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1. 发明申请

WO2015052617A1 METHOD FOR EVALUATING THE CLEANING STATE OF AN AERATION AND/OR CONDITIONING PLANT OF A ROOM 审中-公开
标题翻译：评估室内和/或调节设备清洁状态的方法
公开(公告)号：WO2015052617A1
公开(公告)日：2015-04-16
申请号：PCT/IB2014/064943
申请日：2014-09-30
申请人： CONSIGLIO NAZIONALE DELLE RICERCHE , TAGLIAFERRI S.R.L. , BUCCOLINI, Fabio
发明人： BUCCOLINI, Fabio , DE CANDITIIS, Daniela , BRUNI, Vittoria , TAGLIAFERRI, Sante , ROSSI, Elisa , PIGOZZI, Daniele
IPC分类号： B08B9/049 , G01N15/06 , G01N1/02 , G01N15/00
CPC分类号： G01N15/0618 , B01D46/0086 , B08B13/00 , F24F11/39 , G01N1/02 , G01N15/0625 , G01N2001/028 , G01N2015/0046 , G01N2015/0049 , G01N2015/0096
摘要： The present invention places in the field of the maintenance of aeration, conditioning, air-conditioning, etc. plants, and in particular the present invention relates to a method for evaluating the cleaning state of a plant, with particular reference to the atmospheric particulate.
摘要翻译：本发明处于曝气，调理，空调等工厂的维护领域，特别是本发明涉及用于评估植物的清洁状态的方法，特别是关于大气颗粒物。

2. 发明公开

EP3055081A1 METHOD FOR EVALUATING THE CLEANING STATE OF AN AERATION AND/OR CONDITIONING PLANT OF A ROOM 有权转让
标题翻译：的空间的通风和/或空调系统的过程评估清洁状态
公开(公告)号：EP3055081A1
公开(公告)日：2016-08-17
申请号：EP14793893.0
申请日：2014-09-30
申请人： Consiglio Nazionale delle Ricerche , Tagliaferri S.r.l. , Buccolini, Fabio
发明人： BUCCOLINI, Fabio , DE CANDITIIS, Daniela , BRUNI, Vittoria , TAGLIAFERRI, Sante , ROSSI, Elisa , PIGOZZI, Daniele , VITULANO, Domenico
IPC分类号： B08B9/049 , G01N15/06 , G01N1/02 , G01N15/00
CPC分类号： G01N15/0618 , B01D46/0086 , B08B13/00 , F24F11/39 , G01N1/02 , G01N15/0625 , G01N2001/028 , G01N2015/0046 , G01N2015/0049 , G01N2015/0096
摘要： The present invention places in the field of the maintenance of aeration, conditioning, air-conditioning, etc. plants, and in particular the present invention relates to a method for evaluating the cleaning state of a plant, with particular reference to the atmospheric particulate.

