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    • 4. 发明授权
    • Mask and wafer diffraction grating alignment system wherein the
diffracted light beams return substantially along an incident angle
    • 掩模和晶片衍射光栅对准系统,其中衍射光束基本上沿入射角返回
    • US5559601A
    • 1996-09-24
    • US375636
    • 1995-01-20
    • Gregg M. GallatinJustin L. KreuzerMichael L. Nelson
    • Gregg M. GallatinJustin L. KreuzerMichael L. Nelson
    • G01B11/00G03F9/00H01L21/027G01B9/02
    • G03F9/7049
    • The present invention provides a grating-grating interferometric wafer alignment system, sensor and method for microlithography. It includes: (1) an electromagnetic radiation source with collimating optics delivering a collimated beam of a coherent single or multiple discrete wavelengths or in some cases broadband electromagnetic radiation; (2) a detector of the intensity of the collimated return electromagnetic radiation; (3) x- and y-oriented independent linear gratings for the mask-mark; (3) a "checkerboard pattern" grating for the wafer-mark; and (4) software including an algorithm for determining alignment from the return electromagnetic radiation intensity measured as a function of the relative position of the wafer and mask grating, and a means such as a Fourier transform determining phase and amplitude of a known frequency component of the intensity. In one embodiment a laser diode is used and the backscatter from the mask and wafer gratings is returned to the laser diode creating a beat signal used to determine alignment of the mask and wafer. Alignment accuracy is increased and made more tolerant of processing variables such as wafer topography and coatings.
    • 本发明提供一种光栅光栅干涉测量晶片对准系统,用于微光刻的传感器和方法。 它包括:(1)具有准直光学器件的电磁辐射源,其递送相干单个或多个离散波长的准直光束,或在某些情况下传送宽带电磁辐射; (2)准直返回电磁辐射强度的检测器; (3)用于掩模标记的x和y取向的独立线性光栅; (3)用于晶片标记的“棋盘图案”格栅; 以及(4)软件,其包括用于根据作为晶片和掩模光栅的相对位置的函数测量的返回电磁辐射强度来确定对准的算法,以及诸如傅立叶变换确定相位和幅度的装置,其中已知频率分量 强度。 在一个实施例中,使用激光二极管,并且来自掩模和晶片光栅的反向散射返回到激光二极管,产生用于确定掩模和晶片的对准的拍频信号。 对准精度提高,并且能够更加容忍诸如晶片形貌和涂层的处理变量。
    • 7. 发明申请
    • SOFTWARE LICENSE SERVING IN A MASSIVELY PARALLEL PROCESSING ENVIRONMENT
    • 软件许可证服务于大规模并行处理环境
    • US20110296402A1
    • 2011-12-01
    • US12788926
    • 2010-05-27
    • Jerrold M. HeymanMichael L. NelsonAndrew G. Tonkin
    • Jerrold M. HeymanMichael L. NelsonAndrew G. Tonkin
    • G06F9/445G06F17/30
    • G06Q20/1235G06F21/10
    • Techniques for implementing software licensing in a massive parallel processing environment on the basis of the actual use of licensed software instances are disclosed. In one embodiment, rather than using a license server or a node-locked license strategy, each use of a licensed software instance is monitored and correlated with a token. A store of tokens is maintained within the licensing system and a token is consumed after each instance successfully executes. Further, a disclosed embodiment also allows jobs that execute multiple software instances to complete execution, even if an adequate number of tokens does not exist for each remaining software instance. Once the license tokens are repurchased and replenished, any overage consumed from previous job executions may be reconciled. In this way, token-based licensing can be adapted to large scale computing environments that execute jobs of large and unpredictable sizes, while the cancellation of executing jobs may be avoided.
