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    • 2. 发明专利
    • Semiconductor device and manufacturing method of the same
    • 半导体器件及其制造方法
    • JP2014179376A
    • 2014-09-25
    • JP2013050753
    • 2013-03-13
    • Mitsubishi Electric Corp三菱電機株式会社
    • KIKUCHI MASAOUSUI OSAMUYOSHIMATSU NAOKI
    • H01L25/07H01L23/473H01L25/18
    • H01L24/01H01L2924/1305H01L2924/13055H01L2924/181H01L2924/00H01L2924/00012
    • PROBLEM TO BE SOLVED: To provide a semiconductor device which balances compactification of the semiconductor device with improvement in reliability of the semiconductor device and has a high output.SOLUTION: A semiconductor device 100 comprises: a circuit board 2 on which a semiconductor element 1 is mounted; a base plate 4 on which the circuit board is mounted; and a resin housing 6 which encapsulates the components such as the semiconductor element 1, the circuit board 2 and the base plate 4, and which has a first surface and an opposed second surface. The resin housing has a through hole 6a and a cylindrical member 10 inside which is composed of a material having rigidity higher than that of a material composing the resin housing. A rear face of the base plate is exposed on the first surface of the resin housing. One end of the cylindrical member is exposed on the second surface of the resin housing.
    • 要解决的问题:提供一种使半导体器件的紧凑化平衡的半导体器件,提高半导体器件的可靠性并具有高输出。解决方案:半导体器件100包括:半导体元件1 安装; 安装有电路板的基板4; 以及树脂壳体6,其封装诸如半导体元件1,电路板2和基板4的部件,并且具有第一表面和相对的第二表面。 树脂壳体具有通孔6a和圆筒构件10,在该圆筒构件10内部由比构成树脂壳体的材料的刚性高的材料构成。 基板的后表面暴露在树脂外壳的第一表面上。 圆筒部件的一端露出在树脂外壳的第二表面上。
    • 5. 发明专利
    • Apparatus and method for inspecting insulation defect of semiconductor module
    • 用于检查半导体模块绝缘缺陷的装置和方法
    • JP2013134156A
    • 2013-07-08
    • JP2011284694
    • 2011-12-27
    • Mitsubishi Electric Corp三菱電機株式会社
    • SUGA KENICHISHIODA HIRONORIKIKUCHI MASAOFUNAHASHI KAZUO
    • G01R31/12G01R31/00
    • PROBLEM TO BE SOLVED: To provide an apparatus and a method for inspecting an insulation defect of a semiconductor module, which can determine existence/nonexistence of a partial discharge defect of the semiconductor module due to a void which has not yet caused dielectric breakdown.SOLUTION: The insulation defect inspection apparatus includes: a high voltage generation part composed of a high voltage power source for applying a high voltage to a semiconductor module to be a measuring object and a high voltage control part for controlling the voltage and frequency of the high voltage power source; measurement means for measuring the temperature of the semiconductor module; and an analyzer for determining existence/nonexistence of a partial discharge defect in the semiconductor module from a temperature change when the high voltage is applied based on output data from the measurement means.
    • 要解决的问题:提供一种用于检查半导体模块的绝缘缺陷的装置和方法,其可以由于还没有引起电介质破坏的空隙而确定半导体模块的局部放电缺陷的存在/不存在。 :绝缘缺陷检查装置包括:高电压发生部,其由用于向要测量对象的半导体模块施加高电压的高电压电源和用于控制高电压的电压和频率的高电压控制部 能量源; 用于测量半导体模块的温度的测量装置; 以及分析器,用于基于来自测量装置的输出数据,根据施加高电压的温度变化来确定半导体模块中的局部放电缺陷的存在/不存在。
    • 10. 发明专利
    • Circuit device, and method of manufacturing the circuit device
    • 电路装置以及制造电路装置的方法
    • JP2010251487A
    • 2010-11-04
    • JP2009098584
    • 2009-04-15
    • Mitsubishi Electric Corp三菱電機株式会社
    • MITSUI TAKAOKIKUCHI MASAOHAYASHI RYOHEIISHII RYUICHI
    • H05K1/18H05K3/28H05K3/34
    • PROBLEM TO BE SOLVED: To obtain a circuit device which packages a plurality of electronic components in proximity on a circuit board, and also has superior junction reliability between a lead terminal of the electronic component and a through-hole of the circuit board.
      SOLUTION: The circuit device includes: a guide member provided with a recessed guide mechanism having an opening and a positioning hole forming part having a positioning hole; an electronic component in which a main frame is inserted into the guide mechanism, and the lead terminal is inserted into the positioning hole; the circuit board which is provided on the outer face side of the positioning hole forming part of the guide member, and in which the lead terminal extended from the positioning hole is inserted into the through-hole for joint; and a base plate covering the opening of the guide member opposing to the positioning hole forming part.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:为了获得在电路板附近封装多个电子部件的电路装置,并且在电子部件的引线端子和电路板的通孔之间具有优异的结可靠性 。 解决方案:电路装置包括:引导构件,其具有具有开口的凹入引导机构和具有定位孔的定位孔形成部; 其中主框架插入到引导机构中的电子部件,并且引线端子插入到定位孔中; 设置在形成引导部件的定位孔的外表面侧的电路板,其中从定位孔延伸的引线端子插入到用于接合的通孔中; 以及覆盖与定位孔形成部相对的引导构件的开口的基板。 版权所有(C)2011,JPO&INPIT