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    • 3. 发明授权
    • Semiconductor integrated circuit device and method of manufacturing the
same
    • 半导体集成电路器件及其制造方法
    • US6034912A
    • 2000-03-07
    • US145076
    • 1998-09-01
    • Satoru IsomuraAtsushi ShimizuKeiichi HigetaTohru KobayashiTakeo YamadaYuko ItoKengo MiyazawaKunihiko Yamaguchi
    • Satoru IsomuraAtsushi ShimizuKeiichi HigetaTohru KobayashiTakeo YamadaYuko ItoKengo MiyazawaKunihiko Yamaguchi
    • G11C5/02H01L27/02H03K19/177
    • H03K19/1776G11C5/025H01L27/0207H03K19/1774H03K19/17792H03K19/17796
    • A memory portion and a logic circuit portion of a semiconductor device are formed on a single semiconductor substrate in which a first logic circuit block and a second logic circuit block are formed in different areas and the second logic circuit is located between a pair of memory blocks. Data stored in the pair of memory blocks are transmitted to the second logic circuit block for processing via a memory peripheral circuit. A result of the data processing is transmitted to the first logic circuit block or an external device via an input/output circuit provided in the second logic circuit block. A clock signal entered at the center portion of the semiconductor chip is supplied to a plurality of first state clock distributing circuits equidistantly disposed from the center portion and then to a plurality of second stage clock distributing circuits at least equidistantly disposed from each of the first state clock distributing circuits. Next, the clock signal is supplied to a plurality of third state clock distributing circuits equidistantly disposed from each of the second stage clock distributing circuits and then supplied to a plurality of final stage clock distributing circuits equidistantly disposed from each of the third stage clock distributing circuits. From these final stage clock distributing circuits, the clock signal is supplied to an area in whose units an internal gate array and a RAM macro cell or a logic macro cell are made replaceable with each other.
    • 半导体器件的存储部分和逻辑电路部分形成在单个半导体衬底上,其中第一逻辑电路块和第二逻辑电路块形成在不同的区域中,并且第二逻辑电路位于一对存储块之间 。 存储在一对存储器块中的数据被发送到第二逻辑电路块,以经由存储器外围电路进行处理。 经由第二逻辑电路块中提供的输入/输出电路将数据处理的结果发送到第一逻辑电路块或外部设备。 输入到半导体芯片的中心部分的时钟信号被提供给从中心部分等距设置的多个第一状态时钟分配电路,然后被提供给至少等距地从第一状态中的每个状态设置的多个第二级时钟分配电路 时钟分配电路。 接下来,时钟信号被提供给从每个第二级时钟分配电路等距离设置的多个第三状态时钟分配电路,然后提供给从每个第三级时钟分配电路等距设置的多个最后级时钟分配电路 。 从这些最终级时钟分配电路,将时钟信号提供给其单位内的内部门阵列和RAM宏小区或逻辑宏小区彼此可替换的区域。
    • 5. 发明授权
    • Design method of semiconductor device
    • 半导体器件的设计方法
    • US06760895B2
    • 2004-07-06
    • US10147991
    • 2002-05-20
    • Yuko ItoSatoru Isomura
    • Yuko ItoSatoru Isomura
    • G06F945
    • G06F17/5077G06F17/5036
    • A semiconductor device design method useful for the design of microprocessor, ASIC, and high-speed high-performance LSI is intended to enhance the accuracy of delay calculation and crosstalk noise calculation, and enhance the accuracy of assessment of delay variation caused by crosstalk and checking of malfunctioning caused by crosstalk. The method calculates the delay by using the total capacitance in consideration of the actual load after the layout and wiring, carries out the layout, wiring and modification of wiring repeatedly until targeted in-cycle transfer becomes attainable, calculates the delay by using the total capacitance in consideration of the actual load and crosstalk, carries out the modification of wiring repeatedly until targeted in-cycle transfer becomes attainable, calculates the crosstalk noise by using the total capacitance and coupling capacitance in consideration of the actual load, carries out the modification of wiring repeatedly until malfunctioning subsides, and uses data after the final layout and wiring for mask data.
    • 用于微处理器,ASIC和高速高性能LSI设计的半导体器件设计方法旨在提高延迟计算和串扰噪声计算的精度,并提高串扰和检查引起的延迟变化评估的准确性 由串扰引起的故障。 该方法通过考虑布线和布线后的实际负载,使用总电容来计算延迟,重复布线,布线和修改布线,直到目标周期内传输达到目标,通过使用总电容计算延迟 考虑到实际负载和串扰,反复进行布线修改,直到目标周期内传输成为可能,考虑到实际负载,通过使用总电容和耦合电容来计算串扰噪声,执行布线改造 重复直到故障消除,并在最终布局和掩模数据接线后使用数据。
    • 6. 发明授权
    • Method of computing wiring capacitance, method of computing signal propagation delay due to cross talk and computer-readable recording medium storing such computed data
    • 计算布线电容的方法,计算由串扰引起的信号传播延迟的方法以及存储这种计算数据的计算机可读记录介质
    • US06530066B1
    • 2003-03-04
    • US09666863
    • 2000-09-21
    • Yuko ItoSatoru Isomura
    • Yuko ItoSatoru Isomura
    • G06F1750
    • G06F17/5036H01L23/5222H01L2924/0002H01L2924/00
    • The present invention is to provide a method of computing wiring capacitance to be able to get parasitic capacity depending on the wiring at high speed and with great accuracy, and to provide a method of computing signal propagation delay due to cross talk to be able to remove surplus margins at high speed when delay is predicted. In design of LSIs such as microprocessors or the like, total capacity Ctotal per unit length is determined about each of a plurality of models altering adjacent wiring ((a) no adjacent wiring, (b) one-side adjacent wiring, and (c) both-sides adjacent wiring) and/or crossing ratios ((i) 0%, (ii) 33%, (iii) 67%, and (iv) 100%) and, thereby, a library is formed from these to design the LSI. Regarding characteristic of this total capacity per unit length, the capacity depending on increase of the crossing ratio has a high increase rate in an area of a low crossing ratio, while the capacity depending on increase of the crossing ratio has the low increase rate in high crossing ratio. Regarding a case of no adjacent wiring, the capacity depending on increase of crossing ratio has a high increase rate in comparison to a case of one-side or both-sides adjacent wiring.
    • 本发明提供一种计算布线电容的方法,其能够根据高速和高精度的布线获得寄生电容,并且提供一种计算由串扰引起的信号传播延迟的方法,以能够去除 延迟预测时高速的剩余利润。 在诸如微处理器等的LSI的设计中,关于改变相邻布线((a)没有相邻布线,(b)单面相邻布线)的多个模型中的每一个模型确定每单位长度的总容量Ctotal,(c) 两侧相邻布线)和/或交叉比((i)0%,(ii)33%,(iii)67%和(iv)100%),由此形成文库以设计 LSI。 关于该单位长度的总容量的特性,与交叉比的增加相关的容量在低交叉比的面积上具有高的增加率,而根据交叉比的增加的容量具有较高的增加率 交叉比。 关于没有相邻布线的情况,与一侧或两侧相邻布线的情况相比,与交叉比的增加相关的容量具有高的增加率。