    • 公开了在大量并行处理环境中基于许可软件实例的实际使用来实现软件许可的技术。 在一个实施例中,不是使用许可证服务器或节点锁定许可策略,每个使用许可的软件实例被监视并与令牌相关联。 一个令牌存储在许可证系统内,令牌在每个实例成功执行后被消耗。 此外,所公开的实施例还允许执行多个软件实例的作业完成执行,即使每个剩余软件实例不存在足够数量的令牌。 一旦许可证令牌被回购和补充,从以前的工作执行中消耗的任何高估可能会被调和。 以这种方式,基于令牌的许可可以适应于执行大型和不可预测尺寸的作业的大规模计算环境,同时可以避免执行作业的取消。
    • 8. 发明申请
    • EUV Reticle Substrates With High Thermal Conductivity
    • 具有高导热性的EUV掩模基板
    • US20110116068A1
    • 2011-05-19
    • US13054008
    • 2009-07-29
    • Ronald A. WilklowMichael L. NelsonMichael Perry
    • Ronald A. WilklowMichael L. NelsonMichael Perry
    • G03B27/54G03F1/00
    • G03F1/24B82Y10/00B82Y40/00G03F7/70891
    • A reflective reticle substantially reduces or eliminates pattern distortion that results from the absorption of EUV radiation while maintaining a reticle thickness consistent with industry standards. The reflective reticle includes a layer of ultra-low expansion (ULE) glass and a substrate of Cordierite having a thermal conductivity substantially larger than that of ULE glass. An aluminum layer is disposed onto a first surface of the ULE glass and a second surface of the ULE glass is polished to be substantially flat and defect-free. The Cordierite substrate can be directly bonded to the aluminum layer using anodic bonding to form the reflective reticle. Alternatively, a first surface of an intermediate Zerodur layer can be bonded to the aluminum layer, and a second aluminum layer can be used to anodically bond the Cordierite substrate to a second surface of the Zerodur layer, thereby forming the reflective reticle.
    • 反射型掩模版基本上减少或消除由于EUV辐射的吸收而导致的图案变形,同时保持与行业标准一致的光罩厚度。 反射型掩模版包括一层超低膨胀(ULE)玻璃和堇青石的基底,其导热率基本上大于ULE玻璃的热导率。 将铝层设置在ULE玻璃的第一表面上,并将ULE玻璃的第二表面抛光成基本平坦且无缺陷。 堇青石基材可以使用阳极结合直接结合到铝层上以形成反射型掩模版。 或者,中间Zerodur层的第一表面可以结合到铝层,并且可以使用第二铝层将堇青石基板阳极结合到Zerodur层的第二表面,从而形成反射掩模版。
    • 10. 发明授权
    • Mask inspection with fourier filtering and image compare
    • 面罩检查与傅立叶滤镜和图像比较
    • US09041903B2
    • 2015-05-26
    • US13256372
    • 2010-03-18
    • Michael L. NelsonHarry SewellEric Brian Catey
    • Michael L. NelsonHarry SewellEric Brian Catey
    • G03B27/52G03B27/68G03F1/84
    • G03F1/84
    • A mask inspection system with Fourier filtering and image compare can include a first detector, a dynamic Fourier filter, a controller, and a second detector. The first detector can be located at a Fourier plane of the inspection system and can detect a first portion of patterned light produced by an area of a mask. The dynamic Fourier filter can be controlled by the controller based on the detected first portion of the patterned light. The second detector can detect a second portion of the patterned light produced by the section of the mask and transmitted through the dynamic Fourier filter. Further, the mask inspection system can include a data analysis device to compare the second portion of patterned light with another patterned light. Consequently, the mask inspection system is able to detect any possible defects on the area of the mask more accurately and with higher resolution.
    • 具有傅立叶滤波和图像比较的掩模检查系统可以包括第一检测器,动态傅立叶滤波器,控制器和第二检测器。 第一检测器可以位于检查系统的傅立叶平面处,并且可以检测由掩模的区域产生的图案化光的第一部分。 动态傅立叶滤波器可以由控制器基于检测到的图案化光的第一部分来控制。 第二检测器可以检测由掩模的部分产生并通过动态傅立叶滤波器传输的图案化光的第二部分。 此外,掩模检查系统可以包括数据分析装置,以将图案化的光的第二部分与另一图案化的光进行比较。 因此,掩模检查系统能够更精确地并且以更高的分辨率检测掩模区域上的任何可能的缺陷。