专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06646748B2 Surface profile measurement apparatus 有权
公开(公告)号：US06646748B2
公开(公告)日：2003-11-11
申请号：US09921582
申请日：2001-08-06
申请人： Taizo Nakamura , Yoshio Saruki , Tatsuya Narumi , Yasushi Fukumoto
发明人： Taizo Nakamura , Yoshio Saruki , Tatsuya Narumi , Yasushi Fukumoto
IPC分类号： G01B902
CPC分类号： G01B11/255
摘要： To provide a surface profile measurement apparatus capable of efficient measurement of the surface profile of an object. A diamond indenter (16) is movably mounted. The tip end of the diamond indenter (16) is irradiated by light, and the light reflected by the tip end (17) is condensed through a lens (46). The condensed light is observed by a photo sensor (42) for measurement of the curvature radius of the tip end (17). Meanwhile, the light reflected by the tip end (17) and the light reflected by a reference body (66) together cause an interference fringe. The interference fringe is observed by a CCD camera (44) to measure the surface profile of tip end (17).

2. 发明授权

US06621065B1 Imaging probe 有权
标题翻译：成像探头
公开(公告)号：US06621065B1
公开(公告)日：2003-09-16
申请号：US09708535
申请日：2000-11-09
申请人： Yasushi Fukumoto , Seiji Shimokawa , Kenji Okabe
发明人： Yasushi Fukumoto , Seiji Shimokawa , Kenji Okabe
IPC分类号： H01J4014
CPC分类号： H04N5/2256
摘要： A CCD camera (27) images a work to generate its image data. An imaging optical system (24, 25, 26) focuses an image of the work on the CCD camera (27). A down-projection illumination source (31) includes at least one semiconductor light-emitting device for producing a down-projection illumination light to illuminate the work from above. An illuminating optical system (29) joins the illumination light from the down-projection illumination source (31) to the imaging optical system in order to lead the illumination light to the work via the imaging optical system. These optical components are mounted on a chassis (23) to construct an imaging probe (1), which is employed at any angle as a measuring probe of a three-dimensional tester.
摘要翻译： CCD相机（27）对作品进行成像以生成其图像数据。成像光学系统（24,25,26）将作品的图像聚焦在CCD照相机（27）上。下投影照明源（31）包括至少一个半导体发光装置，用于产生从上方照射工件的下投照明光。照明光学系统（29）将来自下投照明源（31）的照明光连接到成像光学系统，以便经由成像光学系统将照明光引导到工件。这些光学部件被安装在底架23上，构成成像探头（1），其以任意角度被用作三维测试仪的测量探针。

3. 发明授权

US08654351B2 Offset amount calibrating method and surface profile measuring machine 有权
标题翻译：偏移量校准方法和表面轮廓测量机
公开(公告)号：US08654351B2
公开(公告)日：2014-02-18
申请号：US12900788
申请日：2010-10-08
申请人： Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura , Sadaharu Arita , Kotaro Hirano
发明人： Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura , Sadaharu Arita , Kotaro Hirano
IPC分类号： G01B11/30
CPC分类号： G01B5/008 , G01B11/005 , G01B21/042
摘要： An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.
摘要翻译：提供了获得表面轮廓测量机的接触型检测器和图像探针之间的偏移量的偏移量校准方法。该方法包括：在舞台上设置具有具有水平差的格子图案的表面的校准夹具; 通过接触型检测器测量校准夹具的格子图案，以获得格子图案的第一参考位置; 通过图像探测器捕获校准夹具的格子图案的图像，以获得格子图案的第二参考位置; 以及从所述第一和第二参考位置之间的差获得所述偏移量。

4. 发明申请

US20110085177A1 OFFSET AMOUNT CALIBRATING METHOD AND SURFACE PROFILE MEASURING MACHINE 有权
标题翻译：偏移量校准方法和表面型材测量机
公开(公告)号：US20110085177A1
公开(公告)日：2011-04-14
申请号：US12900788
申请日：2010-10-08
申请人： Yasushi FUKUMOTO , Koichi KOMATSU , Fumihiro TAKEMURA , Sadaharu ARITA , Kotaro HIRANO
发明人： Yasushi FUKUMOTO , Koichi KOMATSU , Fumihiro TAKEMURA , Sadaharu ARITA , Kotaro HIRANO
IPC分类号： G01B11/24
CPC分类号： G01B5/008 , G01B11/005 , G01B21/042
摘要： An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.
摘要翻译：提供了一种获得用于表面轮廓测量机的接触型检测器和图像探针之间的偏移量的偏移量校准方法。该方法包括：在舞台上设置具有具有水平差的格子图案的表面的校准夹具; 通过接触型检测器测量校准夹具的格子图案，以获得格子图案的第一参考位置; 通过图像探测器捕获校准夹具的格子图案的图像，以获得格子图案的第二参考位置; 以及从所述第一和第二参考位置之间的差获得所述偏移量。

