount.
    • 根据本发明的用于制造高光提取光子器件的方法,包括在衬底上生长外延半导体结构并在外延半导体结构上沉积第一镜层,使得外延半导体结构夹在第一镜层和衬底之间 。 倒装芯片安装外延半导体结构,其第一反射镜和衬底位于基座上,使得外延半导体器件结构夹在基座和衬底之间。 然后通过向衬底引入蚀刻环境,从衬底去除衬底。 第二镜层沉积在外延半导体结构上,使得外延半导体结构夹在第一和第二镜层之间。 根据本发明的装置包括安装到底座的谐振腔发光二极管(RCLED)。