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    • 3. 发明授权
    • Monolithically integrated selector for electrically programmable memory cell devices
    • 用于电可编程存储单元器件的单片选择器
    • US06242971B1
    • 2001-06-05
    • US09321961
    • 1999-05-28
    • Alessandro ManstrettaAndrea PierinGuido Torelli
    • Alessandro ManstrettaAndrea PierinGuido Torelli
    • G05F110
    • G11C16/12
    • A selector switch monolithically integrated to a CMOS technology circuit for electrically programmable memory cell devices having at least first and second input terminals for coupling to first and second voltage generators (HV and LV), respectively, and an output terminal. First and second field-effect selection transistors are respectively connected, via first and second terminals, between the first input terminal and the output terminal and between the second input terminal and the output terminal. These transistors are driven through control terminals at non-overlapping phases and have body terminals connected at a body circuit node which is coupled to the first and second voltage generators through a bias circuit block effective to bias the node to the higher of the instant voltages generated by the first and second generators.
    • 选择器开关单片集成到用于电可编程存储器单元器件的CMOS工艺电路,其具有至少分别用于耦合到第一和第二电压发生器(HV和LV)的第一和第二输入端子以及输出端子。 第一和第二场效应选择晶体管分别经由第一和第二端子在第一输入端子和输出端子之间以及第二输入端子和输出端子之间连接。 这些晶体管以不重叠的相位被驱动通过控制端子,并且具有连接在体电路节点处的主体端子,该体电极节点通过偏置电路块耦合到第一和第二电压发生器,该偏置电路块有效地将节点偏置到产生的瞬时电压中较高者 由第一和第二发电机组成。
    • 5. 发明授权
    • Method for programming nonvolatile memory cells with program and verify algorithm using a staircase voltage with varying step amplitude
    • 使用程序和验证算法编程非易失性存储单元的方法,使用具有不同步长幅度的阶梯电压
    • US06788579B2
    • 2004-09-07
    • US10119523
    • 2002-04-09
    • Stefano GregoriRino MicheloniAndrea PierinOsama KhouriGuido Torelli
    • Stefano GregoriRino MicheloniAndrea PierinOsama KhouriGuido Torelli
    • G11C1604
    • G11C11/5628G11C16/12
    • A method for programming a nonvolatile memory cell envisages applying in succession, to the gate terminal of the memory cell, a first and a second programming pulse trains with pulse amplitude increasing in staircase fashion, in which the amplitude increment between one pulse and the next in the first programming pulse train is greater than the amplitude increment between one pulse and the next in the second programming pulse train. The programming method envisages applying, to the gate terminal of the memory cell and before the first programming pulse train, a third programming pulse train with pulse amplitude increasing in staircase fashion, in which the amplitude increment between one pulse and the next may be less than the amplitude increment in the first programming pulse train and substantially equal to the amplitude increment in the second programming pulse train, or else may be greater than the amplitude increment in the first programming pulse train.
    • 用于编程非易失性存储器单元的方法设想连续地应用到存储器单元的栅极端,第一和第二编程脉冲串,其阶梯形式的脉冲幅度增加,其中在一个脉冲和下一个脉冲之间的振幅增量 第一编程脉冲序列大于第二编程脉冲串中的一个脉冲和下一个脉冲之间的振幅增量。 编程方法设想在存储器单元的栅极端子和第一编程脉冲串之前施加具有阶梯式脉冲幅度增加的第三编程脉冲串,其中,一个脉冲与下一个脉冲之间的振幅增量可能小于 第一编程脉冲序列中的振幅增量基本上等于第二编程脉冲串中的幅度增量,或者可以大于第一编程脉冲序列中的振幅增量。
    • 8. 发明授权
    • Analog-to-digital conversion method and device, in high-density multilevel non-volatile memory devices
    • 模数转换方法和器件,在高密度多级非易失性存储器件中
    • US06674385B2
    • 2004-01-06
    • US10060076
    • 2002-01-29
    • Rino MicheloniOsama KhouriAndrea PierinStefano GregoriGuido Torelli
    • Rino MicheloniOsama KhouriAndrea PierinStefano GregoriGuido Torelli
    • H03M112
    • G11C11/56G11C27/005H03M1/146H03M1/361
    • An analog-to-digital conversion method and device for a multilevel non-volatile memory device that includes a multilevel memory cell. The method comprises a first step of converting the most significant bits contained in the memory cell, followed by a second step of converting the least significant bits. The first step is completed within a time interval corresponding to the rise transient of the gate voltage, and the second step is initiated at the end of the transient. Also disclosed is a scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different “bit-layers”, which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is achieved by using a simple error control code providing single-bit correction, regardless of the number of bits stored in a single cell.
    • 一种用于包括多电平存储器单元的多级非易失性存储器件的模数转换方法和装置。 该方法包括转换存储单元中包含的最高有效位的第一步骤,随后转换最低有效位的第二步骤。 在对应于栅极电压的上升瞬变的时间间隔内完成第一步,并且在瞬态结束时启动第二步。 还公开了一种用于多电平闪存中的错误控制编码的方案。 存储在单个存储器单元中的n位被组织在彼此独立的不同“位层”中。 针对每个位层分别执行错误校正。 通过使用提供单位校正的简单误差控制代码来实现单个存储器单元中的任何故障的校正,而不管存储在单个单元中的位数。