5. 发明申请

US20110083497A1 SURFACE TEXTURE MEASURING MACHINE AND A SURFACE TEXTURE MEASURING METHOD 有权
标题翻译：表面纹理测量机和表面纹理测量方法
公开(公告)号：US20110083497A1
公开(公告)日：2011-04-14
申请号：US12900867
申请日：2010-10-08
申请人： Sadayuki MATSUMIYA , Yoshiyuki OMORI , Sadaharu ARITA , Kotaro HIRANO , Yasushi FUKUMOTO , Koichi KOMATSU , Fumihiro TAKEMURA
发明人： Sadayuki MATSUMIYA , Yoshiyuki OMORI , Sadaharu ARITA , Kotaro HIRANO , Yasushi FUKUMOTO , Koichi KOMATSU , Fumihiro TAKEMURA
IPC分类号： G01B5/28
CPC分类号： G01B11/005 , G01B5/008 , G01B11/245 , G01B21/047
摘要： A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.
摘要翻译：表面纹理测量机包括：台，具有触针的触点型检测器，图像探针，相对移动机构和控制器。控制器包括：中心位置计算单元，当图像探测器进入圆形凹部或物体的圆形凸部的圆形轮廓上的至少三个点的位置数据时，将输入的位置数据近似为圆形获得圆的中心位置; 以及触笔设置单元，其在计算中心位置之后，操作相对移动机构以将接触型检测器的触针定位在中心位置。

6. 发明授权

US5963366A Focus detection unit and microscope using the focus detection unit 失效
标题翻译：焦点检测单元和显微镜使用焦点检测单元
公开(公告)号：US5963366A
公开(公告)日：1999-10-05
申请号：US965527
申请日：1997-11-06
申请人： Taizo Nakamura , Yasushi Fukumoto , Yuwu Zhang
发明人： Taizo Nakamura , Yasushi Fukumoto , Yuwu Zhang
IPC分类号： G03B13/36 , G02B7/28 , G02B21/24 , G02B21/26 , G02B21/06 , G02B23/06
CPC分类号： G02B21/244
摘要： A focus detection unit including an optical system employing an image sandwiching method is disclosed. In the focus detection unit, a double slit mask (12) forming double sight lines is disposed on the optical axis of a lamp 10 while a single slit mask (16) forming an single sight line is disposed on the optical axis of a lamp (14). A triangular pole prism 18 is provided, consisting of first and second side surfaces, which together constitutes an edge, and a plane opposing the edge. The prism (18) is disposed such that the double and single sight line are able to irradiate the first and second side surfaces. The prism reflects the incoming lines toward a plane before the right-angle edge. Before the edge of the prism (18), a projection lens (20) is provided for forming images of the double and single sight lines which have been reflected by the prism (18) and separated by a mask (22), at a both aiming line imaging position 100. The images are projected onto a workpiece.
摘要翻译：公开了一种包括使用图像夹持方法的光学系统的焦点检测单元。在焦点检测单元中，在灯10的光轴上设置形成双重视线的双缝掩模（12），同时在灯的光轴上设置形成单个视线的单个狭缝掩模（16） 14）。提供三角柱棱镜18，其由第一和第二侧表面组成，它们一起构成边缘，以及与边缘相对的平面。棱镜（18）被布置成使得双重和单个瞄准线能够照射第一和第二侧表面。棱镜将入射线反射到直角边缘之前的平面。在棱镜（18）的边缘之前，设置投影透镜（20），用于形成由棱镜（18）反射并由掩模（22）分离的双和单视线的图像，两者瞄准线成像位置100.图像被投影到工件上。

7. 发明授权

US08650939B2 Surface texture measuring machine and a surface texture measuring method 有权
标题翻译：表面纹理测量机和表面纹理测量方法
公开(公告)号：US08650939B2
公开(公告)日：2014-02-18
申请号：US12900867
申请日：2010-10-08
申请人： Sadayuki Matsumiya , Yoshiyuki Omori , Sadaharu Arita , Kotaro Hirano , Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura
发明人： Sadayuki Matsumiya , Yoshiyuki Omori , Sadaharu Arita , Kotaro Hirano , Yasushi Fukumoto , Koichi Komatsu , Fumihiro Takemura
IPC分类号： G01B5/20 , G01B11/24 , G01B21/04
CPC分类号： G01B11/005 , G01B5/008 , G01B11/245 , G01B21/047
摘要： A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.
摘要翻译：表面纹理测量机包括：台，具有触针的触点型检测器，图像探针，相对移动机构和控制器。控制器包括：中心位置计算单元，当图像探测器进入圆形凹部或物体的圆形凸部的圆形轮廓上的至少三个点的位置数据时，将输入的位置数据近似为圆形获得圆的中心位置; 以及触笔设置单元，其在计算中心位置之后，操作相对移动机构以将接触型检测器的触针定位在中心位置。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式