专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07713807B2 High-performance CMOS SOI devices on hybrid crystal-oriented substrates 失效
标题翻译：高性能CMOS SOI器件在混合晶体取向衬底上
公开(公告)号：US07713807B2
公开(公告)日：2010-05-11
申请号：US11958877
申请日：2007-12-18
申请人： Bruce B. Doris , Kathryn W. Guarini , Meikei Ieong , Shreesh Narasimha , Kern Rim , Jeffrey W. Sleight , Min Yang
发明人： Bruce B. Doris , Kathryn W. Guarini , Meikei Ieong , Shreesh Narasimha , Kern Rim , Jeffrey W. Sleight , Min Yang
IPC分类号： H01L21/8238
CPC分类号： H01L21/76275 , H01L21/823807 , H01L21/84
摘要： An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.
摘要翻译：提供包含至少一个器件的集成半导体结构，所述器件形成在对于该器件最佳的第一晶体表面上，而另一器件形成在对于另一器件最佳的第二不同晶体表面上。形成集成结构的方法包括提供包括至少第一晶体取向的第一半导体层和第二不同晶体取向的第二半导体层的键合衬底。键合衬底的一部分被保护以限定第一器件区域，而键合衬底的另一部分是未受保护的。然后蚀刻键合衬底的未保护部分以暴露第二半导体层的表面，并将半导体材料重新生长在暴露表面上。在平坦化之后，在第一器件区域中形成第一半导体器件，并且在再生长材料上形成第二半导体器件。

2. 发明授权

US07329923B2 High-performance CMOS devices on hybrid crystal oriented substrates 失效
标题翻译：混合晶体取向基板上的高性能CMOS器件
公开(公告)号：US07329923B2
公开(公告)日：2008-02-12
申请号：US10250241
申请日：2003-06-17
申请人： Bruce B. Doris , Kathryn W. Guarini , Meikei Ieong , Shreesh Narasimha , Kern Rim , Jeffrey W. Sleight , Min Yang
发明人： Bruce B. Doris , Kathryn W. Guarini , Meikei Ieong , Shreesh Narasimha , Kern Rim , Jeffrey W. Sleight , Min Yang
IPC分类号： H01L27/01
CPC分类号： H01L21/76275 , H01L21/823807 , H01L21/84
摘要： An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.
摘要翻译：提供包含至少一个器件的集成半导体结构，所述器件形成在对于该器件最佳的第一晶体表面上，而另一器件形成在对于另一器件最佳的第二不同晶体表面上。形成集成结构的方法包括提供包括至少第一晶体取向的第一半导体层和第二不同晶体取向的第二半导体层的键合衬底。键合衬底的一部分被保护以限定第一器件区域，而键合衬底的另一部分是未受保护的。然后蚀刻键合衬底的未保护部分以暴露第二半导体层的表面，并将半导体材料重新生长在暴露表面上。在平坦化之后，在第一器件区域中形成第一半导体器件，并且在再生长材料上形成第二半导体器件。

3. 发明申请

US20080096330A1 HIGH-PERFORMANCE CMOS SOI DEVICES ON HYBRID CRYSTAL-ORIENTED SUBSTRATES 失效
标题翻译：高性能CMOS SOI器件在混合晶体导向衬底上的应用
公开(公告)号：US20080096330A1
公开(公告)日：2008-04-24
申请号：US11958877
申请日：2007-12-18
申请人： Bruce Doris , Kathryn Guarini , Meikei Ieong , Shreesh Narasimha , Kern Rim , Jeffrey Sleight , Min Yang
发明人： Bruce Doris , Kathryn Guarini , Meikei Ieong , Shreesh Narasimha , Kern Rim , Jeffrey Sleight , Min Yang
IPC分类号： H01L21/84
CPC分类号： H01L21/76275 , H01L21/823807 , H01L21/84
摘要： An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.
摘要翻译：提供包含至少一个器件的集成半导体结构，所述器件形成在对于该器件最佳的第一晶体表面上，而另一器件形成在对于另一器件最佳的第二不同晶体表面上。形成集成结构的方法包括提供包括至少第一晶体取向的第一半导体层和第二不同晶体取向的第二半导体层的键合衬底。键合衬底的一部分被保护以限定第一器件区域，而键合衬底的另一部分是未受保护的。然后蚀刻键合衬底的未保护部分以暴露第二半导体层的表面，并将半导体材料重新生长在暴露表面上。在平坦化之后，在第一器件区域中形成第一半导体器件，并且在再生长材料上形成第二半导体器件。