4. 发明申请

WO2016199025A1 CONFOCAL MICROSCOPE AND RELATED PROCESS OF ACQUIRING AND PROCESSING IMAGES 审中-公开
标题翻译：共焦显微镜及其获取和处理图像的相关过程
公开(公告)号：WO2016199025A1
公开(公告)日：2016-12-15
申请号：PCT/IB2016/053344
申请日：2016-06-08
申请人： CRESTOPTICS S.R.L. , CONSIGLIO NAZIONALE DELLE RICERCHE
发明人： VITULANO, Domenico , BRUNI, Vittoria , RICCO, Vincenzo , SANTINELLI, Andrea
IPC分类号： G02B21/00 , G02B27/58
CPC分类号： G02B21/008 , G02B21/0044 , G02B21/0072 , G02B27/58
摘要： Process of acquiring and processing images in confocal microscopy, comprising the following steps: A. acquiring (500, 510; 520, 530) a first overall image A k-1 of a plane of a sample (160) scanning the same with a first excitation light beam, obtained by making a basic light beam pass through first pinholes (1255; 1255') and transmitted to an optics (155) of a confocal microscope (100) that is focused on the plane of the sample (160), and acquiring a second overall image Ak of the plane of the sample (160) scanning the same with a second excitation light beam, obtained by making said basic light beam pass through second pinholes (1265; 1265') having same shape and size (L 2 ; L a2 , L b2 ) larger than the first pinholes (1255; 1255'); B. calculating (540) an estimate g of the PSF of the optics (155) of the microscope (100), through an inverse Fourier transform of formula (I): where Â k -1 (ω) is the Fourier transform of the acquired first overall image A k-1 and Â k (ω) is the Fourier transform of the acquired second overall image A k ; and C. deconvolving (550) the acquired second overall image A k using the estimate g of the PSF of the optics (155) of the microscope (100) through a main deconvolution algorithm, obtaining the resulting image / of the entire plane of the sample (160): I = A k • g.
摘要翻译：在共聚焦显微镜中获取和处理图像的过程包括以下步骤：A.采集（500,510,520,530）第一个整体图像Ak-1，其中第一个整体图像用第一个激发扫描的样品（160）的平面通过使基本光束通过第一针孔（1255; 1255'）并被传输到聚焦在样品（160）的平面上的共聚焦显微镜（100）的光学器件（155）而获得的光束，并获取通过使所述基本光束通过具有相同形状和尺寸（L2; La2）的第二针孔（1265; 1265'）而获得的样品（160）的平面的第二整体图像Ak与第二激发光束扫描相同，Lb2）大于第一针孔（1255; 1255'）; B.通过公式（I）的傅立叶逆变换计算（540）显微镜（100）的光学器件（155）的PSF的估计值：其中kk（ω）是所获取的傅立叶变换第一整体图像Ak-1和k（ω）是所获取的第二整体图像Ak的傅立叶变换; 和C.通过主去卷积算法使用显微镜（100）的光学器件（155）的PSF的估计值g来获取的第二整体图像Ak解卷积（550），获得样品的整个平面的所得图像（160）：I = Ak·g。

5. 发明授权

EP3308211B1 CONFOCAL MICROSCOPE AND RELATED PROCESS OF ACQUIRING AND PROCESSING IMAGES 有权转让
公开(公告)号：EP3308211B1
公开(公告)日：2019-03-13
申请号：EP16751335.7
申请日：2016-06-08
申请人： Crestoptics S.p.A. , Consiglio Nazionale Delle Ricerche
发明人： VITULANO, Domenico , BRUNI, Vittoria , RICCO, Vincenzo , SANTINELLI, Andrea
IPC分类号： G02B21/00 , G02B27/58

6. 发明公开

EP3308211A1 CONFOCAL MICROSCOPE AND RELATED PROCESS OF ACQUIRING AND PROCESSING IMAGES 有权转让
标题翻译：共焦显微镜以及获取和处理图像的相关过程
公开(公告)号：EP3308211A1
公开(公告)日：2018-04-18
申请号：EP16751335.7
申请日：2016-06-08
申请人： Crestoptics S.r.l. , Consiglio Nazionale Delle Ricerche
发明人： VITULANO, Domenico , BRUNI, Vittoria , RICCO, Vincenzo , SANTINELLI, Andrea
IPC分类号： G02B21/00 , G02B27/58
CPC分类号： G02B21/008 , G02B21/0044 , G02B21/0072 , G02B27/58
摘要： Process of acquiring and processing images in confocal microscopy, comprising the following steps: A. acquiring (500, 510; 520, 530) a first overall image Ak-1 of a plane of a sample (160) scanning the same with a first excitation light beam, obtained by making a basic light beam pass through first pinholes (1255; 1255') and transmitted to an optics (155) of a confocal microscope (100) that is focused on the plane of the sample (160), and acquiring a second overall image Ak of the plane of the sample (160) scanning the same with a second excitation light beam, obtained by making said basic light beam pass through second pinholes (1265; 1265') having same shape and size (L2; La2, Lb2) larger than the first pinholes (1255; 1255'); B. calculating (540) an estimate g of the PSF of the optics (155) of the microscope (100), through an inverse Fourier transform of formula (I): where Âk -1(ω) is the Fourier transform of the acquired first overall image Ak-1 and Âk(ω)is the Fourier transform of the acquired second overall image Ak; and C. deconvolving (550) the acquired second overall image Ak using the estimate g of the PSF of the optics (155) of the microscope (100) through a main deconvolution algorithm, obtaining the resulting image / of the entire plane of the sample (160): I = Ak• g.

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