4. 发明申请

US20050236687A1 Strained silicon CMOS on hybrid crystal orientations 失效
标题翻译：应变硅CMOS在混合晶体取向上
公开(公告)号：US20050236687A1
公开(公告)日：2005-10-27
申请号：US10830347
申请日：2004-04-22
申请人： Kevin Chan , Bruce Doris , Kathryn Guarini , Meikei Ieong , Shreesh Narasimha , Alexander Reznicek , Kern Rim , Devendra Sadana , Leathen Shi , Jeffrey Sleight , Min Yang
发明人： Kevin Chan , Bruce Doris , Kathryn Guarini , Meikei Ieong , Shreesh Narasimha , Alexander Reznicek , Kern Rim , Devendra Sadana , Leathen Shi , Jeffrey Sleight , Min Yang
IPC分类号： H01L27/08 , H01L21/02 , H01L21/20 , H01L21/336 , H01L21/762 , H01L21/8238 , H01L21/84 , H01L27/092 , H01L27/12 , H01L29/04 , H01L29/76 , H01L29/78 , H01L29/786
CPC分类号： H01L29/7842 , H01L21/2022 , H01L21/76275 , H01L21/823807 , H01L21/84 , H01L27/1203 , H01L29/045 , H01L29/78687
摘要： Methods of forming a strained Si-containing hybrid substrate are provided as well as the strained Si-containing hybrid substrate formed by the methods. In the methods of the present invention, a strained Si layer is formed overlying a regrown semiconductor material, a second semiconducting layer, or both. In accordance with the present invention, the strained Si layer has the same crystallographic orientation as either the regrown semiconductor layer or the second semiconducting layer. The methods provide a hybrid substrate in which at least one of the device layers includes strained Si.
摘要翻译：提供了形成应变含Si的杂化基板的方法以及通过这些方法形成的应变的含Si杂化基板。在本发明的方法中，形成覆盖重新生长的半导体材料，第二半导体层或两者的应变Si层。根据本发明，应变Si层具有与再生长半导体层或第二半导电层相同的晶体取向。该方法提供混合基板，其中至少一个器件层包括应变Si。

5. 发明授权

US09184301B2 Planar and nanowire field effect transistors 有权
标题翻译：平面和纳米线场效应晶体管
公开(公告)号：US09184301B2
公开(公告)日：2015-11-10
申请号：US13600598
申请日：2012-08-31
申请人： Sarunya Bangsaruntip , Guy M. Cohen , Shreesh Narasimha , Jeffrey W. Sleight
发明人： Sarunya Bangsaruntip , Guy M. Cohen , Shreesh Narasimha , Jeffrey W. Sleight
IPC分类号： H01L29/66 , H01L29/786 , B82Y10/00 , B82Y40/00 , H01L21/84 , H01L27/12 , H01L29/06 , H01L29/423
CPC分类号： H01L29/78696 , B82Y10/00 , B82Y40/00 , H01L21/84 , H01L27/1203 , H01L29/0665 , H01L29/0673 , H01L29/42392 , H01L29/66439 , H01L29/66469 , H01L29/66772
摘要： An integrated circuit includes a plurality of gate-all-around (GAA) nanowire field effect transistors (FETs), a plurality of omega-gate nanowire FETs, and a plurality of planar channel FETs, wherein the plurality of GAA FETs, the plurality of omega-gate nanowire FETs, and the plurality of planar channel FETs are disposed on a single wafer.
摘要翻译：集成电路包括多个栅极全能（GAA）纳米线场效应晶体管（FET），多个Ω-栅极纳米线FET和多个平面沟道FET，其中多个GAA FET，多个 ω-门纳米线FET，并且多个平面沟道FET设置在单个晶片上。

6. 发明申请

US20130221328A1 Pad-Less Gate-All Around Semiconductor Nanowire FETs On Bulk Semiconductor Wafers 有权
标题翻译：无衬底栅极 - 全周围半导体纳米线FET在散装半导体晶片上
公开(公告)号：US20130221328A1
公开(公告)日：2013-08-29
申请号：US13405732
申请日：2012-02-27
申请人： Jeffrey W. Sleight , Josephine B. Chang , Isaac Lauer , Shreesh Narasimha
发明人： Jeffrey W. Sleight , Josephine B. Chang , Isaac Lauer , Shreesh Narasimha
IPC分类号： H01L29/775 , H01L21/335
CPC分类号： H01L29/66477 , B82Y10/00 , B82Y40/00 , H01L29/0673 , H01L29/42392 , H01L29/66439 , H01L29/775 , H01L29/78696 , Y10S977/762
摘要： A method for forming a nanowire field effect transistor (FET) device, the method includes forming a suspended nanowire over a semiconductor substrate, forming a gate structure around a portion of the nanowire, forming a protective spacer adjacent to sidewalls of the gate and around portions of nanowire extending from the gate, removing exposed portions of the nanowire left unprotected by the spacer structure, and epitaxially growing a doped semiconductor material on exposed cross sections of the nanowire to form a source region and a drain region.
摘要翻译：一种用于形成纳米线场效应晶体管（FET）器件的方法，该方法包括在半导体衬底上形成悬浮的纳米线，在纳米线的一部分周围形成栅极结构，形成邻近栅极的侧壁和周围部分的保护隔离层的纳米线从栅极延伸，去除未被间隔物结构保护的纳米线的暴露部分，以及在纳米线的暴露的横截面上外延生长掺杂的半导体材料，以形成源极区域和漏极区域。

7. 发明申请

US20120319084A1 PLANAR AND NANOWIRE FIELD EFFECT TRANSISTORS 有权
标题翻译：平面和纳米级场效应晶体管
公开(公告)号：US20120319084A1
公开(公告)日：2012-12-20
申请号：US13600598
申请日：2012-08-31
申请人： Sarunya Bangsaruntip , Guy M. Cohen , Shreesh Narasimha , Jeffrey W. Sleight
发明人： Sarunya Bangsaruntip , Guy M. Cohen , Shreesh Narasimha , Jeffrey W. Sleight
IPC分类号： H01L27/088
CPC分类号： H01L29/78696 , B82Y10/00 , B82Y40/00 , H01L21/84 , H01L27/1203 , H01L29/0665 , H01L29/0673 , H01L29/42392 , H01L29/66439 , H01L29/66469 , H01L29/66772
摘要： An integrated circuit includes a plurality of gate-all-around (GAA) nanowire field effect transistors (FETs), a plurality of omega-gate nanowire FETs, and a plurality of planar channel FETs, wherein the plurality of GAA FETs, the plurality of omega-gate nanowire FETs, and the plurality of planar channel FETs are disposed on a single wafer.
摘要翻译：集成电路包括多个栅极全能（GAA）纳米线场效应晶体管（FET），多个Ω-栅极纳米线FET和多个平面沟道FET，其中多个GAA FET，多个 ω-门纳米线FET，并且多个平面沟道FET设置在单个晶片上。

8. 发明授权

US07538391B2 Curved FINFETs 有权
标题翻译：弯曲的FINFET
公开(公告)号：US07538391B2
公开(公告)日：2009-05-26
申请号：US11621228
申请日：2007-01-09
申请人： Dureseti Chidambarrao , Shreesh Narasimha , Edward J. Nowak , John J. Pekarik , Jeffrey W. Sleight , Richard Q. Williams
发明人： Dureseti Chidambarrao , Shreesh Narasimha , Edward J. Nowak , John J. Pekarik , Jeffrey W. Sleight , Richard Q. Williams
IPC分类号： H01L29/78 , H01L21/336
CPC分类号： H01L29/785 , H01L29/0649 , H01L29/66795 , H01L29/7843
摘要： A method of forming a transistor patterns a semiconductor fin on a substrate, such that the fin extends from the substrate. Then, the method forms a gate conductor over a central portion of the fin, leaving end portions of the fin exposed. Next, the end portions of the fin are doped with at least one impurity to leave the central portion of the fin as a semiconductor and form the end portions of the fin as conductors. The end portions of the fin are undercut to disconnect the end portions of the fin from the substrate, such that the fin is connected to the substrate along a central portion and is disconnected from the substrate along the end portions and that the end portions are free to move and the central portion is not free to move. A straining layer is formed on a first side of the fin and the straining layer imparts physical pressure on the fin such that the end portions are permanently moved away from a straight-line orientation with the central portion after the forming of the straining layer. Thus, the undercutting in combination with the forming of the straining layer curves the fin such that, when viewed from a top of the substrate, the fin is bowed and has a curved shape.
摘要翻译：一种形成晶体管的方法在衬底上形成半导体鳍片，使得鳍片从衬底延伸。然后，该方法在鳍片的中心部分上形成栅极导体，使翅片的端部部分露出。接下来，翅片的端部掺杂有至少一种杂质，以使翅片的中心部分作为半导体，并将翅片的端部形成为导体。翅片的端部被底切以使翅片的端部与基板断开，使得翅片沿着中心部分连接到基板，并且沿着端部与基板断开，并且端部部分是自由的移动，中央部分不能自由移动。在翅片的第一侧上形成有应变层，并且应变层在翅片上施加物理压力，使得端部在紧固层形成之后永久地与中心部分的直线取向远离。因此，与形成应变层相结合的底切使翅片弯曲，使得当从基板的顶部观察时，翅片弯曲并具有弯曲形状。

9. 发明授权

US07202187B2 Method of forming sidewall spacer using dual-frequency plasma enhanced CVD 失效
标题翻译：使用双频等离子体增强CVD形成侧壁间隔物的方法
公开(公告)号：US07202187B2
公开(公告)日：2007-04-10
申请号：US10710257
申请日：2004-06-29
申请人： Ravikumar Ramachandran , James T. Kelliher , Shreesh Narasimha , Jeffrey W. Sleight
发明人： Ravikumar Ramachandran , James T. Kelliher , Shreesh Narasimha , Jeffrey W. Sleight
IPC分类号： H01L21/469 , H01L21/31
CPC分类号： H01L21/3185 , H01L21/0217 , H01L21/02274 , H01L21/823864
摘要： A silicon nitride spacer material for use in forming a PFET device and a method for making the spacer includes the use of a dual-frequency plasma enhanced CVD process wherein the temperature is in the range depositing a silicon nitride layer by means of a low-temperature dual-frequency plasma enhanced CVD process, at a temperature in the range 400° C. to 550° C. The process pressure is in the range 2 Torr to 5 Torr. The low frequency power is in the range 0 W to 50 W, and the high frequency power is in the range 90 W to 110 W. The precursor gases of silane, ammonia and nitrogen flow at flow rates in the ratio 240:3200:4000 sccm. The use of the silicon nitride spacer of the invention to form a PFET device having a dual spacer results in a 10%–15% performance improvement compared to a similar PFET device having a silicon nitride spacer formed by a RTCVD process.
摘要翻译：用于形成PFET器件的氮化硅间隔物材料和用于制造间隔物的方法包括使用双频等离子体增强CVD工艺，其中温度在通过低温下沉积氮化硅层的范围双频等离子体增强CVD工艺，温度范围为400°C至550°C。工艺压力范围为2 Torr至5 Torr。低频功率在0W至50W的范围内，高频功率在90W至110W的范围内。硅烷，氨和氮气的前体气体以240：3200：4000的比例流动 sccm。与具有通过RTCVD工艺形成的氮化硅间隔物的类似PFET器件相比，使用本发明的氮化硅间隔物形成具有双间隔物的PFET器件导致10％-15％的性能提高。

10. 发明授权

US08536563B2 Nanowire field effect transistors 有权
标题翻译：纳米线场效应晶体管
公开(公告)号：US08536563B2
公开(公告)日：2013-09-17
申请号：US12884707
申请日：2010-09-17
申请人： Sarunya Bangsaruntip , Guy M. Cohen , Shreesh Narasimha , Jeffrey W. Sleight
发明人： Sarunya Bangsaruntip , Guy M. Cohen , Shreesh Narasimha , Jeffrey W. Sleight
IPC分类号： H01L29/06
CPC分类号： H01L29/775 , B82Y10/00 , H01L21/84 , H01L29/0673 , H01L29/42392 , H01L29/4966 , H01L29/513 , H01L29/66439 , H01L29/78696
摘要： A method for forming a nanowire field effect transistor (FET) device including forming a first silicon on insulator (SOI) pad region, a second SOI pad region, a third SOI pad region, a first SOI portion connecting the first SOI pad region to the second SOI pad region, and a second SOI portion connecting the second SOI pad region to the third SOI pad region on a substrate, patterning a first hardmask layer over the second SOI portion, forming a first suspended nanowire over the semiconductor substrate, forming a first gate structure around a portion of the first suspended nanowire, patterning a second hardmask layer over the first gate structure and the first suspended nanowire, removing the first hardmask layer, forming a second suspended nanowire over the semiconductor substrate, forming a second gate structure around a portion of the second suspended nanowire, and removing the second hardmask layer.
摘要翻译：一种用于形成纳米线场效应晶体管（FET）器件的方法，包括形成绝缘体上硅（SOI）焊盘区域，第二SOI焊盘区域，第三SOI焊盘区域，将第一SOI焊盘区域连接到第一SOI焊盘区域的第一SOI部分第二SOI焊盘区域和将第二SOI焊盘区域连接到衬底上的第三SOI焊盘区域的第二SOI部分，在第二SOI部分上形成第一硬掩模层，在半导体衬底上形成第一悬浮的纳米线，形成第一围绕第一悬浮纳米线的一部分构造栅极结构，在第一栅极结构和第一悬置纳米线上图案化第二硬掩模层，去除第一硬掩模层，在半导体衬底上形成第二悬浮纳米线，在第二栅极结构周围形成第二栅极结构第二悬浮纳米线的一部分，以及去除第二硬掩模层。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式